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SN74CBT3253DBQRG4 参数 Datasheet PDF下载

SN74CBT3253DBQRG4图片预览
型号: SN74CBT3253DBQRG4
PDF下载: 下载PDF文件 查看货源
内容描述: 1 -OF- 4双FET的复用器/解复用器 [DUAL 1-OF-4 FET MULTIPLEXER/DEMULTIPLEXER]
分类和应用: 解复用器逻辑集成电路光电二极管
文件页数/大小: 16 页 / 721 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SN74CBT3253
DUAL 1 OF 4 FET MULTIPLEXER/DEMULTIPLEXER
SCDS018O − MAY 1995 − REVISED JANUARY 2004
D
TTL-Compatible Input Levels
D, DB, DBQ, OR PW PACKAGE
(TOP VIEW)
RGY PACKAGE
(TOP VIEW)
1OE
1OE
S1
1B4
1B3
1B2
1B1
1A
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
CC
2OE
S0
2B4
2B3
2B2
2B1
2A
1
16
15
2OE
14
S0
13
2B4
12
2B3
11
2B2
10
2B1
S1
1B4
1B3
1B2
1B1
1A
2
3
4
5
6
7
8
9
description/ordering information
The SN74CBT3253 is a dual 1-of-4 high-speed TTL-compatible FET multiplexer/demultiplexer. The low
on-state resistance of the switch allows connections to be made with minimal propagation delay.
1OE, 2OE, S0, and S1 select the appropriate B output for the A-input data.
ORDERING INFORMATION
TA
QFN − RGY
SOIC − D
−40 C 85°C
−40°C to 85 C
SSOP − DB
SSOP (QSOP) − DBQ
TSSOP − PW
PACKAGE†
Tape and reel
Tube
Tape and reel
Tape and reel
Tape and reel
Tube
Tape and reel
ORDERABLE
PART NUMBER
SN74CBT3253RGYR
SN74CBT3253D
SN74CBT3253DR
SN74CBT3253DBR
SN74CBT3253DBQR
SN74CBT3253PW
SN74CBT3253PWR
CU253
CBT3253
CU253
CU253
TOP-SIDE
MARKING
CU253
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design
guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE
INPUTS
1OE
X
H
L
L
L
L
2OE
H
X
L
L
L
L
S1
X
X
L
L
H
H
S0
X
X
L
H
L
H
FUNCTION
Disconnect 1A and 2A
Disconnect 1A and 2A
1A to 1B1 and 2A to 2B1
1A to 1B2 and 2A to 2B2
1A to 1B3 and 2A to 2B3
1A to 1B4 and 2A to 2B4
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
GND
Copyright
2004, Texas Instruments Incorporated
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
2A
V
CC
1