欢迎访问ic37.com |
会员登录 免费注册
发布采购

SN74ABT18646PMG4 参数 Datasheet PDF下载

SN74ABT18646PMG4图片预览
型号: SN74ABT18646PMG4
PDF下载: 下载PDF文件 查看货源
内容描述: 内置18位收发器和寄存器 [WITH 18-BIT TRANSCEIVER AND REGISTER]
分类和应用: 总线驱动器总线收发器触发器逻辑集成电路信息通信管理
文件页数/大小: 13 页 / 209 K
品牌: TI [ TEXAS INSTRUMENTS ]
 浏览型号SN74ABT18646PMG4的Datasheet PDF文件第2页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第3页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第4页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第5页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第6页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第7页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第8页浏览型号SN74ABT18646PMG4的Datasheet PDF文件第9页  
SN74ABT18646
SCAN TEST DEVICE
WITH 18-BIT TRANSCEIVER AND REGISTER
SCBS131A – AUGUST 1992 – REVISED JANUARY 2002
D
D
D
D
Member of the Texas Instruments
Widebus Family
Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
Includes D-Type Flip-Flops and Control
Circuitry to Provide Multiplexed
Transmission of Stored and Real-Time Data
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D
SCOPE Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions, Optional INTEST, and
P1149.1A CLAMP and HIGHZ
– Parallel Signature Analysis at Inputs
With Masking Option
– Pseudorandom Pattern Generation From
Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
PM PACKAGE
(TOP VIEW)
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
1A2
1A1
1OE
GND
1SAB
1CLKAB
TDO
V
CC
TMS
1CLKBA
1SBA
1DIR
GND
1B1
1B2
1B3
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
description
This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE
testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex
circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port
(TAP) interface.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and Widebus are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
2A7
2A8
2A9
GND
2OE
2SAB
2CLKAB
TDI
V
CC
TCK
2CLKBA
2SBA
GND
2DIR
2B9
2B8
Copyright
2002, Texas Instruments Incorporated
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
1