欢迎访问ic37.com |
会员登录 免费注册
发布采购

WE128K8-250CQ 参数 Datasheet PDF下载

WE128K8-250CQ图片预览
型号: WE128K8-250CQ
PDF下载: 下载PDF文件 查看货源
内容描述: 512Kx8 CMOS EEPROM , WE512K8 - XCX , SMD 5962-93091 [512Kx8 CMOS EEPROM, WE512K8-XCX, SMD 5962-93091]
分类和应用: 内存集成电路可编程只读存储器电动程控只读存储器电可擦编程只读存储器
文件页数/大小: 13 页 / 617 K
品牌: WEDC [ WHITE ELECTRONIC DESIGNS CORPORATION ]
 浏览型号WE128K8-250CQ的Datasheet PDF文件第1页浏览型号WE128K8-250CQ的Datasheet PDF文件第2页浏览型号WE128K8-250CQ的Datasheet PDF文件第3页浏览型号WE128K8-250CQ的Datasheet PDF文件第5页浏览型号WE128K8-250CQ的Datasheet PDF文件第6页浏览型号WE128K8-250CQ的Datasheet PDF文件第7页浏览型号WE128K8-250CQ的Datasheet PDF文件第8页浏览型号WE128K8-250CQ的Datasheet PDF文件第9页  
White Electronic Designs
ABSOLUTE MAXIMUM RATINGS
Parameter
Operating Temperature
Storage Temperature
Signal Voltage Any Pin
Voltage on OE# and A9
Thermal Resistance junction
to case
Lead Temperature
(soldering -10 secs)
Symbol
T
A
T
STG
V
G
θ
JC
-55 to +125
-65 to +150
-0.6 to + 6.25
-0.6 to +13.5
28
+300
Unit
°C
°C
V
V
°C/W
°C
CS#
H
L
L
X
X
X
OE#
X
L
H
H
X
L
WE#
X
H
L
X
H
X
WE512K8, WE256K8,
WE128K8-XCX
TRUTH TABLE
Mode
Standby
Read
Write
Out Disable
Write
Inhibit
Data I/O
High Z
Data Out
Data In
High Z/Data Out
NOTE:
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage to the device. This is a stress rating only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
CAPACITANCE
T
A
= +25°C
Parameter
Input
Capacitance
Sym
C
IN
Condition
V
IN
= 0V, f = 1MHz
512Kx8 256Kx8 128Kx8 Unit
Max
Max
Max
45
60
80
80
45
60
pF
pF
RECOMMENDED OPERATING CONDITIONS
Parameter
Supply Voltage
Input High Voltage
Input Low Voltage
Operating Temp. (Mil.)
Operating Temp. (Ind.)
Symbol
V
CC
V
IH
V
IL
T
A
T
A
Min
4.5
2.0
-0.3
-55
-40
Max
5.5
V
CC
+ 0.3
+0.8
+125
+85
Unit
V
V
V
°C
°C
Output
C
OUT
V
I/O
= 0V, f = 1MHz
Capacitance
This parameter is guaranteed by design but not tested.
DC CHARACTERISTICS
V
CC
= 5.0V, V
SS
= 0V, -55°C ≤ T
A
≤ +125°C
Parameter
Input Leakage Current
Output Leakage Current
Dynamic Supply Current
Standby Current
Output Low Voltage
Output High Voltage
Symbol Conditions
I
LI
I
LO
I
CC
I
SB
V
OL
V
OH
V
CC
= 5.5, V
IN
= GND to V
CC
CS# = V
IH
, OE# = V
IH
, Vout = GND to V
CC
CS# = V
IL
, OE# = V
IH
, f = 5MHz, V
CC
= 5.5
CS# = V
IL
, OE# = V
IH
, f = 5MHz, V
CC
= 5.5
I
OL
= 2.1mA, V
CC
= 4.5V
I
OH
= -400µA, V
CC
= 4.5V
512K x 8
Min
Typ
Max
10
10
100
8
0.45
Min
256K x 8
Typ
Max
10
10
90
6
0.45
Min
128K x 8
Typ
Max
10
10
70
4
0.45
Unit
µA
µA
mA
mA
V
V
80
3
2.4
60
2
2.4
50
1
2.4
NOTE: DC test conditions: Vih = Vcc -0.3V, Vil = 0.3V
FIGURE 4
AC Test Circuit
AC TEST CONDITIONS
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
V
IL
= 0, V
IH
= 3.0
5
1.5
1.5
Unit
V
ns
V
V
Notes: V
Z
is programmable from -2V to +7V.
I
OL
& I
OH
programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
V
Z
is typically the midpoint of V
OH
and V
OL
.
I
OL
& I
OH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
May 2000
Rev. 1
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com