ADS7841
ADS
784
1
ADS
784
1
SBAS084B – JULY 2001
12-Bit, 4-Channel Serial Output Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
q
SINGLE SUPPLY: 2.7V to 5V
q
4-CHANNEL SINGLE-ENDED OR
2-CHANNEL DIFFERENTIAL INPUT
q
UP TO 200kHz CONVERSION RATE
q
±
1LSB MAX INL AND DNL
q
NO MISSING CODES
q
72dB SINAD
q
q
q
q
SERIAL INTERFACE
DIP-16 OR SSOP-16 PACKAGE
ALTERNATE SOURCE FOR MAX1247
ADS7841ES: +125
°
C Version
DESCRIPTION
The ADS7841 is a 4-channel, 12-bit sampling Analog-to-
Digital Converter (ADC) with a synchronous serial inter-
face. The resolution is programmable to either 8 bits or 12
bits. Typical power dissipation is 2mW at a 200kHz through-
put rate and a +5V supply. The reference voltage (V
REF
) can
be varied between 100mV and V
CC
, providing a correspond-
ing input voltage range of 0V to V
REF
. The device includes
a shutdown mode which reduces power dissipation to under
15µW. The ADS7841 is tested down to 2.7V operation.
Low power, high speed, and on-board multiplexer make the
ADS7841 ideal for battery-operated systems such as per-
sonal digital assistants, portable multi-channel data loggers,
and measurement equipment. The serial interface also pro-
vides low-cost isolation for remote data acquisition. The
ADS7841 is available in a DIP-16 or a SSOP-16 package
and is specified over the –40°C to +125°C
(1)
temperature
range.
NOTE: (1) ES grade only.
APPLICATIONS
q
q
q
q
q
DATA ACQUISITION
TEST AND MEASUREMENT
INDUSTRIAL PROCESS CONTROL
PERSONAL DIGITAL ASSISTANTS
BATTERY-POWERED SYSTEMS
SAR
DCLK
CS
CH0
CH1
CH2
CH3
COM
V
REF
Four
Channel
Multiplexer
CDAC
Comparator
Serial
Interface
and
Control
SHDN
DIN
DOUT
MODE
BUSY
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2000, Texas Instruments Incorporated
www.ti.com
TI [ TEXAS INSTRUMENTS ]
