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VSP5010PMR 参数 Datasheet PDF下载

VSP5010PMR图片预览
型号: VSP5010PMR
PDF下载: 下载PDF文件 查看货源
内容描述: 12位, 31 - MSPS ,双通道CCD模拟前端数码复印机 [12-Bit, 31-MSPS, Dual-Channel CCD ANALOG FRONT-END FOR DIGITAL COPIERS]
分类和应用: 模拟IC信号电路
文件页数/大小: 25 页 / 711 K
品牌: TI [ TEXAS INSTRUMENTS ]
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SBES014 – AUGUST 2008
................................................................................................................................................................................................
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION
(1)
PACKAGE-
LEAD
LQFP-64
PACKAGE
DESIGNATOR
PM
SPECIFIED
TEMPERATURE
RANGE
–25°C to +85°C
PACKAGE
MARKING
VSP5010PM
ORDERING
NUMBER
VSP5010PM
VSP5010PMR
TRANSPORT
MEDIA, QUANTITY
Tray, 160 Pieces
Tape and Reel, 1000
PRODUCT
VSP5010PM
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
VSP5010
Supply voltage
Supply voltage differences
Ground voltage differences
Digital input voltage
Analog input voltage
Input current (all pins except supplies)
Ambient temperature under bias
Storage temperature
Junction temperature
Lead temperature (soldering, 5s)
Package temperature (I
R
reflow, peak, 10s)
(1)
VCC, VDD
VCC, VDD
AGND, DGND
+4.0
±0.1
±0.1
–0.3 to (VDD + 0.3)
–0.3 to (VCC + 0.3)
±10
–40 to +125
–55 to +150
+150
+260
+235
UNIT
V
V
V
V
V
mA
°C
°C
°C
°C
°C
PRODUCT PREVIEW
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability. These are stress ratings only and functional
operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied.
RECOMMENDED OPERATING CONDITIONS
Over operating free-air temperature range, unless otherwise noted.
MIN
Analog supply voltage
Digital supply voltage
Analog input voltage, full-scale (0 dB)
Digital input logic family
Digital input clock frequency
Digital output load capacitance
Operating free-air temperature, T
A
–25
System clock
10
30
+85
VCC
VDD
3
3
NOM
3.3
3.3
1
CMOS
30
MHz
pF
°C
MAX
3.6
3.6
UNIT
V
V
2
Product Folder Link(s):
Copyright © 2008, Texas Instruments Incorporated