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  • FDS89161LZ图
  • 深圳市拓亿芯电子有限公司

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  • 深圳市芯脉实业有限公司

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  • 深圳市芯柏然科技有限公司

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  • 深圳市得捷芯城科技有限公司

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  • 深圳市捷立辉科技有限公司

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  • 深圳市炎凯科技有限公司

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产品型号FDS89161LZ的概述

FDS89161LZ芯片概述 FDS89161LZ是一款高度集成的N沟道MOSFET,广泛应用于开关电源、负载开关以及其他电源管理的应用场合。该芯片的设计旨在优化能够和效率,特别是针对需要高频操作和快速开关能力的场合。该芯片的特性使其在移动设备、计算机、家电和汽车电子等领域中的使用变得尤为重要。 FDS89161LZ的主要特点是在低导通电阻下提供高电流能力,使其在提高效率的同时降低了功耗。此外,该系列芯片的驱动电压范围合理,有利于降低操作复杂性。通过对电路设计者而言,FDS89161LZ可以较为容易地进行集成,从而简化整个系统的布局和设计。 详细参数 电气特性 - V_DS(绝对最大额定值): 30V - I_D(最大连续漏电流): 63A - R_DS(on)(导通电阻): 10mΩ @ V_GS = 10V - V_GS(栅源电压范围): -20V至+20V - 输入电容C_is...

产品型号FDS89161LZ的Datasheet PDF文件预览

June 2011  
FDS89161LZ  
Dual N-Channel PowerTrench® MOSFET  
100 V, 2.7 A, 105 mΩ  
Features  
General Description  
„ Max rDS(on) = 105 mΩ at VGS = 10 V, ID = 2.7 A  
This N-Channel logic Level MOSFETs are produced using  
Fairchild Semiconductor‘s advanced Power Trench® process  
that has been special tailored to minimize the on-state  
resisitance and yet maintain superior switching performance.  
„ Max rDS(on) = 160 mΩ at VGS = 4.5 V, ID = 2.1 A  
„ High performance trench technology for extremely low rDS(on)  
G-S zener has been added to enhance ESD voltage level.  
„ High power and current handling capability in a widely used  
surface mount package  
Application  
„ CDM ESD protection level > 2KV typical (Note 4)  
„ 100% UIL Tested  
„ DC-DC conversion  
„ RoHS Compliant  
D2  
D2  
G2  
S2  
G1  
S1  
D2  
D2  
D1  
D1  
D1  
D1  
5
6
7
8
4
3
2
1
Q2  
Q1  
G2  
S2  
G1  
S1  
Pin 1  
SO-8  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Pulsed  
100  
V
V
±20  
2.7  
ID  
A
mJ  
W
15  
EAS  
PD  
Single Pulse Avalanche Energy  
Power Dissipation  
(Note 3)  
13  
31  
TC = 25 °C  
TA = 25 °C  
Power Dissipation  
(Note1a)  
1.6  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
(Note 1)  
4.0  
78  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
12 mm  
Quantity  
FDS89161LZ  
FDS89161LZ  
SO-8  
2500 units  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
1
www.fairchildsemi.com  
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
100  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, referenced to 25 °C  
68  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 80 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
1
μA  
μA  
±10  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
1
1.7  
-6  
2.2  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 μA, referenced to 25 °C  
mV/°C  
V
GS = 10 V, ID = 2.7 A  
81  
110  
140  
7.8  
105  
160  
182  
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
VGS = 4.5 V, ID = 2.1 A  
mΩ  
VGS = 10 V, ID = 2.7 A, TJ = 125 °C  
VDS = 10 V, ID = 2.7 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
227  
44  
3
302  
58  
4
pF  
pF  
pF  
Ω
VDS = 50 V, VGS = 0 V,  
f = 1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
0.9  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
3.8  
1.2  
9.5  
1.6  
3.8  
2.1  
0.7  
0.7  
10  
10  
ns  
ns  
VDD = 50 V, ID = 2.7 A,  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
17  
ns  
10  
ns  
Qg(TOT)  
Qg(TOT)  
Qgs  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 5 V  
5.3  
2.9  
nC  
nC  
nC  
nC  
VDD = 50 V,  
D = 2.7 A  
I
Qgd  
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 2.7 A  
(Note 2)  
(Note 2)  
0.8  
0.8  
31  
1.3  
1.2  
56  
VSD  
Source to Drain Diode Forward Voltage  
V
VGS = 0 V, IS = 2 A  
trr  
Reverse Recovery Time  
ns  
IF = 2.7 A, di/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
20  
36  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined by  
θCA  
θJA  
θJC  
the user's board design.  
a) 78°C/W when  
mounted on a 1 in  
pad of 2 oz copper  
b) 135°C/W when  
mounted on a  
minimun pad  
2
2. Pulse Test: Pulse Width < 300μs, Duty cycle < 2.0%.  
3. Starting TJ = 25 °C, L = 0.3 mH, IAS =25 A, VDD = 27 V, VGS = 10V.  
4. The diode connected between gate and source serves only as protection against ESD. No gate overvoltage rating is implied.  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
2
www.fairchildsemi.com  
Typical Characteristics ( N-Channel) TJ = 25°C unless otherwise noted  
15  
12  
9
4
3
2
1
0
VGS = 10 V  
VGS = 3.5 V  
VGS = 8 V  
VGS = 6 V  
VGS =5 V  
VGS = 4 V  
VGS = 4 V  
VGS = 5 V  
VGS = 6 V  
6
VGS = 3.5 V  
VGS = 10 V  
VGS = 8 V  
3
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
0
0
1
2
3
4
5
0
3
6
9
12  
15  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
500  
2.0  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
ID = 2.7 A  
ID = 2.7 A  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
VGS = 10 V  
400  
300  
200  
100  
0
TJ = 125 o  
C
TJ = 25 o  
C
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
F ig u re 3. No rmal i zed O n-Re si stan ce  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
15  
20  
VGS = 0 V  
10  
12  
9
TJ = 150 o  
C
1
TJ = 25 oC  
VDS = 50 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
0.1  
6
TJ = 150 oC  
TJ = 25 oC  
2
0.01  
TJ = -55 oC  
3
TJ = -55 oC  
0.001  
0
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0
4
6
8
10  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
3
www.fairchildsemi.com  
Typical Characteristics ( N-Channel) TJ = 25°C unless otherwise noted  
10  
8
400  
100  
VDD = 25 V  
ID = 2.7 A  
Ciss  
VDD = 50 V  
6
Coss  
VDD = 75 V  
4
10  
1
2
f = 1 MHz  
= 0 V  
Crss  
V
GS  
0
0
1
2
3
4
5
0.1  
1
10  
100  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
4
3.0  
3
2
1
0
2.5  
2.0  
1.5  
1.0  
VGS = 10 V  
TJ = 25 o  
C
TJ = 100 o  
C
VGS = 6 V  
RθJA = 78 oC/W  
TJ = 125 oC  
25  
50  
75  
100  
125  
150  
0.01  
0.1  
tAV, TIME IN AVALANCHE (ms)  
1
2
TA, Ambient TEMPERATURE (oC)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Ambient Temperature  
10-1  
10-2  
10-3  
10-4  
10-5  
10-6  
10-7  
10-8  
10-9  
20  
10  
VDS = 0 V  
100 us  
1
1 ms  
TJ = 125 oC  
THIS AREA IS  
LIMITED BY rDS(on)  
10 ms  
100 ms  
TJ = 25 o  
C
0.1  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 135 oC/W  
1 s  
10 s  
0.01  
T
A = 25 oC  
DC  
0.005  
0.1  
1
10  
100  
400  
0
5
10  
15  
20  
25  
30  
35  
VDS, DRAIN to SOURCE VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 11. Gate Leakage Current vs  
Gate to Source Voltage  
Figure12. Forward Bias Safe  
Operating Area  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
4
www.fairchildsemi.com  
Typical Characteristics ( N-Channel) TJ = 25°C unless otherwise noted  
1000  
100  
10  
SINGLE PULSE  
RθJA = 135 oC/W  
TA = 25 o  
C
1
0.5  
10-4  
10-3  
10-2  
10-1  
1
10  
102  
103  
t, PULSE WIDTH (sec)  
Figure 13. Single Pulse Maximum Power Dissipation  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.01  
P
DM  
0.1  
0.05  
0.02  
0.01  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
SINGLE PULSE  
RθJA = 135 oC/W  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
θJA A  
DM  
θJA  
0.001  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 14. Junction-to-Ambient Transient Thermal Response Curve  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
5
www.fairchildsemi.com  
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Definition of Terms  
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Datasheet contains the design specifications for product development. Specifications  
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Rev. I54  
www.fairchildsemi.com  
©2011 Fairchild Semiconductor Corporation  
FDS89161LZ Rev. C4  
6
Mouser Electronics  
Authorized Distributor  
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FDS89161LZ  
配单直通车
FDS89161LZ产品参数
型号:FDS89161LZ
Brand Name:Fairchild Semiconductor
是否无铅: 不含铅
是否Rohs认证: 符合
生命周期:Transferred
零件包装代码:SOIC
包装说明:SMALL OUTLINE, R-PDSO-G8
针数:8
制造商包装代码:8LD, JEDEC MS-012, .150"NARROW BODY
Reach Compliance Code:compliant
ECCN代码:EAR99
HTS代码:8541.29.00.95
风险等级:5.71
Is Samacsys:N
其他特性:ULTRA-LOW RESISTANCE
雪崩能效等级(Eas):13 mJ
配置:SEPARATE, 2 ELEMENTS WITH BUILT-IN DIODE
最小漏源击穿电压:100 V
最大漏极电流 (Abs) (ID):2.7 A
最大漏极电流 (ID):2.7 A
最大漏源导通电阻:0.105 Ω
FET 技术:METAL-OXIDE SEMICONDUCTOR
JESD-30 代码:R-PDSO-G8
JESD-609代码:e3
湿度敏感等级:1
元件数量:2
端子数量:8
工作模式:ENHANCEMENT MODE
最高工作温度:150 °C
封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR
封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):260
极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):31 W
最大脉冲漏极电流 (IDM):15 A
子类别:FET General Purpose Power
表面贴装:YES
端子面层:Matte Tin (Sn)
端子形式:GULL WING
端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING
晶体管元件材料:SILICON
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