X25020
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias .................. –65°C to +135°C
Storage Temperature ....................... –65°C to +150°C
Voltage on any Pin with Respect to V
SS .........
–1V to +7V
D.C. Output Current ............................................. 5mA
Lead Temperature
(Soldering, 10 seconds) .............................. 300°C
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
listed in the operational sections of this specification is
not implied. Exposure to absolute maximum rating con-
ditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
Temp
Commercial
Industrial
Min.
0°C
–40°C
Max.
+70°C
+85°C
3834 PGM T05.2
Supply Voltage
X25020
X25020–3
X25020–2.7
Limits
5V
±10%
3V to 5.5V
2.7V to 5.5V
3834 PGM T06.1
D.C. OPERATING CHARACTERISTICS
(Over the recommended operating conditions unless otherwise specified.)
Limits
Symbol
Parameter
I
CC
V
CC
Supply Current (Active)
I
SB
I
LI
I
LO
V
IL(1)
V
IH(1)
V
OL
V
OH
V
CC
Supply Current
(Standby)
Input Leakage Current
Output Leakage Current
Input LOW Voltage
Input HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Min.
Max.
3
10
10
10
–0.5
V
CC
x 0.3
V
CC
x 0.7 V
CC
+ 0.5
0.4
V
CC
– 0.8
Units
mA
µA
µA
µA
V
V
V
V
Test Conditions
SCK = V
CC
x 0.1/V
CC
x 0.9 @ 1MHz,
SO = Open
CS
= V
CC
, V
IN
= V
SS
or V
CC
– 0.3V
V
IN
= V
SS
to V
CC
V
OUT
= V
SS
to V
CC
I
OL
= 2mA
I
OH
= –1mA
3834 PGM T07.5
POWER-UP TIMING
Symbol
t
PUR(2)
t
PUW(2)
Parameter
Power-up to Read Operation
Power-up to Write Operation
Min.
Max.
1
5
Units
ms
ms
3834 PGM T08
CAPACITANCE
T
A
= +25°C, f = 1MHz, V
CC
= 5V.
Symbol
C
OUT(2)
C
IN(2)
Notes:
Test
Output Capacitance (SO)
Input Capacitance (SCK, SI,
CS, WP, HOLD)
Max.
8
6
Units
pF
pF
Conditions
V
OUT
= 0V
V
IN
= 0V
3834 PGM T09.1
(1) V
IL
min. and V
IH
max. are for reference only and are not tested.
(2) This parameter is periodically sampled and not 100% tested.
8
ICMIC [ IC MICROSYSTEMS ]
