TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits
Min Max
Unit
ns
C
VSS = 0 V
4.5 V ≤ V ≤ 5.5 V
CC
unless otherwise specified
01-03
10
Data hold time
tDH
CL = 30 pF,
See figures 4 and 5
9,10,11
04
5.0
0
05-08
M, D
9 1/
2/
01
02
03
04
05
06
07
08
140
100
80
65
50
40
30
25
Reset cycle time
tRSC
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
M, D
9 1/
2/
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
tRS
CL = 30 pF,
See figures 4 and 5
9,10,11
Reset pulse width
ns
M, D
9 1/
2/
01,02
20
Reset recovery time
Reset setup time
tRSR
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
ns
03,04
05-08
15
10
M, D
9 1/
2/
01
02
03
04
05
06
07,08
120
80
65
50
40
30
20
tRSS
3/
CL = 30 pF,
See figures 4 and 5
9,10,11
M, D
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89568
MICROCIRCUIT DRAWING
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
10
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
