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SLAS600 – MAY 2008
16-BIT, 500-KSPS, SERIAL INTERFACE MICROPOWER, MINIATURE,
SAR ANALOG-TO-DIGITAL CONVERTER
1
FEATURES
500-kHz Sample Rate
16-Bit Resolution
Zero Latency at Full Speed
Unipolar, Single-Ended Input, Range: 0 V to
V
ref
SPI Compatible Serial Interface with Daisy
Chain Option
Excellent Performance:
– 93.6 dB SNR Typ at 10-kHz I/P
– –106 dB THD Typ at 10-kHz I/P
– ±1.5 LSB Max INL
– ±1.0 LSB Max DNL
Low Power Dissipation: 18 mW Typ at 500
KSPS
Power Scales Linearly with Speed: 3.6 mW/100
KSPS
Power Dissipation During Power-Down State:
0.25
µW
Typ
10-Pin MSOP and SON Packages
DESCRIPTION
The ADS8319 is a 16-bit, 500-KSPS analog-to-digital
converter. It operates with a 2.25-V to 5.5-V external
reference. The device includes a capacitor based,
SAR A/D converter with inherent sample and hold.
The device includes a 50-MHz SPI compatible serial
interface. The interface is designed to support daisy
chaining or cascading of multiple devices. Also a
Busy Indicator
makes it easy to synchronize with the
digital host.
The ADS8319 unipolar single-ended input range
supports an input swing of 0 V to +V
ref
.
Device operation is optimized for very low power
operation, and the power consumption directly scales
with speed. This feature makes it attractive for lower
speed applications.
It is available in 10-pin MSOP and SON packages.
+VA
+VBD
•
•
•
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•
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•
•
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SAR
O/P
Drive
SDO
APPLICATIONS
Battery Powered Equipments
Data Acquisition Systems
Instrumentation and Process Control
Medical Electronics
Optical Networking
IN+
CDAC
IN-
COMP
I/P
Shift
Reg
SDI
REFIN
ADS8319
Conversion and I/O
Control Logic
SCLK
GND
CONVST
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008, Texas Instruments Incorporated
TI [ TEXAS INSTRUMENTS ]
