3.3V 1 Megabit (128K x 8-Bit) EEPROM
T
ABLE
7. 28LV011 AC C
HARACTERISTICS FOR
R
EAD
O
PERATION1
(V
CC
= 3.3V ± 10%, T
A
= -55
TO
+125 °C
UNLESS OTHERWISE SPECIFIED
)
P
ARAMETER
Functional Test
Address Access Time
-200
-250
Chip Enable Access Time
-200
-250
Output Enable Access Time
-200
-250
Output Hold to Address Change
-200
-250
Output Disable to High-Z
2
-200
-250
Output Disable to High-Z
-200
-250
RES to Output Delay
3
-200
-250
T
EST
C
ONDITIONS
Verify Truth Table
CE = OE = V
IL
, WE = V
IH
S
UBGROUPS
7, 8A, 8B
9, 10, 11
S
YMBOL
All
t
ACC
--
--
OE = V
IL
, WE = V
IH
9, 10, 11
t
CE
--
--
CE = V
IL
, WE = V
IH
9, 10, 11
t
OE
0
0
CE = OE = V
IL
, WE = V
IH
9, 10, 11
t
OH
0
0
CE = V
IL
, WE = V
IH
CE = OE = V
IL
, WE = V
IH
CE = V
IL
, WE = V
IH
CE = OE = V
IL
, WE = V
IH
CE = OE = V
IL
WE = V
IH
9, 10, 11
t
DF
0
0
9, 10, 11
t
DFR
0
0
9, 10, 11
t
RR
0
0
M
IN
28LV011
M
AX
U
NIT
ns
200
250
ns
200
250
ns
110
120
ns
--
--
ns
50
50
ns
300
350
ns
525
550
Memory
1. Test conditions: Input pulse levels - 0.4V to 2.4V; input rise and fall times < 20 ns; output load - 1 TTL gate + 100 pF (including
scope and jig); reference levels for measuring timing - 0.8V/1.8V.
2.
t
DF
and t
DFR
is defined as the time at which the output becomes an open circuit and data is no longer driven.
3. Guaranteed by design.
05.28.02 Rev 2
All data sheets are subject to change without notice
4
©2002 Maxwell Technologies
All rights reserved.
MAXWELL [ MAXWELL TECHNOLOGIES ]
