X24165
*COMMENT
Stresses above those listed under “Absolute Maximum”
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias
X24165.......................................–65°C to +135°C
Storage Temperature........................–65°C to +150°C
Voltage on any Pin with
Ratings” may cause permanent damage to the device. This is
a stress rating only and the functional operation of the device
at these or any other conditions above those indicated in
the operational sections of this specification is not implied.
Respect to VSS .................................... –1V to +7V
D.C. Output Current ..............................................5mA
Lead Temperature (Soldering, 10 Seconds)......300°C
Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Supply Voltage
X24165
Limits
Temperature
Min.
0°C
Max.
+70°C
+85°C
+125°C
Commercial
4.5V to 5.5V
2.7V to 5.5V
X24165-2.7
–40°C
–55°C
Industrial
Military
6551 FRM T05
6551 FRM T04
D.C. OPERATING CHARACTERISTICS
Limits
Max.
Symbol
Parameter
Min.
Units
Test Conditions
ICC1
VCC Supply Current (Read)
1
3
mA
SCL = VCC X 0.1/VCC X 0.9 Levels @
100KHz, SDA = Open, All Other
ICC2
VCC Supply Current (Write)
mA
Inputs = VSS or VCC – 0.3V
∝A
(1)
VCC Standby Current
50
SCL = SDA = VCC, All Other
Inputs = VSS or VCC – 0.3V,
ISB1
VCC = 5V 10%
∝A
(1)
VCC Standby Current
1
SCL = SDA = VCC, All Other
Inputs = VSS or VCC – 0.3V,
ISB2
VCC = 2.7V
∝A
∝A
ILI
VIN = VSS to VCC
VOUT = VSS to VCC
Input Leakage Current
Output Leakage Current
Input LOW Voltage
10
10
ILO
(2)
VCC x 0.3
–1
V
V
V
VlL
(2)
VCC x 0.7 VCC + 0.5
0.4
Input HIGH Voltage
Output LOW Voltage
VIH
VOL
IOL = 3mA, VCC = 4.5V
6551 FRM T06.1
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V
Symbol
Parameter
Max.
Units
Test Conditions
(3)
VI/O = 0V
Input/Output Capacitance (SDA)
8
pF
CI/O
(3)
VIN = 0V
Input Capacitance (S1, S2, SCL)
6
pF
CIN
6551 FRM T07.1
Notes: (1)Must perform a stop command prior to measurement.
(2)VIL min. and VIH max. are for reference only and are not 100% tested. (3)This
parameter is periodically sampled and not 100% tested.
11
ICMIC [ IC MICROSYSTEMS ]
