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OPA140ATDD2 参数 Datasheet PDF下载

OPA140ATDD2图片预览
型号: OPA140ATDD2
PDF下载: 下载PDF文件 查看货源
内容描述: 高精度,低噪声,轨到轨输出 [HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT]
分类和应用: 运算放大器放大器电路输出元件
文件页数/大小: 4 页 / 71 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SBOS610B – MARCH 2012 – REVISED MARCH 2012
HIGH-PRECISION, LOW-NOISE, RAIL-TO-RAIL OUTPUT,
11-MHZ JFET OPERATIONAL AMPLIFIER
Check for Samples:
1
FEATURES
Very Low Offset Drift
Very Low Offset
Low Input Bias Current
Very Low 1/f Noise
Low Noise
Slew Rate
Low Supply Current
Input Voltage Range Includes V– Supply
Single-Supply Operation: 4.5 V to 36 V
Dual-Supply Operation: ±2.25 V to ±18 V
No Phase Reversal
APPLICATIONS
Battery-Powered Instruments
Industrial Controls
Medical Instrumentation
Photodiode Amplifiers
Active Filters
Data Acquisition Systems
Automatic Test Systems
DESCRIPTION
The OPA140A operational amplifier is a low-power JFET input amplifier that features good drift and low input
bias current. The rail-to-rail output swing and input range that includes V– allow designers to take advantage of
the low-noise characteristics of JFET amplifiers while also interfacing to modern, single-supply, precision analog-
to-digital converters (ADCs) and digital-to-analog converters (DACs). The OPA140A runs on a single 4.5-V to
36-V supply or dual ±2.25-V to ±18-V supplies.
ORDERING INFORMATION
(1)
PRODUCT
OPA140A
(1)
(2)
PACKAGE
DESIGNATOR
TD
PACKAGE
(2)
Bare Die In Waffle Pack
ORDERABLE PART NUMBER
OPA140ATDD1
OPA140ATDD2
PACKAGE QUANTITY
252
10
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at
Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated