欢迎访问ic37.com |
会员登录 免费注册
发布采购

NDS9952A 参数 Datasheet PDF下载

NDS9952A图片预览
型号: NDS9952A
PDF下载: 下载PDF文件 查看货源
内容描述: 双N和P沟道增强型场效应晶体管 [Dual N & P-Channel Enhancement Mode Field Effect Transistor]
分类和应用: 晶体晶体管功率场效应晶体管开关脉冲光电二极管
文件页数/大小: 13 页 / 366 K
品牌: FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
 浏览型号NDS9952A的Datasheet PDF文件第2页浏览型号NDS9952A的Datasheet PDF文件第3页浏览型号NDS9952A的Datasheet PDF文件第4页浏览型号NDS9952A的Datasheet PDF文件第5页浏览型号NDS9952A的Datasheet PDF文件第6页浏览型号NDS9952A的Datasheet PDF文件第7页浏览型号NDS9952A的Datasheet PDF文件第8页浏览型号NDS9952A的Datasheet PDF文件第9页  
February 1996
NDS9952A
Dual N & P-Channel Enhancement Mode Field Effect Transistor
General Description
These dual N- and P-channel enhancement mode power
field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This
very high density process is especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulses in the
avalanche and commutation modes. These devices are
particularly suited for low voltage applications such as
notebook computer power management and other
battery powered circuits where fast switching, low in-line
power loss, and resistance to transients are needed.
Features
N-Channel 3.7A, 30V, R
DS(ON)
=0.08
@ V
GS
=10V.
P-Channel -2.9A, -30V, R
DS(ON)
=0.13
@ V
GS
=-10V.
High density cell design or extremely low R
DS(ON)
.
High power and current handling capability in a widely used
surface mount package.
Dual (N & P-Channel) MOSFET in surface mount package.
________________________________________________________________________________
5
4
3
2
1
6
7
8
Absolute Maximum Ratings
Symbol
V
DSS
V
GSS
I
D
P
D
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current - Continuous
- Pulsed
T
A
= 25°C unless otherwise noted
N-Channel
30
± 20
(Note 1a)
P-Channel
-30
± 20
± 2.9
± 10
2
Units
V
V
A
± 3.7
± 15
Power Dissipation for Dual Operation
Power Dissipation for Single Operation
(Note 1a)
(Note 1b)
(Note 1c)
W
1.6
1
0.9
-55 to 150
°C
T
J
,T
STG
Operating and Storage Temperature Range
THERMAL CHARACTERISTICS
R
θ
JA
R
θ
JC
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
78
40
°C/W
°C/W
NDS9952A.SAM
© 1997 Fairchild Semiconductor Corporation