WM2617
Production Data
ELECTRICAL CHARACTERISTICS
Test Conditions:
R
L
= 10kΩ, C
L
= 100pF. VDD = 5V
±
10%, V
REF
= 2.048V and VDD = 3V
±
10%, V
REF
= 1.024V over recommended operating
free-air temperature range (unless noted otherwise)
PARAMETER
Static DAC Specifications
Resolution
Integral non-linearity
Differential non-linearity
Zero code error
Gain error
D.c. power supply rejection ratio
Zero code error temperature coefficient
Gain error temperature coefficient
DAC Output Specifications
Output voltage range
Output load regulation
Power Supplies
Active supply current
I
DD
No load, V
IH
= VDD, V
IL
= 0V
VDD = 5.5V, V
REF
= 2.048V Slow
VDD = 5.5V, V
REF
= 2.048V Fast
See Note 8
No load,
all digital inputs 0V or VDD
DAC code 32 to 1023, 10%-90%
Slow
Fast
See Note 9
DAC code 32 to 1023
Slow
Fast
See Note 10
Code 511 to 512
0.6
1.6
0.01
1.0
2.5
mA
mA
µA
2kΩ to 10kΩ load
See Note 7
0
0.1
VDD - 0.1
0.3
V
%
INL
DNL
ZCE
GE
DC PSRR
See Note 1
See Note 2
See Note 3
See Note 4
See Note 5
See Note 6
See Note 6
10
bits
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNIT
±
1
±
0.1
3
0.1
0.5
10
10
LSB
LSB
mV
% FSR
mV/V
ppm/°C
ppm/°C
±
0.5
±
12
±
0.6
Power down supply current
Dynamic DAC Specifications
Slew rate
0.3
2.4
0.5
3.0
V/µs
V/µs
Settling time
12
4
10
µs
µs
nV-s
Glitch energy
Reference
Reference input resistance
Reference input capacitance
Reference feedthrough
Reference input bandwidth
R
REFIN
C
REFIN
10
5
V
REF
= 1VPP at 1kHz
+ 1.024V dc, DAC code 0
V
REF
= 0.2VPP + 1.024V dc
DAC code 512
Slow
Fast
-60
MΩ
pF
dB
0.5
1.0
1
-1
8
MHz
MHz
µA
µA
pF
Digital Inputs
High level input current
Low level input current
Input capacitance
I
IH
I
IL
C
I
Input voltage = VDD
Input voltage = 0V
WOLFSON MICROELECTRONICS LTD
PD Rev 1.1 October 2000
3
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
