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STM8S207C6T3 参数 Datasheet PDF下载

STM8S207C6T3图片预览
型号: STM8S207C6T3
PDF下载: 下载PDF文件 查看货源
内容描述: 性能线, 24兆赫STM8S 8位MCU ,高达128 KB闪存,集成的EEPROM , 10位ADC ,定时器, 2个UART , SPI , I²C , CAN [Performance line, 24 MHz STM8S 8-bit MCU, up to 128 Kbytes Flash, integrated EEPROM,10-bit ADC, timers, 2 UARTs, SPI, I²C, CAN]
分类和应用: 闪存可编程只读存储器电动程控只读存储器电可擦编程只读存储器
文件页数/大小: 103 页 / 1740 K
品牌: STMICROELECTRONICS [ STMICROELECTRONICS ]
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STM8S207xx, STM8S208xx
Electrical characteristics
Electromagnetic interference (EMI)
Emission tests conform to the SAE IEC 61967-2 standard for test software, board layout and
pin loading.
Table 48.
EMI data
Conditions
Symbol
Parameter
General conditions
Max f
HSE
/f
CPU(1)
Monitored
frequency band
0.1MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI level
8 MHz/ 8 MHz/ 8 MHz/
8 MHz 16 MHz 24 MHz
15
18
-1
2
20
21
1
2.5
24
16
4
2.5
dBµV
Unit
Peak level
S
EMI
SAE EMI
level
V
DD
=
5 V
T
A
=
25 °C
LQFP80 package
conforming to SAE IEC
61967-2
1. Data based on characterization results, not tested in production.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the JESD22-A114A/A115A standard. For more details, refer to the application
note AN1181.
Table 49.
Symbol
V
ESD(HBM)
V
ESD(CDM)
ESD absolute maximum ratings
Ratings
Electrostatic discharge voltage
(Human body model)
Electrostatic discharge voltage
(Charge device model)
Conditions
T
A
=
25°C, conforming to
JESD22-A114
T
A
=
25°C, conforming to
JESD22-C101
Class
A
IV
Maximum
Unit
value
(1)
2000
1000
V
V
1. Data based on characterization results, not tested in production.
Doc ID 14733 Rev 9
87/103