SN54HC00, SN74HC00
QUADRUPLE 2 INPUT POSITIVE NAND GATES
SCLS181E − DECEMBER 1982 − REVISED AUGUST 2003
D
Wide Operating Voltage Range of 2 V to 6 V
D
Outputs Can Drive Up To 10 LSTTL Loads
D
Low Power Consumption, 20-µA Max I
CC
SN54HC00 . . . J OR W PACKAGE
SN74HC00 . . . D, DB, N, NS, OR PW PACKAGE
(TOP VIEW)
D
Typical t
pd
= 8 ns
D
±4-mA
Output Drive at 5 V
D
Low Input Current of 1
µA
Max
SN54HC00 . . . FK PACKAGE
(TOP VIEW)
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
4B
4A
4Y
3B
3A
3Y
1Y
NC
2A
NC
2B
1B
1A
NC
V
CC
4B
4
5
6
7
8
3 2 1 20 19
18
17
16
15
14
9 10 11 12 13
4A
NC
4Y
NC
3B
NC − No internal connection
description/ordering information
The ’HC00 devices contain four independent 2-input NAND gates. They perform the Boolean function
Y = A
•
B or Y = A + B in positive logic.
ORDERING INFORMATION
TA
PDIP − N
PACKAGE†
Tube of 25
Tube of 50
SOIC − D
−40 C 85°C
−40°C to 85 C
SOP − NS
SSOP − DB
Reel of 2500
Reel of 250
Reel of 2000
Reel of 2000
Tube of 90
TSSOP − PW
CDIP − J
−55 C 125°C
−55°C to 125 C
CFP − W
LCCC − FK
Reel of 2000
Reel of 250
Tube of 25
Tube of 150
Tube of 55
ORDERABLE
PART NUMBER
SN74HC00N
SN74HC00D
SN74HC00DR
SN74HC00DT
SN74HC00NSR
SN74HC00DBR
SN74HC00PW
SN74HC00PWR
SN74HC00PWT
SNJ54HC00J
SNJ54HC00W
SNJ54HC00FK
SNJ54HC00J
SNJ54HC00W
SNJ54HC00FK
HC00
HC00
HC00
HC00
TOP-SIDE
MARKING
SN74HC00N
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
•
DALLAS, TEXAS 75265
2Y
GND
NC
3Y
3A
On products compliant to MIL PRF 38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
Copyright
2003, Texas Instruments Incorporated
1
TI [ TEXAS INSTRUMENTS ]
