TABLE I. Electrical performance characteristics - Continued.
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Test
|Symbol
Conditions
+125 C
= 0 V; 4.5 V
| Group A | Device
|subgroups | types
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|9, 10, 11
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|9, 10, 11
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|9, 10, 11
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Limits
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| Unit
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| -55 C
| V
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|See figures 4, 5, and 6 as
| applicable. 5/ 8/
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T
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C
V
5.5 V
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| Min | Max
SS
CC
unless otherwise specified
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RES low to output float
|t
| 16-19
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| 16-19
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| 16-19
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| 16-19
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0
0
| 350 | ns
DFR
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|t
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|t
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|t
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RES to output delay
Reset protect time
Reset high time
| 450 | ns
RR
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| 100
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| 1.0
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| µs
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| µs
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RP
|9, 10, 11
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|9, 10, 11
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RES
Time to device busy
|t
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| 16-19
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| 120
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| ns
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DB
1/ Connect all address inputs and OE to V and measure I
IH
and I
with the output under test connected to V
.
OZL
OZH
OUT
Terminal conditions for the output leakage current test shall be as follows:
a.
b. For I
V
= 2.0 V for device types 01-15 and 2.2 V for device types 16-19; V = 0.8 V.
IH
IL
: Select an appropriate address to acquire a logic "1" on the designated output. Apply V to CE.
IH
OZL
Measure the leakage current while applying the specified voltage.
c. For I
: Select an appropriate address to acquire a logic "0" on the designated output. Apply V to CE.
OZH
IH
Measure the leakage current while applying the specified voltage.
2/ A functional test shall verify the dc input and output levels and applicable patterns as appropriate, all input
and I/O pins shall be tested. Terminal conditions are as follows:
a. Inputs: H =2.0 V for device types 01-15 and 2.2 V for device types 16-19; L = 0.8 V. Outputs: H = 2.4 V minimum and
L = 0.4 V maximum.
b. The functional tests shall be performed with V
3/ All pins not being tested are to be open.
= 4.5 and V
= 5.5 V.
CC
CC
4/ Tested initially and after any design or process changes which may affect that parameter, and therefore shall be
guaranteed to the limits specified in table I.
5/ Tested by application of specified timing signals and conditions.
Equivalent ac test conditions:
Output load, see figure 5; input rise and fall times 10 ns; input pulse levels, 0.4 V and 2.4 V; timing measurement
reference levels, inputs, 1.5 V for device types 1-15 and 1 V and 2 V for device types 16-19; outputs, 1.5 V for device types
1-15 and 0.8 V and 2 V for device types 16-19.
6/ Chip erase functions are applicable to device types 01-15 only.
7/ This parameter not applicable for internal timer controlled devices.
8/ RES functions are applicable to device types 16-19 only.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-38267
A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
G
SHEET
12
DSCC FORM 2234
APR 97
MAXWELL [ MAXWELL TECHNOLOGIES ]
