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产品型号AD53032的Datasheet PDF文件预览

High Performance Driver/Comparator  
Active Load on a Single Chip  
a
AD53032  
FEATURES  
FUNCTIONAL BLOCK DIAGRAM  
250 MHz Operation  
Driver/Comparator and Active Load Included  
On-Chip Schottky Diode Bridge  
52-Lead LQFP Package with Built-in Heatsink  
V
V
V
V
V
V
V
V
CC  
CC  
CC  
CC  
EE  
EE  
EE EE  
51  
52  
34  
39  
40  
41 32  
39nF  
CHDCPL  
VH 47  
AD53032  
45  
37  
38  
43  
42  
49  
50  
31  
VTERM  
DATA  
APPLICATIONS  
Automatic Test Equipment  
Semiconductor Test Systems  
Board Test Systems  
VHDCPL  
DATA  
39nF  
CLDCPL  
50  
IOD  
DRIVER  
V
OUT  
IOD  
Instrumentation and Characterization Equipment  
VLDCPL  
RLD  
RLD  
V
L
HCOMP  
LEH  
LEH  
QH  
PRODUCT DESCRIPTION  
The AD53032 is a single chip that performs the pin electronics  
functions of driver, comparator and active load in ATE VLSI  
and memory testers. In addition, a Schottky diode bridge for the  
active load and a VCOM buffer are included internally.  
QHB  
COMPARATOR  
QL  
QL  
The driver is a proprietary design that features three active  
states: Data High Mode, Data Low Mode and Term Mode as  
well as an Inhibit State. This facilitates the implementation of  
high speed active termination. The output voltage range is –3 V  
to +8 V to accommodate a wide variety of test devices. The  
output leakage is typically less than 250 nA over the entire sig-  
nal range.  
LEL  
LEL  
LCOMP  
ACTIVE LOAD  
VCOMI  
IOLC  
+1  
VCOMS  
IOL  
V/I  
IOLRTN  
The dual comparator, with an input range equal to the driver  
output range, features built-in latches and ECL-compatible  
outputs. The outputs are capable of driving 50 signal lines  
terminated to –2 V. Signal tracking capability is upwards of  
5 V/ns.  
IOHRTN  
INHL 36  
IOH  
35  
INHL  
THERM  
NC  
1.0A/K  
IOHC  
V/I  
The active load can be set for up to 35 mA load current with  
less than a 10 µA linearity error through the entire set range.  
9,33,44,46,48  
PWRGND  
2,5,8  
ECLGND  
HQGND2  
HQGND  
I
OH, IOL and the buffered VCOM are independently adjustable.  
Onboard Schottky diodes provide high speed switching and low  
NC = NO CONNECT  
capacitance.  
Also included on the chip is an onboard temperature sensor  
whose purpose is to give an indication of the surface tempera-  
ture of the DCL. This information can be used to measure θJC  
and θJA or flag an alarm if proper cooling is lost. Output from  
the sensor is a current sink that is proportional to absolute tem-  
perature. The gain is trimmed to a nominal value of 1.0 µA/K.  
As an example, the output current can be sensed by using a  
10 kresistor connected from +10 V to the THERM (IOUT) pin.  
A voltage drop across the resistor will be developed that equals:  
10K × 1 µA/K = 10 mV/K = 2.98 V at room temperature.  
REV. 0  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, nor for any infringements of patents or other rights of third parties  
which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
World Wide Web Site: http://www.analog.com  
© Analog Devices, Inc., 1998  
AD53032–SPECIFICATIONS  
DRIVER SPECIFICATIONS  
(All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +12 V ؎ 3%, –VS = –7 V = ؎3% unless otherwise noted. All temperature coefficients are  
measured at TJ = +75؇C to +95؇C). CHDCPL = CLDCPL = 39 nF.  
Parameter  
Min  
Typ Max  
Units  
Test Conditions  
DIFFERENTIAL INPUT CHARACTERISTICS  
(DATA to DATA, IOD to IOD, RLD to RLD)  
Input Voltage  
–2  
0
ECL  
V
Differential Input Range  
Bias Current  
–250  
+250  
µA  
VIN = –2 V, 0.0 V  
VL, VH, VT = 5 V  
REFERENCE INPUTS  
Bias Currents  
–50  
–2  
+50  
8
µA  
OUTPUT CHARACTERISTICS  
Logic High Range  
V
DATA = H, VH = –2 V to +8 V  
VL = –3 V (VH = –2 V to +6 V)  
VL = –1 V (VH = +6 V to +8 V)  
Logic Low Range  
Amplitude (VH and VL)  
Absolute Accuracy  
VH Offset  
VH Gain + Linearity Error  
VL Offset  
–3  
0.1  
5
9
V
V
DATA = L, VL = –3 V to +5 V, VH = +6 V  
VL = 0.0 V, VH = +0.1 V, VT = 0 V  
VL = –2 V, VH = +7 V, VT = 0 V  
DATA = H, VH = 0 V, VL = –3 V, VT = +3 V  
DATA = H, VH = –2 V to +8 V, VL = –3 V, VT = +3 V  
DATA = L, VL = –3 V, VH = +6 V, VT = +7.5 V  
DATA = L, VL = 0 V , VH = +6 V, VT = +7.5 V  
VL = 0 V, VH = +5 V, VT = 0 V  
–50  
0.3 – 5  
–50  
+50  
mV  
+0.3 + 5 % of VH + mV  
+50 mV  
+0.3 + 5 % of VL + mV  
VL Gain + Linearity Error  
Offset TC  
–0.3 – 5  
0.5  
mV/°C  
Output Resistance  
VH = –2 V  
VH = +8 V  
VL = –3 V  
VL = +5 V  
VH = +3 V  
Dynamic Current Limit  
Static Current Limit  
44  
44  
44  
44  
46  
46  
46  
46  
46  
48  
48  
48  
48  
mA  
mA  
VL = –3 V, VT = 0 V, IOUT = 0, +1, +30 mA  
VL = –1 V, VT = 0 V, IOUT = 0, –1, –30 mA  
VH = +6 V, VT = 0 V, IOUT = 0, +1, +30 mA  
VH = +6 V, VT = 0 V, IOUT = 0, –1, –30 mA  
VL = 0 V, VT = 0 V, IOUT = –30 mA (Trim Point)  
CBYP = 39 nF, VH = +7 V, VL = –2 V, VT = 0 V  
Output to –3 V, VH = +8 V, VL = –1 V, VT = 0 V  
DATA = H and Output to +8 V, VH = +6 V,  
VL = –3 V, VT = 0 V, DATA = L  
100  
–85  
+85  
VT  
ERM  
Voltage Range  
–3  
–50  
8.0  
+50  
V
mV  
TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V  
TERM MODE, VT = 0 V, VL = 0 V, VH = 3 V  
VTERM Offset  
VTERM Gain + Linearity Error  
–0.3 + 5  
+0.3 + 5 % of VSET + mV TERM MODE, VT = –3 V to +8 V, VL = 0 V, VH = 3 V  
Offset TC  
0.5  
46  
mV/°C  
VT = 0 V, VL = 0 V, VH = 3 V  
Output Resistance  
44  
49  
IOUT = +30 mA, +1.0 mA, VT = –3.0 V, VH = 3 V, VL = 0 V  
IOUT = –30 mA, –1.0 mA, VT = +8.0 V, VH = 3 V, VL = 0 V  
IOUT = ±30 mA, ±1.0 mA, VT = 0 V, VH = 3 V, VL = 0 V  
DYNAMIC PERFORMANCE, (VH AND VL)  
Propagation Delay Time  
Propagation Delay TC  
Delay Matching, Edge to Edge  
Rise and Fall Times  
1 V Swing  
1.1  
1.6  
2
<100  
2.1  
ns  
ps/°C  
ps  
Measured at 50%, VH = +400 mV, VL = –400 mV  
Measured at 50%, VH = +400 mV, VL = –400 mV  
Measured at 50%, VH = +400 mV, VL = –400 mV  
0.6  
1.0  
1.7  
3.0  
ns  
ns  
ns  
ns  
Measured 20%–80%, VL = 0 V, VH = 1 V  
Measured 20%–80%, VL = 0 V, VH = 3 V  
Measured 10%–90%, VL = 0 V, VH = 5 V  
Measured 10%–90%, VL = –2 V, VH = 7 V  
3 V Swing  
5 V Swing  
9 V Swing  
Rise and Fall Time Temperature Coefficient  
1 V Swing  
3 V Swing  
±1  
±2  
±4  
ps/°C  
ps/°C  
ps/°C  
Measured 20%–80%, VL = 0 V, VH = 1 V  
Measured 20%–80%, VL = 0 V, VH = 3 V  
Measured 10%–90%, VL = 0 V, VH = 5 V  
5 V Swing  
Overshoot and Preshoot  
–3.0 – 50  
+3.0 + 50 % of Step + mV VL, VH = –0.1 V, 0.1 V, VL, VH = 0.0 V, 1.0 V  
VL, VH = 0.0 V, 3.0 V, VL, VH = 0.0 V, 5.0 V  
VL, VH = –2.0 V, 7.0 V  
Settling Time  
to 15 mV  
to 4 mV  
<50  
<10  
ns  
µs  
VL = 0 V, VH = 0.5 V  
VL = 0 V, VH = 0.5 V  
–2–  
REV. 0  
AD53032  
Parameter  
Min  
Typ Max  
Units  
Test Conditions  
Delay Change vs. Pulsewidth  
Minimum Pulsewidth  
3 V Swing  
5 V Swing  
Toggle Rate  
<50  
ps  
VL = 0 V, VH = 2 V  
2
3
250  
ns  
ns  
MHz  
VL = 0 V, VH = 3 V, 90% Reached, Measure @ 50%  
VL = 0 V, VH = 5 V, 90% Reached, Measure @ 50%  
VL = 0 V, VH = 5 V, VDUT > 3.0 V p-p  
DYNAMIC PERFORMANCE, INHIBIT  
Delay Time, Active to Inhibit  
Delay Time, Inhibit to Active  
1.5  
1.5  
4.0  
3.5  
±1.0  
2.2  
ns  
ns  
ns  
ns  
Measured at 50%, VH = +2 V, VL = –2 V  
Measured at 50%, VH = +2 V, VL = –2 V  
Delay Time Matching (Z)  
Z = Delay Time Active to Inhibit Test (Above)—  
Delay Time Inhibit to Active Test (Above)  
(Of Worst Two Edges)  
I/O Spike  
Rise, Fall Time, Active to Inhibit  
Rise, Fall Time, Inhibit to Active  
<200  
3.5  
mV, p-p  
ns  
ns  
VH = 0 V, VL = 0 V  
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)  
VH = +2 V, VL = –2 V (Measured 20%/80% of 1 V Output)  
2.2  
DYNAMIC PERFORMANCE , VTERM  
Delay Time, VH to VTERM  
Delay Time, VL to VTERM  
Delay Time, VTERM to VH and VTERM to VL  
Overshoot and Preshoot  
3.0  
5.0  
4.0  
ns  
ns  
ns  
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V  
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V  
Measured at 50%, VL = VH = +0.4 V, VTERM = –0.4 V  
–3.0 + 75  
35  
+3.0 + 75 % of Step + mV VH/VL, VTERM = (+0.4 V, –0.4 V), (0.0 V, –2.0 V),  
(0.0 V, +7.0 V)  
4.0  
5.5  
VTERM Mode Rise Time  
VTERM Mode Fall Time  
PSRR, DRIVE or TERM Mode  
ns  
ns  
dB  
VL, VH = 0 V, VTERM = –2 V, 20%–80%  
VL, VH = 0 V, VTERM = –2 V, 20%–80%  
VS = VS ± 3%  
Specifications subject to change without notice.  
COMPARATOR SPECIFICATIONS  
(All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +12 V ؎ 3%, –VS = –7 V = ؎3% unless otherwise noted. All temperature coefficients are  
measured at TJ = +75؇C to +95؇C).  
Parameter  
Min  
Typ Max  
Units  
Test Conditions  
DC INPUT CHARACTERISTICS  
Offset Voltage (VOS  
Offset Voltage (Drift)  
HCOMP, LCOMP Bias Current  
Voltage Range (VCM  
)
–25  
25  
50  
mV  
µV/°C  
µA  
CMV = 0 V  
CMV = 0 V  
VIN = 0 V  
–50  
–3  
50  
8.0  
)
V
Differential Voltage (VDIFF  
Gain and Linearity  
)
9.0  
0.05  
V
–0.05  
% FSR  
VIN = –3 V to +8 V  
LATCH ENABLE INPUTS  
Logic “1” Current (IIH  
)
250  
µA  
µA  
LE, LE = –0.8 V  
LE, LE = –1.8 V  
Logic “0” Current (IIL  
)
–250  
DIGITAL OUTPUTS  
Logic “1” Voltage (VOH  
)
–0.98  
V
V
V/ns  
Q or Q, 50 to –2 V  
Q or Q, 50 to –2 V  
Logic “0” Voltage (VOL  
Slew Rate  
)
–1.5  
1
SWITCHING PERFORMANCE  
Propagation Delay  
Input to Output  
0.9  
2.5  
ns  
VIN = 2 V p-p,  
Latch Enable to Output  
Propagation Delay Temperature Coefficient  
Propagation Delay Change with Respect to  
Slew Rate: 0.5 V, 1.0 V, 3.0 V/ns  
Slew Rate: 5.0 V/ns  
Amplitude: 1.0 V, 3.0 V, 5.0 V  
Equivalent Input Rise Time  
Pulsewidth Linearity  
2
2
ns  
ps/°C  
HCOMP = +1 V, LCOMP = +1 V  
<±100  
<±350  
<±200  
450  
<±200  
<25  
ps  
ps  
ps  
ps  
ps  
ns  
VIN = 0 V to 5 V  
VIN = 0 V to 5 V  
VIN = 1.0 V/ns  
VIN = 0 V to 3 V, 3 V/ns  
VIN = 0 V to 3 V, 3 V/ns, PW = 3 ns–8 ns  
Settling to ±8 mV, VIN = 1 V to 0 V  
Settling Time  
Latch Timing  
Input Pulsewidth  
Setup Time  
Hold Time  
<1.5  
<1.0  
<1.0  
ns  
ns  
ns  
Specifications subject to change without notice.  
REV. 0  
–3–  
AD53032–SPECIFICATIONS  
ACTIVE LOAD SPECIFICATIONS  
(All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +12 V ؎ 3%, –VS = –7 V = ؎3% unless otherwise noted. All temperature coefficients are  
measured at TJ = +75؇C to +95؇C).  
Parameter  
Min  
Typ  
Max  
Units  
Test Conditions  
INPUT CHARACTERISTICS  
INH, INHL  
Input Voltage  
–2  
0
V
IOHC = +1 V, IOLC = +1 V, VCOM = +2 V, VDUT = 0 V  
Bias Current  
–250  
250  
µA  
INHL, INHL = –2 V, 0 V  
IOHC Current Program Range  
IOH = 0 mA to –35 mA  
IOLC Current Program Range  
IOL = 0 mA to +35 mA  
IOHC, IOLC Input Bias Current  
IOLRTN, IOHRTN Range  
VDUT Range  
VDUT Range, IOH = 0 mA to –35 mA  
VDUT Range, IOL = 0 mA to +35 mA  
VCOMI Input Range  
0
3.5  
V
VDUT = –1.7 V, +8 V  
0
–300  
–3  
–3  
–1.7  
–3  
3.5  
300  
8
8
8
V
µA  
V
V
V
VDUT = –3 V, +6.7 V  
IOLC = 0 V, +3.5 V and IOHC = 0 V, +3.5 V  
IOL = +35 mA, IOH = –35 mA, VDUT = –3 V, +8 V  
IOL = +35 mA, IOH = –35 mA, IVDUT–VCOMI >1.3 V  
VDUT –VCOM > 1.3 V  
VCOM–VDUT > 1.3 V  
IOL = +35 mA, IOH = –35 mA  
8
8
V
V
–3  
OUTPUT CHARACTERISTICS  
Accuracy  
Absolute Accuracy Error, Load Current  
–0.4 – 200  
+0.4 + 200 % ISET + µA IOL, IOH = 25 µA–35 mA, VCOM = 0 V, VDUT = ±2 V and  
IOL = 25 µA–35 mA, VCOM = +8 V, VDUT = +6.7 V and  
IOH = 25 µA–35 mA, VCOM = –3 V, VDUT = –1.7 V  
VCOM Buffer  
Offset Error  
Bias Current  
Gain Error  
Linearity Error  
Output Current TC  
–50  
–10  
–0.2  
–10  
50  
10  
0.2  
10  
mV  
µA  
%
mV  
µA/°C  
IOL, IOH = 35 mA, VCOMI = 0 V  
VCOMI = 0 V  
IOL, IOH = 35 mA, VCOMI = –2 V to +7 V  
IOL, IOH = 35 mA, VCOMI = –2 V to +7 V  
Measured at IOH, IOL = 200 µA  
1
<±2  
DYNAMIC PERFORMANCE  
Propagation Delay  
±IMAX to Inhibit  
Inhibit to ±IMAX  
Propagation Delay Matching  
I/O Spike  
Settling Time to 15 mV  
Settling Time to 4 mV  
0.8  
1.5  
–1.8  
1.5  
2.4  
2.5  
4.0  
1.8  
ns  
ns  
ns  
mV  
ns  
µs  
VCOM = ±3 V, IOL = +20 mA, IOH = –20 mA  
VCOM = ±3 V, IOL = +20 mA, IOH = 20 mA  
<250  
<50  
<10  
VCOM = 0 V, IOL = +20 mA, IOH = –20 mA  
IOL = +20 mA, IOH = –20 mA, 50 Load, to 15 mV  
IOL = +20 mA, IOH = –20 mA, 50 Load, to 4 mV  
Specifications subject to change without notice.  
TOTAL FUNCTION SPECIFICATIONS  
(All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +12 V ؎ 3%, –VS = –7 V = ؎3% unless otherwise noted. All temperature coefficients are  
measured at TJ = +75؇C to +95؇C).  
Parameter  
Min  
Typ  
Max  
Units  
Test Conditions  
OUTPUT CHARACTERISTICS  
Output Leakage Current, VOUT = –2 V to +7 V  
Output Leakage Current, VOUT = –3 V to +8 V  
Output Capacitance  
–500  
–2  
+500  
+2  
nA  
µA  
pF  
8
Driver and Load INHIBITED  
POWER SUPPLIES  
Total Supply Range  
Positive Supply  
19  
12  
–7  
V
V
V
Negative Supply  
Positive Supply Current  
Negative Supply Current  
Total Power Dissipation  
Temperature Sensor Gain Factor  
260  
270  
5.0  
mA  
mA  
W
Driver = INH, ILOAD Program = 35 mA, Load = Active  
Driver = INH, ILOAD Program = 35 mA, Load = Active  
Driver = INH, ILOAD Program = 35 mA, Load = Active  
RLOAD = 10 k, VSOURCE = +10 V  
1
µA/K  
NOTES  
Connecting or shorting the decoupling pins to ground will result in the destruction of the device.  
Specifications subject to change without notice.  
–4–  
REV. 0  
AD53032  
Table I. Driver Truth Table  
DATA  
DATA  
IOD  
IOD  
RLD  
RLD  
OUTPUT STATE  
0
1
X
X
1
0
X
X
1
1
0
0
0
0
1
1
X
X
0
X
X
1
VL  
VH  
INH  
VTERM  
1
0
Table II. Comparator Truth Table  
OUTPUT STATES  
VOUT  
>HCOMP  
>HCOMP  
<HCOMP  
<HCOMP  
X
LEH  
LEH  
LEL  
LEL  
QH  
QH  
QL  
QL  
>LCOMP  
<LCOMP  
>LCOMP  
<LCOMP  
X
1
1
1
1
0
0
0
0
0
1
1
1
1
1
0
0
0
0
0
1
1
1
0
0
0
0
1
1
1
0
1
0
0
1
0
1
QH (t-1) QH (t-1) QL (t-1)  
QL (t-1)  
Table III. Active Load Truth Table  
OUTPUT STATES (Including Diode Bridge)  
IOL  
VDUT  
INHL  
INHL  
IOH  
I(VOUT)  
<VCOM  
>VCOM  
X
0
0
1
1
1
0
V(IOHC) × 10 mA  
V(IOHC) × 10 mA  
0
V(IOLC) × 10 mA  
V(IOLC) × 10 mA  
0
IOL  
IOH  
0
REV. 0  
–5–  
AD53032  
ABSOLUTE MAXIMUM RATINGS1  
Environmental  
Operating Temperature (Junction) . . . . . . . . . . . . . .+175°C  
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C  
Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . .+260°C  
Power Supply Voltage  
+VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V  
–VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V  
+VS to –VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V  
PWR GND to ECL GND or HQ GND . . . . . . . . . . ±0.4 V  
Inputs  
NOTES  
1Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Absolute maximum limits apply  
individually, not in combination. Exposure to absolute maximum rating condi-  
tions for extended periods may affect device reliability.  
DATA, DATA, IOD, IOD, RLD, RLD . . . . . . +5 V, –3 V  
DATA to DATA, IOD to IOD, RLD to RLD . . . . . . . ±3 V  
LEL, LEL, LEH, LEH . . . . . . . . . . . . . . . . . . . +5 V, –3 V  
LEL to LEL, LEH to LEH . . . . . . . . . . . . . . . . . . . . . ±3 V  
INHL, INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . +5 V, –3 V  
INHL to INHL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±3 V  
VH, VL, VTERM, VCOM_I to GND . . . . . . . . +9 V, –4 V  
VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±11 V  
(VH–VTERM) and (VTERM – VL) . . . . . . . . . . . . . ±11 V  
IOHC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±6 V  
IOLC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±6 V  
HCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V  
LCOMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V  
HCOMP, LCOMP to VOUT . . . . . . . . . . . . . . . . . . . ±11 V  
Outputs  
2Output short circuit protection is guaranteed as long as proper heatsinking is  
employed to ensure compliance with the operating temperature limits.  
3To ensure lead coplanarity (± 0.002 inches) and solderability, handling with bare  
hands should be avoided and the device should be stored in environments at 24°C  
± 5°C (75°F ± 10°F) with relative humidity not to exceed 65%.  
Table IV. Package Thermal Characteristics  
Air Flow, FM  
JA, ؇C/W  
0
200  
400  
33  
25  
22  
VOUT Short Circuit Duration . . . . . . . . . . . . . . . .Indefinite2  
VOUT Inhibit Mode . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V  
VHDCPL . . . . . . . .Do Not Connect Except for Cap to VCC  
VLDCPL . . . . . . . . Do Not Connect Except for Cap to VEE  
QH, QH, QL, QL Maximum IOUT  
Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA  
Surge . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .100 mA  
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V  
IOHRTN, IOLRTN . . . . . . . . . . . . . . . . . . +8.5 V, –3.5 V  
VCOM_S Short Circuit Duration . . . . . . . . . . . . . . . 3 sec2  
ORDERING GUIDE  
Shipment Method  
Package  
Description  
Quantity per  
Shipping Container  
Package  
Option  
Model  
AD53032JSTP  
52-Lead LQFP-EDQUAD  
90  
SQ-52  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD53032 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
–6–  
REV. 0  
AD53032  
PIN CONFIGURATION  
52 51 50 49 48 47 46 45 44 43 42 41 40  
39  
38  
37  
V
1
2
V
EE  
CC  
PIN 1  
IDENTIFIER  
DATA  
ECLGND  
DATA  
3
QL  
36 INHL  
4
QL  
35  
INHL  
5
ECLGND  
34  
V
6
QH  
AD53032  
HEAT SINK UP  
(Not to Scale)  
CC  
33 PWRGND  
7
QH  
ECLGND  
PWRGND  
32  
V
8
EE  
31  
V
L
9
30  
29  
28  
27  
IOLC  
10  
11  
12  
13  
LEL  
LEL  
IOHC  
HQGND  
LEH  
LEH  
IOHRTN  
14 15 16 17 18 19 20 21 22 23 24 25 26  
NC = NO CONNECT  
REV. 0  
–7–  
AD53032  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
52-Lead LQFP–EDQUAD with Integral Heat Slug  
(SQ-52)  
0.063 (1.60)  
MAX  
0.630 (16.00) SQ  
0.551 (14.00) SQ  
0.030 (0.75)  
0.024 (0.60)  
0.018 (0.45)  
52  
40  
39  
1
SEATING  
PLANE  
0.270  
(6.86)  
DIA  
TOP VIEW  
(PINS DOWN)  
STANDOFF  
0.004 (0.10)  
MAX  
27  
13  
14  
26  
0.057 (1.45)  
0.055 (1.40)  
0.053 (1.35)  
0.006 (0.15)  
0.002 (0.05)  
7؇  
3.5؇  
0؇  
0.008 (0.20)  
0.004 (0.09)  
0.039 (1.00)  
BSC  
0.020 (0.50)  
0.017 (0.42)  
0.014 (0.35)  
CENTER FIGURES ARE TYPICAL UNLESS OTHERWISE NOTED  
–8–  
REV. 0  
配单直通车
AD53032JSTP产品参数
型号:AD53032JSTP
是否无铅:含铅
是否Rohs认证:不符合
生命周期:Active
IHS 制造商:ROCHESTER ELECTRONICS LLC
零件包装代码:QFP
包装说明:LQFP-52
针数:52
Reach Compliance Code:unknown
风险等级:5.64
Is Samacsys:N
差分输出:NO
驱动器位数:1
输入特性:DIFFERENTIAL
接口集成电路类型:LINE DRIVER
接口标准:GENERAL PURPOSE
JESD-30 代码:S-XQFP-G52
JESD-609代码:e0
长度:14 mm
湿度敏感等级:3
标称负供电电压:-7 V
功能数量:1
端子数量:52
封装主体材料:UNSPECIFIED
封装代码:HLQFP
封装形状:SQUARE
封装形式:FLATPACK, HEAT SINK/SLUG, LOW PROFILE
峰值回流温度(摄氏度):240
认证状态:COMMERCIAL
座面最大高度:1.6 mm
最大供电电压:12.36 V
最小供电电压:11.64 V
标称供电电压:12 V
表面贴装:YES
端子面层:TIN LEAD
端子形式:GULL WING
端子节距:1 mm
端子位置:QUAD
处于峰值回流温度下的最长时间:30
最大传输延迟:2.1 ns
宽度:14 mm
Base Number Matches:1
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