X24645
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This
is a stress rating only and the functional operation
X24645.......................................–65°C to +135°C
Storage Temperature........................–65°C to +150°C
Voltage on any Pin with
of the device at these or any other conditions above
those indicated in the operational sections of this
Respect to VSS .................................... –1V to +7V
D.C. Output Current ..............................................5mA
Lead Temperature (Soldering,
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
..............................300°C
10 seconds)
affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Supply Voltage
X24645
Limits
Temperature
Commercial
Industrial
Min.
0°C
Max.
+70°C
+85°C
+125°C
4.5V to 5.5V
2.7V to 5.5V
X24645-2.7
–40°C
–55°C
2783 FRM T05
Military
2783 FRM T04
D.C. OPERATING CHARACTERISTICS
Limits
Max.
Symbol
Parameter
Min.
Units
Test Conditions
ICC1
VCC Supply Current (Read)
1
3
mA
SCL = VCC X 0.1/VCC X 0.9 Levels @
100KHz, SDA = Open, All Other
Inputs = VSS or VCC – 0.3V
ICC2
VCC Supply Current (Write)
VCC Standby Current
mA
∝A
(1)
50
SCL = SDA = VCC, All Other
Inputs = VSS or VCC – 0.3V,
VCC = 5V 10%
ISB1
∝A
(1)
VCC Standby Current
SCL = SDA = VCC, All Other
Inputs = VSS or VCC – 0.3V,
VCC = 2.7V
1
ISB2
∝A
∝A
ILI
VIN = VSS to VCC
VOUT = VSS to VCC
Input Leakage Current
Output Leakage Current
Input LOW Voltage
10
10
ILO
(2)
VCC x 0.3
–1
V
V
V
VlL
(2)
VCC x 0.7 VCC + 0.5
0.4
Input HIGH Voltage
Output LOW Voltage
VIH
VOL
IOL = 3mA, VCC = 4.5V
2783 FRM T06.2
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V
Symbol
Parameter
Max.
Units
Test Conditions
(3)
VI/O = 0V
Input/Output Capacitance (SDA)
8
pF
CI/O
(3)
VIN = 0V
Input Capacitance (S1, S2, SCL)
6
pF
CIN
2783 FRM T07.1
Notes: (1)Must perform a stop command prior to measurement.
(2)VIL min. and VIH max. are for reference only and are not 100% tested. (3)This
parameter is periodically sampled and not 100% tested.
11
ICMIC [ IC MICROSYSTEMS ]
