TTL Compatible CMOS Analog Switches
Test Circuits
ΔV
O
DG300(A)/DG301(A)/DG302(A)/DG303(A)
R
GEN
S
X
D
X
C
L
10nF
IN
X
V
O
V
O
V
GEN
IN
X
+4V
ON
OFF
0V
ON
ΔV
O
=
Δ
MEASURED VOLTAGE ERROR DUE TO CHARGE INJECTION
THE ERROR VOLTAGE IN COULOMBS IS
ΔQ
= C
L
x
ΔV
O
.
Figure 1. Charge Injection Test Circuit
LOGIC "1" = SWITCH ON
LOGIC
INPUT
0V
V
S1
SWITCH
OUTPUT
0V
V
S2
V
O2
SWITCH
OUTPUT
50%
0V
t
BBM
V
IHN
50%
+4V
S
1
V
S1
= 3V
S
2
V
S2
= 3V
50%
V
O1
LOGIC
INPUT
GND
V-
-15V
IN
R
L2
300Ω
R
L1
300Ω
C
L2
33pF
C
L1
33pF
D
2
V
O2
+15V
V+
D
1
SWITCH
OUTPUT
V
O1
Figure 2. Break-Before-Make Time Test Circuit SPDT (DG301(A), DG303(A)
LOGIC "1" = SWITCH ON
LOGIC
INPUT
t
R
< 20ns
t
F
< 20ns
V
IHN
50%
0V
+4V
S
V
S
= 3V
IN
V
S
SWITCH
OUTPUT
90%
10%
0V
t
ON
t
OFF
LOGIC
INPUT
GND
V-
-15V
R
L
300Ω
C
L
33pF
0
+15V
V+
SWITCH
OUTPUT
V
O
Figure 3. Switching Time Test Circuit
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5
MAXIM [ MAXIM INTEGRATED PRODUCTS ]
