TISP8200MDR-S 参数 Datasheet PDF下载

TISP8200M & TISP8201M

Voltage Stress Levels on the TISP8200M and TISP8201M (Continued)

Testing transistor CB and SCR AK off state:

The highest AK voltage occurs during the overshoot period of the protector. To make sure that the

SCR blocking junction does not break down during this period, a d.c. test for off-state current can be applied at the overshoot voltage value.

To avoid transistor CB current amplification by the transistor gain, the transistor base-emitter is shorted during this test (see Figure 8).

Summary:

Two tests are needed to verify the protector junctions. Maximum current values for IR and ID are required.

TISP

8201M

A

K

0V

RING

OR

TIP

A

C

B (G)

V

BATH

E

V

BATR

C

B (G)

0V

K

E

TISP

8200M

AI8XAH

Figure 6. Protector Electrodes

I

R

V

(BO)

8201M

A

I

R

(internal)

I

EB

TISP

8201M

V

BATR

B (G)

0V

0V

I

R

(internal)

K

I

EB

B (G)

V

BATH

V

(BO)

8200M

I

R

AI8XAJ

TISP

8200M

Figure 7. Reverse Current Verification

I

D

A

V

(BO)

8201M

0V

V

(BO)

8200M

I

D

(internal)

K

I

D

I

D

(internal)

B (G)

I

CB

I

CB

B (G)

TISP

8200M

AI8XAK

TISP

8201M

0V

Figure 8. Off-State Current Verification

MAY 1998 - REVISED FEBRUARY 2005

Specifications are subject to change without notice.

Customers should verify actual device performance in their specific applications.