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SN74LVCU04A
HEX INVERTER
SCAS282M – JANUARY 1993 – REVISED FEBRUARY 2005
FEATURES
•
•
•
•
•
•
•
•
Operates From 1.65 V to 3.6 V
Inputs Accept Voltages to 5.5 V
Max t
pd
of 3.8 ns
Typical V
OLP
(Output Ground Bounce)
<0.8 V at V
CC
= 3.3 V, T
A
= 25°C
Typical V
OHV
(Output V
OH
Undershoot)
>2 V at V
CC
= 3.3 V, T
A
= 25°C
Inputs Accept Voltages to 5.5 V
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D, DB, DGV, NS, OR PW PACKAGE
(TOP VIEW)
1A
1Y
2A
2Y
3A
3Y
GND
1
2
3
4
5
6
7
14
13
12
11
10
9
8
V
CC
6A
6Y
5A
5Y
4A
4Y
DESCRIPTION/ORDERING INFORMATION
This hex inverter is designed for 1.65-V to 3.6-V V
CC
operation.
The SN74LVCU04A contains six independent inverters with unbuffered outputs and performs the Boolean
function Y = A.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
ORDERING INFORMATION
T
A
SOIC – D
SOP – NS
–40°C to 85°C
SSOP – DB
TSSOP – PW
TVSOP – DGV
(1)
PACKAGE
(1)
Tube of 50
Reel of 2500
Reel of 250
Reel of 2000
Reel of 2000
Tube of 90
Reel of 2000
Reel of 250
Reel of 2000
ORDERABLE PART NUMBER
SN74LVCU04AD
SN74LVCU04ADR
SN74LVCU04ADT
SN74LVCU04ANSR
SN74LVCU04ADBR
SN74LVCU04APW
SN74LVCU04APWR
SN74LVCU04APWT
SN74LVCU04ADGVR
LCU04A
LCU04A
LVCU04A
LCU04A
LVCU04A
TOP-SIDE MARKING
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
FUNCTION TABLE
(EACH INVERTER)
INPUT
A
H
L
OUTPUT
Y
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 1993–2005, Texas Instruments Incorporated