SCAN926260 Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
March 6, 2008
SCAN926260
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and
At-Speed BIST
General Description
The SCAN926260 integrates six 10-bit deserializer devices
into a single chip. The SCAN926260 can simultaneously de-
serialize up to six data streams that have been serialized by
National Semiconductor’s 10-bit Bus LVDS serializers. In ad-
dition, the SCAN926260 is compliant with IEEE standard
1149.1 and also features an At-Speed Built-In Self Test
(BIST). For more details, please see the sections titled "IEEE
1149.1 Test Modes" and "BIST Alone Test Modes."
Each deserializer block in the SCAN926260 has it’s own pow-
erdown pin (PWRDWN[n])and operates independently with
its own clock recovery circuitry and lock-detect signaling. In
addition, a master powerdown pin (MS_PWRDWN) which
puts all the entire device into sleep mode is provided.
The SCAN926260 uses a single +3.3V power supply and
consumes 1.2W at 3.3V with a PRBS-15 pattern on all chan-
nels at 660Mbps.
Features
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Deserializes one to six Bus LVDS input serial data streams
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with embedded clocks
IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test
modes
Parallel clock rate 16-66MHz
On chip filtering for PLL
High impedance inputs upon power off (V
cc
= 0V)
Single power supply at +3.3V
196-pin LBGA package (Low-profile Ball Grid Array)
package
Industrial temperature range operation: −40°C to +85°C
ROUTn[0:9] and RCLKn default high when channel is not
locked
Powerdown per channel to conserve power on unused
channels
Typical Application
20028302
Ordering Information
Order Number
SCAN926260TUF
SCAN926260TUFX
Function
Six Channel 10-bit BLVDS Deserializer
with IEEE 1149.1 and At-Speed BIST
Six Channel 10-bit BLVDS Deserializer
with IEEE 1149.1 and At-Speed BIST
Package
UJB196A (Trays)
UJB196A (Tape and Reel)
TRI-STATE
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© 2008 National Semiconductor Corporation
200283
www.national.com
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