Product Preview
WM8777
Test Conditions
AVDDDAC = 5V, AVDDADC=5V, DVDD = 3.3V, AGNDDAC = 0V, AGNDADC = 0, DGND = 0V, T
A
= +25
o
C, fs = 48kHz, MCLK
= 256fs, ADC/DAC in Slave Mode unless otherwise stated.
PARAMETER
Treble range adjustment
Treble step size
Bass range adjustment
Bass step size
Headphone Amplifier at 0dB Volume (Load=16
Ω,
at 1Vrms)
Headphone output level
THD
SNR
Headphone Amplifier at 0dB Volume (Load=32
Ω,
at 1Vrms)
Headphone output level
THD
SNR
S/PDIF Transceiver
Jitter on recovered clock (Rms
period jitter)
S/PDIF Input Levels CMOS MODE
Input LOW level
Input HIGH level
Input capacitance
Input Frequency
S/PDIF Input Levels Comparator MODE
Input capacitance
Input resistance
Input frequency
Input Amplitude
PLL
Period Jiffer
XTAL
Input XTI LOW level
Input XTI HIGH level
Input XTI capacitance
Input XTI leakage
Output XTO LOW
Output XTO HIGH
Notes:
1.
2.
Ratio of output level with 1kHz full scale input, to the output level with all zeros into the digital input, measured ‘A’
weighted.
All performance measurements done with 20kHz low pass filter, and where noted an A-weight filter. Failure to use
such a filter will result in higher THD+N and lower SNR and Dynamic Range readings than are found in the Electrical
Characteristics. The low pass filter removes out of band noise; although it is not audible it may affect dynamic
specification values.
VMID decoupled with 10uF and 0.1uF capacitors (smaller values may result in reduced performance).
VX
IL
VXI
H
C
XJ
IX
leak
VX
OL
VX
OH
15pF load capacitors
15pF load capacitors
0
853
3.32
28.92
86
1.458
4.491
38.96
278
1.942
557
mV
mV
pF
mA
mV
V
80
ps(rms)
200
1.31
18
25
0.5 X DVDD
pF
Ω
MHz
mV
V
IL
V
IH
0.7 X DVDD
1.25
36
0.3 X DVDD
V
V
pF
MHz
50
Ps
0.95
-68
-100
Vrms
dB
dB
1.5
-74
-96
Vrms
dB
dB
-10
1
SYMBOL
TEST CONDITIONS
MIN
-10
1
+10
TYP
MAX
+10
UNIT
dB
dB
dB
dB
Analogue Bass Management and Tone Controls
3.
w
PP Rev 1.94 November 2004
9
WOLFSON [ WOLFSON MICROELECTRONICS PLC ]
