V
DD
G-CELL
SENSOR
X-INTEGRATOR
X-GAIN
X-FILTER
X-TEMP
COMP
X
OUT
ST
SELF-TEST
CONTROL LOGIC &
EEPROM TRIM CIRCUITS
OSCILLATOR
CLOCK GEN
Y-INTEGRATOR
Y-GAIN
Y-FILTER
Y-TEMP
COMP
Y
OUT
V
SS
Figure 1. Simplified Accelerometer Functional Block Diagram
MAXIMUM RATINGS
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating
Maximum Acceleration (all axis)
Supply Voltage
Drop Test
1
Storage Temperature Range
Note:
1. Dropped onto concrete surface from any axis.
Symbol
g
max
V
DD
D
drop
T
stg
Value
Unit
g
V
m
°C
±
2000
-0.3 to +3.6
1.2
-40 to +125
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale Semiconductor accelerome-
ters contain internal 2000 V ESD protection circuitry, ex-
tra precaution must be taken by the user to protect the
chip from ESD. A charge of over 2000 volts can accumu-
late on the human body or associated test equipment. A
charge of this magnitude
can alter the performance or cause failure of the chip.
When handling the accelerometer, proper ESD precau-
tions should be followed to avoid exposing the device to
discharges which may be detrimental to its performance.
MMA6200 SERIES
2
Sensor Device Data
Freescale Semiconductor
MOTOROLA [ MOTOROLA, INC ]
