SWCS046N – MARCH 2010 – REVISED APRIL 2012
I/O PULLUP AND PULLDOWN CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER
SDA_SDI, SCL_SCK, SDASR_EN2,
SCLSR_EN1 Programmable pullup (DFT, default
inactive)
SLEEP programmable pulldown (default active)
PWRHOLD programmable pulldown (default
active)
(1)
TEST CONDITIONS
Grounded, VDDIO = 1.8 V
@ 1.8 V, VRTC = 1.8 V
@ 1.8 V, VRTC = 1.8 V, VCC7 = 2.7
V
@ 5.5 V, VRTC = 1.8 V, VCC7 = 5.5
V
MIN
–45%
2
2
7
2
2
2
–40
–27
TYP
8
4.5
4.5
14
4.5
4.5
4.5
–31
–18
MAX
+45%
10
10
UNIT
kΩ
µA
µA
30
10
10
10
–15
–9
µA
µA
µA
µA
µA
BOOT0, BOOT1 programmable pulldown (default
@ 1.8 V, VRTC = 1.8 V
active)
NRESPWRON pulldown
32KCLKOUT pulldown (disabled in Active-sleep
state)
PWRON programmable pullup (default active)
GPIO_CKSYNC programmable pullup (default
active)
(1)
@ 1.8 V, VCC7 = 5.5 V, OFF state
@ 1.8 V, VRTC = 1.8 V, OFF state
Grounded, VCC7 = 5.5 V
Grounded, VRTC = 1.8 V
The internal pullups on the CTL-I
2
C and SR-I
2
C balls are used for test purposes or when the SR-I
2
C interface is not used. Discrete
pullups to the VIO supply must be mounted on the board in order to use the I
2
C interfaces. The internal I
2
C pullups must not be used for
functional applications
Copyright © 2010–2012, Texas Instruments Incorporated
7
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