White Electronic Designs
V
CC
= 3.3V ± 0.3V, -55°C ≤ T
A
≤ +125°C
Parameter
Write Cycle Time (3)
Write Enable Setup Time
Chip Select Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
Chip Select Pulse Width High (3)
Duration of Word Programming Operation (1)
Sector Erase Time (2)
Read Recovery Time Before Write (3)
Chip Programming Time (4)
Symbol
t
AVAV
t
WLEL
t
ELEH
t
AVWL
t
DVEH
t
EHDX
t
ELAX
t
EHEL
t
WHWH1
t
WHWH2
t
GHEL
t
WC
t
WS
t
CP
t
AS
t
DS
t
DH
t
AH
t
CPH
Min
90
0
35
0
45
0
45
30
-90
Max
Min
100
0
45
0
45
0
45
30
-100
Max
W72M64VK-XBX
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS – CS# CONTROLLED
-120
Min
120
0
50
0
50
0
50
30
Max
ns
ns
ns
ns
ns
ns
ns
ns
µs
sec
ns
sec
Unit
300
5
0
42
0
300
5
0
42
300
5
42
NOTES:
1. Typical value for t
WHWH1
is 7µs.
2. Typical value for t
WHWH2
is 0.4 sec.
3. Guaranteed by design, but not tested.
4. Typical value is 36 sec. The typical chip programming time is considerably less than the maximum chip
programming time listed, since most bytes program faster than the maximum program times listed.
FIGURE 2
AC Test Circuit
I
OL
Current Source
AC Test Conditions
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
V
Z
» 1.5V
(Bipolar Supply)
Typ
V
IL
= 0, V
IH
= 2.5
5
1.5
1.5
Unit
V
ns
V
V
D.U.T.
C
EFF
= 50 pf
Current Source
I
OH
Notes:
V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75W.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
April 2005
Rev. 0
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
