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LM2576T-3.3 参数 Datasheet PDF下载

LM2576T-3.3图片预览
型号: LM2576T-3.3
PDF下载: 下载PDF文件 查看货源
内容描述: 3.0 A, 15 V ,降压型开关稳压器 [3.0 A, 15 V, Step−Down Switching Regulator]
分类和应用: 稳压器开关式稳压器或控制器电源电路开关式控制器
文件页数/大小: 28 页 / 276 K
品牌: ONSEMI [ ON SEMICONDUCTOR ]
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LM2576
Typical Application
(Fixed Output Voltage Versions)
Feedback
7.0 V − 40 V
Unregulated
DC Input
+V
in
C
in
100
mF
1
3
GN
D
5
LM2576
4
Output
2
ON/OFF
L1
100
mH
D1
1N5822
C
out
1000
mF
5.0 V Regulated
Output 3.0 A Load
Representative Block Diagram and Typical Application
+V
in
1
C
in
4
Feedback
R2
Fixed Gain
Error Amplifier Comparator
Current
Limit
Unregulated
DC Input
3.1 V Internal
Regulator
ON/OFF
ON/OFF
5
Output
Voltage Versions
3.3 V
5.0 V
12 V
15 V
For adjustable version
R1 = open, R2 = 0
W
R2
(W)
1.7 k
3.1 k
8.84 k
11.3 k
R1
1.0 k
Driver
Freq
Shift
18 kHz
52 kHz
Oscillator
Latch
Output
1.0 Amp
Switch
Reset
Thermal
Shutdown
2
GND
3
D1
L1
Regulated
Output
V
out
C
out
Load
1.235 V
Band−Gap
Reference
This device contains 162 active transistors.
Figure 1. Block Diagram and Typical Application
MAXIMUM RATINGS
Rating
Maximum Supply Voltage
ON/OFF Pin Input Voltage
Output Voltage to Ground (Steady−State)
Power Dissipation
Case 314B and 314D (TO−220, 5−Lead)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Case 936A (D
2
PAK)
Thermal Resistance, Junction−to−Ambient
Thermal Resistance, Junction−to−Case
Storage Temperature Range
Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 kW)
Lead Temperature (Soldering, 10 seconds)
Maximum Junction Temperature
Symbol
V
in
P
D
R
qJA
R
qJC
P
D
R
qJA
R
qJC
T
stg
T
J
Value
45
−0.3 V
V
+V
in
−1.0
Internally Limited
65
5.0
Internally Limited
70
5.0
−65 to +150
2.0
260
150
Unit
V
V
V
W
°C/W
°C/W
W
°C/W
°C/W
°C
kV
°C
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
http://onsemi.com
2