SLOS735
–
AUGUST 2011
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
T
A
–55°C
to 125°C
(1)
PACKAGE
SOT23
–
DBV
ORDERABLE PART NUMBER
OPA365AMDBVTEP
TOP-SIDE MARKING
OUNM
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at
ABSOLUTE MAXIMUM RATINGS
(1)
V
CC
V
I
I
I
t
OSC
T
OP
T
stg
T
J
ESD
Supply voltage
Signal input terminals, voltage
Output short-circuit duration
Operating temperature
Storage temperature
Junction temperature
Human Body Model
Electrostatic discharge rating
Charged Device Model
Machine Model
(1)
(2)
(3)
(4)
(2)
5.5 V
(V−)
−
0.5V to (V+) + 0.5 V
±10
mA
Continuous
−55°C
to 125°C
−65°C
to 150°C
150°C
4000V
1000V
200V
Signal input terminals, current
(2)
(3) (4)
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current limited to 10mA or less.
Short-circuit to ground, one amplifier per package
Continuous output current greater than 20 mA for extended periods may affect product reliability.
2
Product Folder Link(s):
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©
2011, Texas Instruments Incorporated
TI [ TEXAS INSTRUMENTS ]
