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TPIC2601KTC 参数 Datasheet PDF下载

TPIC2601KTC图片预览
型号: TPIC2601KTC
PDF下载: 下载PDF文件 查看货源
内容描述: 6通道共源极功率DMOS阵列 [6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY]
分类和应用: 晶体晶体管功率场效应晶体管脉冲局域网
文件页数/大小: 10 页 / 188 K
品牌: TI [ TEXAS INSTRUMENTS ]
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TPIC2601
6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY
SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998
D
D
D
D
D
Low r
DS(on)
. . . 0.25
Typ
High Output Voltage . . . 60 V
Pulsed Current . . . 10 A Per Channel
Avalanche Energy Capability . . . 105 mJ
Input Transient Protection . . . 2000 V
KTC or KTD† PACKAGE
(TOP VIEW)
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
† TI Japan only
description
The TPIC2601 is a monolithic power DMOS array
that consists of six electrically isolated N-channel
enhancement-mode
DMOS
transistors
configured with a common source and open
drains. Each transistor features integrated
high-current zener diodes to prevent gate
damage in the event that an overstress condition
occurs. These zener diodes also provide up to
2000 V of ESD protection when tested using the
human-body model.
DRAIN6
GATE6
DRAIN5
GATE5
DRAIN4
DRAIN4
GATE4
SOURCE/GND
GATE3
DRAIN3
DRAIN3
GATE2
DRAIN2
GATE1
DRAIN1
The TPIC2601 is offered in a 15-pin PowerFLEX™ (KTC) package and is characterized for operation over the
case temperature range of – 40°C to 125°C.
A 15-pin PowerFLEX
(KTD) package is also available for TI Japan
only.
schematic
DRAIN1
1
Q1
GATE1
2
DRAIN2
3
GATE2
4
Q2
GATE3
7
Q3
DRAIN3
5, 6
DRAIN4
DRAIN5
DRAIN6
10, 11
13
15
GATE4
GATE5
9
Q4
Q5 12
Q6
14
GATE6
8
SOURCE/GND
NOTE A: For correct operation, no drain terminal may be taken below GND.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerFLEX is a trademark of Texas Intruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
©
1998, Texas Instruments Incorporated
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
1