28LV011
3.3V 1 Megabit (128K x 8-Bit) EEPROM
1
TABLE 7. 28LV011 AC CHARACTERISTICS FOR READ OPERATION
(VCC = 3.3V ± 10%, TA = -55 TO +125 °C UNLESS OTHERWISE SPECIFIED)
PARAMETER
Functional Test
TEST CONDITIONS
SUBGROUPS
SYMBOL
MIN
MAX
UNIT
Verify Truth Table
7, 8A, 8B
9, 10, 11
All
Address Access Time
CE = OE = V , WE = V
tACC
ns
IL
IH
-200
-250
--
--
200
250
Chip Enable Access Time
-200
-250
OE = V , WE = V
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
9, 10, 11
tCE
tOE
tOH
tDF
ns
ns
ns
ns
ns
ns
IL
IH
--
--
200
250
Output Enable Access Time
-200
-250
CE = V , WE = V
IL
IH
0
0
110
120
Output Hold to Address Change CE = OE = V , WE = V
-200
-250
IL
IH
0
0
--
--
2
Output Disable to High-Z
CE = V , WE = V
IL
IH
-200
-250
CE = OE = V , WE = V
0
0
50
50
IL
IH
Output Disable to High-Z
-200
-250
CE = V , WE = V
tDFR
IL
IH
CE = OE = V , WE = V
0
0
300
350
IL
IH
RES to Output Delay 3
CE = OE = V WE = V
tRR
IL
IH
-200
-250
0
0
525
550
1. Test conditions: Input pulse levels - 0.4V to 2.4V; input rise and fall times < 20 ns; output load - 1 TTL gate + 100 pF (including
scope and jig); reference levels for measuring timing - 0.8V/1.8V.
2. tDF and tDFR is defined as the time at which the output becomes an open circuit and data is no longer driven.
3. Guaranteed by design.
05.28.02 Rev 2
All data sheets are subject to change without notice
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©2002 Maxwell Technologies
All rights reserved.
MAXWELL [ MAXWELL TECHNOLOGIES ]
