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SN74S00N3 参数 Datasheet PDF下载

SN74S00N3图片预览
型号: SN74S00N3
PDF下载: 下载PDF文件 查看货源
内容描述: 四路2输入正与非门 [QUADRUPLE 2-INPUT POSITIVE-NAND GATES]
分类和应用: 输入元件
文件页数/大小: 21 页 / 738 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SN5400, SN54LS00, SN54S00
SN7400, SN74LS00, SN74S00
QUADRUPLE 2 INPUT POSITIVE NAND GATES
SDLS025B − DECEMBER 1983 − REVISED OCTOBER 2003
D
Package Options Include Plastic
Small-Outline (D, NS, PS), Shrink
Small-Outline (DB), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J) DIPs
SN5400 . . . J PACKAGE
SN54LS00, SN54S00 . . . J OR W PACKAGE
SN7400, SN74S00 . . . D, N, OR NS PACKAGE
SN74LS00 . . . D, DB, N, OR NS PACKAGE
(TOP VIEW)
D
Also Available as Dual 2-Input
Positive-NAND Gate in Small-Outline (PS)
Package
SN74LS00, SN74S00 . . . PS PACKAGE
(TOP VIEW)
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
4B
4A
4Y
3B
3A
3Y
1A
1B
1Y
GND
1
2
3
4
8
7
6
5
V
CC
2B
2A
2Y
SN5400 . . . W PACKAGE
(TOP VIEW)
SN54LS00, SN54S00 . . . FK PACKAGE
(TOP VIEW)
1A
1B
1Y
V
CC
2Y
2A
2B
1
2
3
4
5
6
7
14
13
12
11
10
9
8
4Y
4B
4A
GND
3B
3A
3Y
1B
1A
NC
V
CC
4B
1Y
NC
2A
NC
2B
3
4
5
6
7
8
2 1 20 19
18
17
16
15
14
9 10 11 12 13
4A
NC
4Y
NC
3B
NC − No internal connection
description/ordering information
These devices contain four independent 2-input NAND gates. The devices perform the Boolean function
Y = A
B or Y = A + B in positive logic.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
2Y
GND
NC
3Y
3A
On products compliant to MIL PRF 38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
Copyright
2003, Texas Instruments Incorporated
1