CY74FCT2374T
8-BIT REGISTER
WITH 3-STATE OUTPUTS
SCCS040A – SEPTEMBER 1994 – REVISED OCTOBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
VOL
ROUT
Vhys
II
IIH
IIL
IOZH
IOZL
IOS‡
Ioff
ICC
∆I
CC
ICCD¶
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
All inputs
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 0 V,
VIN = VCC
VIN = 2.7 V
VIN = 0.5 V
VOUT = 2.7 V
VOUT = 0.5 V
VOUT = 0 V
VOUT = 4.5 V
0.1
0.5
0.06
0.7
1.2
1.6
3.9
5
9
–60
–120
TEST CONDITIONS
IIN = –18 mA
IOH = –15 mA
IOL = 12 mA
IOL = 12 mA
MIN
2.4
20
TYP†
–0.7
3.3
0.3
25
0.2
5
±1
±1
10
–10
–225
±1
0.2
2
0.12
1.4
3.4
3.2||
12.2||
10
12
pF
pF
mA
0.55
40
MAX
–1.2
UNIT
V
V
V
Ω
V
µA
µA
µA
µA
µA
mA
µA
mA
mA
mA/
MHz
VCC = 5.25 V,
VIN
≤
0.2 V,
VIN
≥
VCC – 0.2 V
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
VCC = 5.25 V, Outputs open, One input switching at 50% duty cycle,
OE = GND, VIN
≤
0.2 V or VIN
≥
VCC – 0.2 V
One bit switching
at f1 = 5 MHz
at 50% duty cycle
Eight bits switching
at f1 = 2.5 MHz
at 50% duty cycle
VIN
≤
0.2 V or
VIN
≥
VCC – 0.2V
VIN = 3.4 V or GND
VIN
≤
0.2 V or
VIN
≥
VCC – 0.2 V
VIN = 3.4 V or GND
IC#
VCC = 5 25 V,
5.25 V
Outputs open,
,
f0 = 10 MHz,
OE = GND
Ci
Co
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
¶ This parameter is derived for use in total power-supply calculations.
# IC
= ICC +
∆I
CC
×
DH
×
NT + ICCD (f0/2 + f1
×
N1)
Where:
IC
= Total supply current
ICC = Power-supply current with CMOS input levels
∆I
CC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.
4
POST OFFICE BOX 655303
•
DALLAS, TEXAS 75265