SBOS259C – SEPTEMBER 2002 – REVISED MAY 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE AND ORDERING INFORMATION
(1)
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
Supply voltage
Signal input terminals
Output short-circuit
(3)
Operating temperature, T
A
Storage temperature, T
stg
Junction temperature, T
J
(1)
(2)
(3)
Voltage
Current
(2)
(2)
UNIT
V
V
mA
mA
°C
°C
°C
+5.5
–0.5 to (V+) + 0.5
±10
Continuous
–40 to +150
–65 to +150
+150
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current limited to 10mA or less.
Short-circuit to ground, one amplifier per package.
ELECTRICAL CHARACTERISTICS: V
S
= +1.8V to +5.5V
Boldface
limits apply over the specified temperature range,
T
A
= –40°C to +125°C.
At T
A
= +25°C, R
L
= 10kΩ connected to V
S
/2, V
OUT
= V
S
/2, and V
CM
= V
S
/2, unless otherwise noted.
OPAx363, OPAx364
PARAMETER
OFFSET VOLTAGE
Input Offset Voltage, OPA363I, OPA364I
OPA2363I, OPA2364I
OPA363AI, OPA364AI, OPA2363AI, OPA2364AI,
OPA4364AI
Drift
vs Power Supply
Channel Separation, dc
INPUT BIAS CURRENT
Input Bias Current
over Temperature
Input Offset Current
NOISE
Input Voltage Noise, f = 0.1Hz to 10Hz
Input Voltage Noise Density, f = 10kHz
Input Current Noise Density, f = 10kHz
INPUT VOLTAGE RANGE
Common-Mode Voltage Range
Common-Mode Rejection Ratio
V
CM
CMRR
(V−) – 0.1V < V
CM
< (V+) + 0.1V
(V–) – 0.1
74
90
(V+) + 0.1
V
dB
e
n
e
n
i
n
10
17
0.6
µV
PP
nV/√Hz
fA/√Hz
I
OS
I
B
±1
±10
pA
dV
OS
/dT
PSRR
V
S
= 1.8V to 5.5V, V
CM
= 0
1
3
80
1
330
V
OS
V
S
= +5V
500
900
2.5
μV
μV
mV
μV/°C
μV/V
μV/V
CONDITIONS
MIN
TYP
MAX
UNIT
See
±1
±10
pA
2
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