SBOS410 – JUNE 2007
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
PRODUCT
STANDARD GRADE (8ppm, 0.1%)
REF5020A
2.048V
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
(2)
(2)
(2)
(2)
(2)
(2)
OUTPUT VOLTAGE
PACKAGE-LEAD
PACKAGE DESIGNATOR
PACKAGE MARKING
D
DGK
D
DGK
D
DGK
D
DGK
D
DGK
D
DGK
REF5020
R50A
REF5025
R50B
REF5030
R50C
REF5040
R50D
REF5045
R50E
REF5050
R50F
REF5025A
2.5V
REF5030A
3.0V
REF5040A
4.096V
REF5045A
4.5V
REF5050A
HIGH GRADE (3ppm, 0.05%)
REF5020I
5.0V
2.048V
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
SO-8
MSOP-8
(2)
(2)
(2)
(2)
(2)
(2)
D
DGK
D
DGK
D
DGK
D
DGK
D
DGK
D
DGK
REF5020
R50A
REF5025
R50B
REF5030
R50C
REF5040
R50D
REF5045
R50E
REF5050
R50F
REF5025I
2.5V
REF5030I
3.0V
REF5040I
4.096V
REF5045I
4.5V
REF5050I
5.0V
(1)
(2)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at
MSOP-8 (DGK) package available Q3, 2007.
ABSOLUTE MAXIMUM RATINGS
(1)
PARAMETER
Input Voltage
Output Short-Circuit
Operating Temperature Range
Storage Temperature Range
Junction Temperature (T
J
max)
ESD Rating
(1)
Human Body Model (HBM)
Charged Device Model (CDM)
REF50xx
+18
30
–55 to +125
–55 to +150
+150
3000
1000
UNIT
V
mA
°C
°C
°C
V
V
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
Copyright © 2007, Texas Instruments Incorporated
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