BTA/BTB06 Series
Fig. 7:
Relative variation of gate trigger current,
holding current and latching current versus
junction temperature (typical values).
IGT,IH,IL[Tj] / IGT,IH,IL [Tj=25°C]
2.5
2.0
IGT
Fig. 8-1:
Relative variation of critical rate of
decrease of main current versus (dV/dt)c (typical
values). Snubberless & Logic Level Types
(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c
2.4
2.2
2.0
1.8
1.6
1.4
SW
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.1
1.5
IH & IL
TW
BW/CW
1.0
0.5
Tj(°C)
(dV/dt)c (V/µs)
0.0
-40
-20
0
20
40
60
80
100
120
140
1.0
10.0
100.0
Fig. 8-2:
Relative variation of critical rate of
decrease of main current versus (dV/dt)c (typical
values). Standard Types
(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c
2.0
1.8
C
1.6
1.4
B
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.1
Fig. 9:
Relative variation of critical rate of
decrease of main current versus junction
temperature.
(dI/dt)c [Tj] / (dI/dt)c [Tj specified]
6
5
4
3
2
(dV/dt)c (V/µs)
1
Tj(°C)
1.0
10.0
100.0
0
0
25
50
75
100
125
5/6
STMICROELECTRONICS [ STMICROELECTRONICS ]
