TC74AC08P/F/FN/FT
Pin Assignment
IEC Logic Symbol
1A
1B
2A
2B
3A
3B
4A
4B
(1)
(2)
(4)
(5)
(9)
(10)
(12)
(13)
&
(3)
(6)
(8)
(11)
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
(top view)
14
13
12
11
10
9
8
V
CC
4B
4A
4Y
3B
3A
3Y
1Y
2Y
3Y
4Y
Truth Table
A
L
L
H
H
B
L
H
L
H
Y
L
L
L
H
Absolute Maximum Ratings (Note 1)
Characteristics
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC V
CC
/ground current
Power dissipation
Storage temperature
Symbol
V
CC
V
IN
V
OUT
I
IK
I
OK
I
OUT
I
CC
P
D
T
stg
Rating
−0.5
to 7.0
−0.5
to V
CC
+ 0.5
−0.5
to V
CC
+ 0.5
±20
±50
±50
±100
500 (DIP) (Note 2)/180 (SOP/TSSOP)
−65
to 150
Unit
V
V
V
mA
mA
mA
mA
mW
°C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: 500 mW in the range of Ta =
−40°C
to 65°C. From Ta = 65°C to 85°C a derating factor of
−10
mW/°C
should be applied up to 300 mW.
2
2007-10-01
TOSHIBA [ TOSHIBA SEMICONDUCTOR ]
