TPS3813J25, TPS3813L30
TPS3813K33, TPS3813I50
www.ti.com
SLVS331B – DECEMBER 2000 – REVISED JUNE 2005
PROCESSOR SUPERVISORY CIRCUITS WITH WINDOW-WATCHDOG
FEATURES
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•
•
•
•
•
•
•
•
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Window-Watchdog With Programmable Delay
and Window Ratio
6-Pin SOT-23 Package
Supply Current of 9
µA
(Typ)
Power On Reset Generator With a Fixed Delay
Time of 25 ms
Precision Supply Voltage Monitor 2.5 V, 3 V,
3.3 V, 5 V
Open-Drain Reset Output
Temperature Range –40°C to 85°C
TPS3813
DBV PACKAGE
(TOP VIEW)
WDI
GND
WDT
1
2
3
6
5
4
RESET
WDR
V
DD
ACTUAL SIZE
3,00 mm x 3,00 mm
APPLICATIONS
Applications Using DSPs, Microcontrollers, or
Microprocessors
Safety Critical Systems
Automotive Systems
Healing Systems
DESCRIPTION
The TPS3813 family of supervisory circuits provides circuit initialization and timing supervision, primarily for
DSPs and processor-based systems.
During power on, RESET is asserted when supply voltage (V
DD
) becomes higher than 1.1 V. Thereafter, the
supervisory circuit monitors V
DD
and keeps RESET active as long as V
DD
remains below the threshold voltage
(V
IT
). An internal timer delays the return of the output to the inactive state (high) to ensure proper system reset.
The delay time, t
d
= 25 ms typical, starts after V
DD
has risen above the threshold voltage (V
IT
). When the supply
voltage drops below the threshold voltage (V
IT
), the output becomes active (low) again. No external components
are required. All the devices of this family have a fixed-sense threshold voltage (V
IT
) set by an internal voltage
divider.
TYPICAL OPERATING CIRCUIT
V
DD
0.1 µF
R
V
DD
WDR
RESET
TPS3813
WDT
C
WP
GND
WDI
I/O
GND
V
DD
RESET
uC
0.1 µF
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2005, Texas Instruments Incorporated
TI [ TEXAS INSTRUMENTS ]
