SNOSBH1D – MAY 1999 – REVISED MARCH 2013
LF147/LF347 Wide Bandwidth Quad JFET Input Operational Amplifiers
Check for Samples:
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FEATURES
Internally Trimmed Offset Voltage: 5 mV max
Low Input Bias Current: 50 pA
Low Input Noise Current: 0.01 pA/√Hz
Wide Gain Bandwidth: 4 MHz
High Slew Rate: 13 V/μs
Low Supply Current: 7.2 mA
High Input Impedance: 10
12
Ω
Low Total Harmonic Distortion:
≤0.02%
Low 1/f Noise Corner: 50 Hz
Fast Settling Time to 0.01%: 2
μs
DESCRIPTION
The LF147 is a low cost, high speed quad JFET input
operational amplifier with an internally trimmed input
offset voltage ( BI-FET II™ technology). The device
requires a low supply current and yet maintains a
large gain bandwidth product and a fast slew rate. In
addition, well matched high voltage JFET input
devices provide very low input bias and offset
currents. The LF147 is pin compatible with the
standard LM148. This feature allows designers to
immediately upgrade the overall performance of
existing LF148 and LM124 designs.
The LF147 may be used in applications such as high
speed integrators, fast D/A converters, sample-and-
hold circuits and many other circuits requiring low
input offset voltage, low input bias current, high input
impedance, high slew rate and wide bandwidth. The
device has low noise and offset voltage drift.
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Simplified Schematic
¼ Quad
Connection Diagram
LF147 available as per JM38510/11906.
Figure 1. 14-Pin PDIP / CDIP / SOIC
Top View
See Package Number J0014A, D0014A or
NFF0014A
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
BI-FET II is a trademark of dcl_owner.
All other trademarks are the property of their respective owners.
Copyright © 1999–2013, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
TI [ TEXAS INSTRUMENTS ]
