欢迎访问ic37.com |
会员登录 免费注册
发布采购
所在地: 型号: 精确
  • 批量询价
  •  
  • 供应商
  • 型号
  • 数量
  • 厂商
  • 封装
  • 批号
  • 交易说明
  • 询价
  •  
  • 北京元坤伟业科技有限公司

         该会员已使用本站17年以上

  • GCG1555C1H9R7BA01D
  • 数量-
  • 厂家-
  • 封装-
  • 批号-
  • -
  • QQ:857273081QQ:857273081 复制
    QQ:1594462451QQ:1594462451 复制
  • 010-62104931、62106431、62104891、62104791 QQ:857273081QQ:1594462451
更多
  • GCG1555C1H9R7BA01D图
  • 深圳市振兴时代电子有限公司

     该会员已使用本站5年以上
  • GCG1555C1H9R7BA01D
  • 数量900000 
  • 厂家村田 
  • 封装SMD 
  • 批号23+ 
  • 专营贴片电容 全新原装进口现货
  • QQ:3003801364QQ:3003801364 复制
  • 0755-82570370 QQ:3003801364

产品型号GCG1555C1H9R7CA01#的Datasheet PDF文件预览

Chip Monolithic Ceramic Capacitor for Automotive limited to Conductive Glue Mounting  
GCG1555C1H9R7CA01_ (0402, C0G:EIA, 9.7pF, DC50V)  
_: packaging code  
Reference Sheet  
1.Scope  
This product specification is applied to Chip Monolithic Ceramic Capacitor limited to Conductive Glue Mounting Type used for Automotive Electronic equipment with  
conductive glue mounting.  
ꢀꢀ  
2.MURATA Part NO. System  
(Ex.)  
GCG  
15  
5
5C  
1H  
9R7  
C
A01  
D
(2)T  
Dimensions  
(1)L/W  
Dimensions  
(4)Rated  
Voltage  
(3)Temperature  
Characteristics  
(6)Capacitance  
Tolerance  
(7)Murata’s Control  
(5)Nominal  
Capacitance  
(8)Packaging Code  
Code  
3. Type & Dimensions  
(Unit:mm)  
(1)-1 L  
1.0±0.1  
(1)-2 W  
0.5±0.05  
(2) T  
0.5±0.05  
e
g
0.15 to 0.35  
0.3 min.  
4.Rated value  
(3) Temperature Characteristics  
(Public STD Code):C0G(EIA)  
Specifications and Test  
Methods  
(4)  
Rated  
Voltage  
(6)  
(5) Nominal  
Capacitance  
Capacitance  
Tolerance  
(Operating  
Temp. Range)  
Temp. coeff  
orCap. Change  
Temp. Range  
(Ref.Temp.)  
25 to 125 °C  
(25 °C)  
DC 50 V  
9.7 pF  
±0.25 pF  
0±30 ppm/°C  
-55 to 125 °C  
5.Package  
mark  
(8) Packaging  
Packaging Unit  
f180mm Reel  
PAPER W8P2  
f180mm Reel  
PAPER W8P1  
f330mm Reel  
PAPER W8P2  
D
10000 pcs./Reel  
20000 pcs./Reel  
50000 pcs./Reel  
W
J
Product specifications in this catalog are as of Apr.15,2016,and are subject to change or obsolescence without notice.  
Please consult the approval sheet before ordering.  
Please read rating and !Cautions first.  
GCG1555C1H9R7CA01-01  
1
AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
No  
AEC-Q200 Test Item  
AEC-Q200 Test Method  
High Dielectric Type  
Temperature  
Compensating Type  
Pre-and Post-Stress  
Electrical Test  
1
2
-
High Temperature  
Exposure (Storage)  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16.  
Appearance No marking defects  
Capacitance Within ±2.5% or ±0.25pF  
Set the capacitor for 1000±12 hours at 150±3. Set for  
24±2 hours at room temperature, then measure.  
R7/L8/R9:Within ±12.5%  
Change  
Q/D.F.  
(Whichever is larger)  
30pFmin. : Q1000  
R7/L8 : 0.05 max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
I.R.  
More than 10,000MΩ or 500ΩF  
R9 : More than 3,000MΩ or 150 ΩF  
(Whichever is smaller)  
3
Temperature Cycling  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16. Perform the 1000 cycles  
according to the four heat treatments listed in the following table.  
Set for 24±2 hours at room temperature, then measure  
Appearance No marking defects  
Capacitance Within ±2.5% or ±0.25pF  
R7/L8/R9: Within ±10.0%  
Step  
1
2
3
4
Change  
Q/D.F.  
(Whichever is larger)  
Temp.  
(C)  
Room  
Temp.  
125+3/-0(for C/R7)  
150+3/-0(for 5G/L8/R9)  
Room  
Temp.  
30pFmin.: Q 1000  
R7/L8 W.V.: 25Vmin.: 0.03 max.  
ꢀꢀꢀꢀꢀW.V.: 16V : 0.05 max  
R9 : 0.075max.  
-55+0/-3  
30pFmax.: Q 400+20C  
C: Nominal Capacitance (pF)  
Time  
153  
1
1
153  
(min.)  
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
Initial measurement for high dielectric constant type  
Perform a heat treatment at 150+0/-10 for one hour and then set  
for 24±2 hours at room temperature.  
Perform the initial measurement.  
4
5
Destructive  
No defects or abnormalities  
Per EIA-469.  
Physical Analysis  
Moisture Resistance  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16.  
Apply the 24-hour heat (25 to 65) and humidity (80 to 98%)  
treatment shown below, 10 consecutive times.  
Set for 24±2 hours at room temperature, then measure.  
Appearance No marking defects  
Capacitance Within ±3.0% or ±0.30pF  
Humidity  
8098%  
Humidity  
8098%  
R7/L8/R9: Within ±12.5%  
R7/L8 : 0.05 max.  
R9 : 0.075max.  
Temperature  
Humidity  
9098%  
Humidity  
9098%  
Humidity  
9098%  
()  
Change  
Q/D.F.  
(Whichever is larger)  
70  
65  
60  
55  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
30pFmin. : Q350  
10pF and over, 30pF and below:  
Q275+5C/2  
10pFmax.: Q 200+10C  
C: Nominal Capacitance(pF)  
I.R.  
More than 10,000MΩ or 500Ω F  
+10  
- 2 ℃  
R9 : More than 3,000MΩ or 150 ΩF  
Initial measuremt  
0
-5  
(Whichever is smaller)  
-10  
One cycle 24hours  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24  
Hours  
6
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Biased Humidity  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16.  
Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister)  
Appearance No marking defects  
at 85±3and 80 to 85% humidity for 1000±12 hours.  
Remove and set for 24±2 hours at room temperature, then measure.  
The charge/discharge current is less than 50mA.  
Capacitance Within ±3.0% or ±0.30pF  
R7/L8/R9: Within ±12.5%  
Change  
(Whichever is larger)  
Q/D.F.  
I.R.  
30pF and over: Q200  
R7/L8 : 0.05 max.  
R9 : 0.075max.  
30pF and below: Q100+10C/3  
C: Nominal Capacitance(pF)  
More than 1,000MΩ or 50Ω F  
(Whichever is smaller)  
JEMCGS-01499C  
2
AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
High Dielectric Type  
No  
7
AEC-Q200 Test Item  
Operational Life  
AEC-Q200 Test Method  
Temperature  
Compensating Type  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16.  
Appearance  
Capacitance  
Change  
No marking defects  
Apply 200% of the rated voltage for 1000±12 hours at 125±3(for  
Δ C/R7), 150±3(for 5G/L8/R9).  
Within ±3.0% or ±0.30pF  
(Whichever is larger)  
30pFmin. : Q350  
R7/L8/R9: Within ±12.5%  
R7/L8 : 0.05 max.  
Set for 24±2 hours at room temperature, then measure.  
The charge/discharge current is less than 50mA.  
Q/D.F.  
10pF and over, 30pF and below: R9 : 0.075max.  
Q275+5C/2  
Initial measurement for high dielectric constant type.  
Apply 200% of the rated DC voltage for one hour at the maximum  
operating temperature ±3. Remove and set for 24±2 hours at  
room temperature. Perform initial measurement.  
10pFmax.: Q 200+10C  
C: Nominal Capacitance(pF)  
More than 1,000MΩ or 50Ω F  
(Whichever is smaller)  
I.R.  
8
9
External Visual  
No defects or abnormalities  
Visual inspection  
Using calipers  
Physical Dimension  
Within the specified dimensions  
10 Resistance to Appearance  
No marking defects  
Per MIL-STD-202 Method 215  
Solvents  
Capacitance  
Within the specified tolerance  
Solvent 1 : 1 part (by volume) of isopropyl alcohol  
3 parts (by volume) of mineral spirits  
Change  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V : 0.035 max.  
R9 : 0.075max.  
Solvent 2 : Terpene defluxer  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
Solvent 3 : 42 parts (by volume) of water  
1part (by volume) of propylene glycol monomethyl ether  
1 part (by volume) of monoethanolamine  
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
11 Mechanical  
Shock  
Appearance  
Capacitance  
Change  
No marking defects  
Fix the capacitor to the test jig in the same manner and under the  
same conditions as No.16.Three shocks in each direction should be  
applied along 3 mutually perpendicular axes of the test specimen  
(18 shocks).  
Within the specified tolerance  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V : 0.035 max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
The specified test pulse should be Half-sine and should have a  
duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.  
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
12 Vibration  
Appearance  
Capacitance  
Change  
No defects or abnormalities  
Within the specified tolerance  
Fix the capacitor to the test jig in the same manner and under the  
same conditions as No.16. The capacitor should be subjected to a  
simple harmonic motion having a total amplitude of 1.5mm, the  
frequency being varied uniformly between the approximate limits of  
10 and 2000Hz. The frequency range, from 10 to 2000Hz and  
return to 10Hz, should be traversed in approximately 20 minutes.  
This motion should be applied for 12 cycle in each 3 mutually  
perpendicular directions  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V : 0.035 max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
13 Thermal Shock  
The measured and observed characteristics should satisfy the  
specifications in the following table.  
Fix the capacitor to the supporting jig in the same manner and  
under the same conditions as No.16. Perform the 300 cycles  
according to the two heat treatments listed in the following  
table(Maximum transfer time is 20 seconds). Set for 24±2 hours at  
room temperature, then measure  
Appearance  
Capacitance  
Change  
No marking defects  
Within ±2.5% or ±0.25pF  
(Whichever is larger)  
R7/L8/R9: Within ±10.0%  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
GCG21BL81H104K: 0.03 max.  
W.V.: 16V : 0.035 max.  
Step  
1
2
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
125+3/-0(forΔC/R7)  
150+3/-0for 5G/L8/R9)  
Temp.(℃)  
-55+0/-3  
Time  
(min.)  
R9 : 0.075max  
15±3  
15±3  
I.R.  
More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
Initial measurement for high dielectric constant type  
Perform a heat treatment at 150+0/-10 ℃ꢀfor one hour and then set  
for 24±2 hours at room temperature.  
Perform the initial measurement.  
JEMCGS-01499C  
3
AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
No  
AEC-Q200 Test Item  
AEC-Q200 Test Method  
High Dielectric Type  
Temperature  
Compensating Type  
14 ESD  
Appearance  
Capacitance  
Change  
No marking defects  
Per AEC-Q200-002  
Within the specified tolerance  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V :0.035 max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
I.R.  
More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
15 Electrical Appearance  
Chatacteri- Capacitance  
No defects or abnormalities  
Within the specified tolerance  
Visual inspection.  
The capacitance/Q/D.F. should be measured at 25at the  
frequency and voltage shown in the table.  
zation  
Change  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V : 0.035 max.  
R9 : 0.075max.  
Char.  
ΔC,5G  
(more than 1000pF)  
R7,R9,L8(C10μF)  
ΔC,5G  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
(1000 pF and below)  
Item  
Frequency  
Voltage  
1±0.1MHz  
1±0.1kHz  
0.5 to 5Vrms  
1±0.2Vrms  
The insulation resistance should be measured with a DC voltage not  
exceeding the rated voltage at 25and 125(for Δ C/R7)/ 150℃  
for 5G/L8/R9within 2 minutes of charging.  
I.R.25℃  
More than 100,000MΩ or 1000ΩF More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
I.R.125℃  
I.R.150℃  
More than 10,000MΩ or 100ΩF  
More than 1,000MΩ or 10ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
More than 10,000MΩ or 100ΩF  
More than 1,000MΩ or 1ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
No failure should be observed when 250% of the rated voltage is  
applied between the terminations for 1 to 5 seconds, provided the  
charge/ discharge current is less than 50mA.  
Dielectric  
Strength  
No failure  
16 Terminal  
Strength  
Appearance  
No marking defects  
Mount the capacitor on the test jig in Fig.1 using a conductive glue  
(HEREAUS"PC3000").  
Capacitance  
Change  
Within specified tolerance  
The conductive glue is hardened at 140for 30minites.  
Then apply *shear tension in parallel with the test jig for 60sec.  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V: 0.035max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
*Show in the table 1  
Alumina  
Ag Pd electrode  
c
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
b
a
Type  
GCG15  
GCG18  
GCG21  
GCG31  
GCG32  
Share Tension  
2.0N  
2.7N  
4.9N  
6.9N  
12.6N  
Type  
GCG15  
GCG18  
GCG21  
GCG31  
GCG32  
a
b
c
0.4  
1.0  
1.2  
2.2  
2.2  
1.5  
3.0  
4.0  
5.0  
5.0  
0.5  
1.2  
1.65  
Table.1  
2.0  
2.9  
Fig.1  
in mm)  
JEMCGS-01499C  
4
AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
No  
AEC-Q200 Test Item  
AEC-Q200 Test Method  
High Dielectric Type  
Temperature  
Compensating Type  
17 Beam Load Test  
Destruction value should be exceed following one.  
< Chip L dimension : 2.5mm max. >  
Place the capacitor in the beam load fixture as Fig 2.  
Apply a force.  
< Chip Length : 2.5mm max. >  
Chip thickness > 0.5mm rank : 20N  
Chip thickness 0.5mm rank : 8N  
< Chip L dimension : 3.2mm mim. >  
Iron Board  
Chip thickness < 1.25mm rank : 15N  
Chip thickness 1.25mm rank : 54.5N  
< Chip Length : 3.2mm min. >  
L
0.6L  
Fig.2  
Speed supplied the Stress Load : 0.5mm / sec.  
18 Capacitance  
Temperature  
Capacitance  
Change  
Within the specified tolerance.  
(Table A)  
R7 : Within ±15%  
(-55to +125)  
L8 : Within ±15%  
(-55to +125)  
ꢀꢀꢀWithin +15/-40%  
(+125to +150)  
R9 : Within ±15%  
(-55to +150)  
The capacitance change should be measured after 5 min. at  
each specified temperature stage.  
Characteristics  
(1)Temperature Compensating Type  
The temperature coefficient is determined using the capacitance  
measured in step 3 as a reference. When cycling the temperature  
sequentially from step1 through 5 (Δ C: +25to +125,  
5G:+25to +150other temp. coifficient.:+25to +85) the  
capacitance should be within the specified tolerance for the  
temperature coefficient and capacitance change as Table A-1. The  
capacitance drift is calculated by dividing the differences  
between the maximum and minimum measured values in the step  
1,3 and 5 by the cap value in step 3.  
Temperature  
Coefficient  
Within the specified tolerance.  
(Table A)  
Step  
1
Temperature.(C)  
25±2  
2
3
4
5
-55±3(for ΔC to R7)  
25±2  
125±3for ΔC/R7, 150±3for 5G/R9/L8)  
25±2  
Within ±0.2% or ±0.05 pF  
Capacitance  
Drift  
(Whichever is larger.)  
(2) High Dielectric Constant Type  
The ranges of capacitance change compared with the above 25℃  
value over the temperature ranges shown in the table should be  
within the specified ranges.  
Initial measurement for high dielectric constant type.  
Perform a heat treatment at 150+0/-10for one hour  
and then set for 24±2 hours at room temperature.  
Perform the initial measurement.  
Table A  
Char.  
Capacitance Change from 25C (%)  
-30  
Nominal Values  
(ppm/C)  
-55  
-10  
Max.  
0.58  
Min.  
-0.24  
Max.  
0.40  
Min.  
-0.17  
Max.  
0.25  
Min.  
-0.11  
5C/5G  
0± 30  
Note1: Nominalvaluesdenotethetemperaturecoefficientwithinarangeof 25Cto125C(forC)/ 150C(for5G).  
JEMCGS-01499C  
5
Package  
GCG Type  
1.Tape Carrier Packaging(Packaging Code:D/E/W/F/L/J/K)  
1.1 Minimum Quantity(pcs./reel)  
φ180mm reel  
Paper Tape  
φ330mm reel  
Plastic Tape Paper Tape Plastic Tape  
Type  
Code:D/E  
Code:W  
20000  
(W8P1)  
Code:L  
Code:J/ F  
50000  
(W8P2)  
10000  
Code:K  
10000  
(W8P2)  
4000  
GCG15 5  
GCG18 8  
6
4000  
10000  
GCG21  
9
4000  
10000  
B
M
C
D
E
3000  
3000  
2000  
1000  
1000  
10000  
10000  
6000  
4000  
4000  
GCG31  
GCG32  
1.2 Dimensions of Tape  
(in:mm)  
(1)GCG15(W8P2 CODE:D/E/J/F)<Paper Tape>  
*1,22.0±0.05  
4.0±0.1  
+0.1  
-0  
*1  
*2  
φ1.5  
0.05 max.  
Dimensions  
t
Type  
Tolerance(Chip)  
A *3  
0.65  
B *3  
1.15  
L
W
GCG15  
5
±0.1  
±0.05  
0.8 max.  
*3 Nominal value  
(in:mm)  
(2)GCG15(W8P1 CODE:W)<Paper Tape>  
4.0±0.1  
1.0±0.05  
+0.1  
-0  
φ1.5  
1.0±0.05  
t
Dimensions  
Type  
A *3  
0.65  
B *3  
1.15  
L
W
GCG15  
5
±0.1  
±0.05  
0.8 max.  
*3 Nominal value  
JEMCGP-04125  
6
Package  
GCG Type  
(3)GCG18/21<Paper Tape>  
(in:mm)  
4.0±0.1  
4.0±0.1  
2.0±0.1  
+0.1  
-0  
φ1.5  
t
Dimensions  
Tolerance(Chip)  
TDimensions  
(Chip)  
Type  
A
B
t
L
W
GCG18  
±0.2  
±0.1  
0.8±0.1  
0.6±0.1  
0.85±0.1  
1.05±0.10  
1.55±0.15  
1.85±0.10  
2.30±0.15  
8
6
9
1.1max.  
GCG21  
±0.3  
±0.2  
(4)GCG21/31/32 <Plastic Tape>  
4.0±0.1  
4.0±0.1  
2.0±0.1  
0.25±0.1(T1.8mm)  
0.3±0.1(T2.5mm)  
+0.1  
φ1.5  
-0  
t
Dimensions  
Tolerance(Chip)  
T Dimensions  
(Chip)  
Type  
A
B
t
L
W
GCG21  
GCG31  
±0.3  
±0.2  
1.25±0.2  
1.15±0.2  
1.6±0.3  
2.0±0.3  
2.5±0.3  
1.45±0.20 2.25±0.20  
1.90±0.20 3.50±0.20  
2.0 max.  
1.7 max.  
2.5 max.  
3.0 max.  
3.7 max.  
B
M
C
D
E
±0.3  
±0.4  
±0.3  
±0.3  
GCG32  
2.80±0.20 3.50±0.20  
JEMCGP-04125  
7
Package  
GCG Type  
Fig.1 Package Chips  
(in:mm)  
Chip  
Fig.2 Dimensions of Reel  
2.0±0.5  
φ21±0.8  
1  
W
W
w1  
10±1.5  
Fig.3 Taping Diagram  
GCG32 max.  
16.5 max.  
Top Tape : Thickness 0.06  
Feeding Hole :As specified in 1.2.  
Hole for Chip : As specified in 1.2.  
Bottom Tape :Thickness 0.05  
(Only a bottom tape existence )  
Base Tape : As specified in 1.2.  
JEMCGP-04125  
8
Package  
GCG Type  
1.3 Tapes for capacitors are wound clockwise shown in Fig.3.  
(The sprocket holes are to the right as the tape is pulled toward the user.)  
1.4 Part of the leader and part of the vacant section are attached as follows.  
Tail vacant Section  
Chip-mounting Unit Leader vacant Section  
(in:mm)  
Leader Unit  
(Top Tape only)  
Direction  
of Feed  
160 min.  
190 min.  
210 min.  
1.5 Accumulate pitch : 10 of sprocket holes pitch = 40±0.3mm  
1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.  
1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.  
1.8 There are no jointing for top tape and bottom tape.  
1.9 There are no fuzz in the cavity.  
1.10 Break down force of top tape : 5N min.  
Break down force of bottom tape : 5N min. (Only a bottom tape existence )  
1.11 Reel is made by resin and appeaser and dimension is shown in Fig 2.  
There are possibly to change the material and dimension due to some impairment.  
1.12 Peeling off force : 0.1N to 0.6N in the direction as shown below.  
Top tape  
165180°  
1.13 Label that show the customer parts number, our parts number, our company name, inspection  
number and quantity, will be put in outside of reel.  
JEMCGP-04125  
9
! Caution  
Limitation of Applications  
Please contact us before using our products for the applications listed below which require especially high reliability  
for the prevention of defects which might directly cause damage to the third party's life, body or property.  
ꢀꢀꢀ①Aircraft equipment Aerospace equipment Undersea equipment Power plant control equipment  
ꢀꢀꢀ⑤Medical equipment Transportation equipment(vehicles,trains,ships,etc.) Traffic signal equipment  
ꢀꢀꢀ⑧Disaster prevention / crime prevention equipment  
Data-processing equipment  
ꢀꢀꢀ⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.  
Storage and Operation condition  
1. If store the chip monolithic ceramic capacitors in an atmosphere consisting of high temperature or humidity,  
sulfur or chlorine gases, contaminants attach to the surface of external electrode, and bondability with  
conductive glue may deteriorate. Do not store the capacitors in an atmosphere consisting of corrosive gas  
(e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammoria gas, etc.). Storage environment must be at room  
temperature of +5°C to +40°C and a relative humidity of 20% to 70%, and use the product within six months.  
In case of packaging, do not open the last wrappend, polyethylene bag, till just before using.  
After unpacking, immediately reseal, or store in a desiccator containing a desiccant.  
2. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused  
by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the bondability with conductive glue and  
electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity conditions.  
3. This product is chip monolithic ceramic capacitor limited to conductive glue mounting. Do not apply mounting method  
other than conductive glue. Flow or reflow soldering can result in a lack of adhesive strength on the outer electrode by  
poor wettability, which may result in chips breaking loose from the PCB.  
Rating  
1.Temperature Dependent Characteristics  
1. The electrical characteristics of the capacitor can change with temperature.  
1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature  
changes. The following actions are recommended in order to ensure suitable capacitance values.  
(1) Select a suitable capacitance for the operating temperature range.  
(2) The capacitance may change within the rated temperature.  
When you use a high dielectric constant type capacitor in a circuit that needs a tight (narrow) capacitance  
tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and  
carefully confirm the various characteristics in actual use conditions and the actual system.  
[Example of Temperature Caracteristics X7R(R7)]  
[Example of Temperature Characteristics X5R(R6)]  
Sample: 0.1μF, Rated Voltage 50VDC  
Sample: 22μF, Rated Voltage 4VDC  
2
1
1
20  
15  
10  
5
0
-
-5  
-1
-1
-2
-10  
-15  
-20  
-75  
-50  
-25  
0
25  
50  
75  
100  
-75  
-50  
-25  
0
25  
50  
75  
100 125 150  
Temperature (C)  
Temperature (C)  
JEMCGC-04887  
10  
Caution  
!
2.Measurement of Capacitance  
1. Measure capacitance with the voltage and frequency specified in the product specifications.  
1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.  
Please confirm whether a prescribed measured voltage is impressed to the capacitor.  
1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.  
Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.  
3.Applied Voltage  
1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.  
1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.  
(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.  
When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.  
(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.  
Typical Voltage Applied to the DC capacitor  
DC Voltage  
DC Voltage+AC  
AC Voltage  
Pulse Voltage  
0
E
E
E
E
0
0
0
(EMaximum possible applied voltage.)  
1-2. Influence of over voltage  
Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown  
of the internal dielectric layers .  
The time duration until breakdown depends on the applied voltage and the ambient temperature.  
4.Type of Applied Voltage and Self-heating Temperature  
1.Confirm the operating conditions to make sure that no large current is flowing into the capacitor due to the  
continuous application of an AC voltage or pulse voltage.  
When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current  
or pulse current will flow into the capacitor; therefore check the self-heating condition.  
Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits  
of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is  
used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.  
[Example of Temperature Rise (Heat Generation) in Chip  
<Applicable to Rated Voltage of less than 100VDC>  
Monolithic Ceramic Capacitors in Contrast to Ripple Current]  
1-1. The load should be contained to the level  
Sample: R(R1) characteristics 10μF, Rated voltage: DC10V  
such that when measuring at atmospheric  
ꢀ ꢀtemperature of 25°C, the product's self-heating  
ꢀꢀ remains below 20°C and the surface  
temperature of the capacitor in the actual circuit  
remains within the maximum operating  
temperature.  
Ripple Current  
100  
10  
100kHz  
500kHz  
1MHz  
1
0
1
2
4
5
6
3
Current (Ar.m.s.)  
JEMCGC-04887  
11  
Caution  
!
5. DC Voltage and AC Voltage Characteristic  
1. The capacitance value of a high dielectric constant type  
capacitor changes depending on the DC voltage applied.  
Please consider the DC voltage characteristics when a  
capacitor is selected for use in a DC circuit.  
[Example of DC Voltage Characteristics]  
Sample: R(R1) Characteristics 0.1μF, Rated Voltage 50VDC  
2
0
-2
-4
-6
-8
1-1. The capacitance of ceramic capacitors may change  
sharply depending on the applied voltage. (See figure)  
Please confirm the following in order to secure the  
capacitance.  
(1) Determine whether the capacitance change caused  
by the applied voltage is within the allowed range .  
(2) In the DC voltage characteristics, the rate of  
capacitance change becomes larger as voltage  
increases, even if the applied voltage is below  
the rated voltage. When a high dielectric constant  
type capacitor is used in a circuit that requires a  
tight (narrow) capacitance tolerance (e.g., a time  
constant circuit), please carefully consider the  
voltage characteristics, and confirm the various  
characteristics in the actual operating conditions  
-10
0
10  
20  
30  
40  
50  
DC Voltage (V)  
[Example of AC Voltage Characteristics]  
Sample: X7R(R7) Characteristics 10μF, Rated Voltage 6.3VDC  
30  
20  
10  
0
of the system.  
-10  
-20  
2. The capacitance values of high dielectric  
constant type capacitors changes depending  
on the AC voltage applied.  
-30  
-40  
-50  
-60  
Please consider the AC voltage characteristics  
when selecting a capacitor to be used in a  
AC circuit.  
0
0.5  
1
1.5  
2
AC Voltage (Vr.m.s.)  
6. Capacitance Aging  
[Example of Change Over Time (Aging characteristics) ]  
1. The high dielectric constant type capacitors  
have an Aging characteristic in which the capacitance  
value decreases with the passage of time.  
20  
10  
0
When you use a high dielectric constant type  
capacitors in a circuit that needs a tight (narrow)  
capacitance tolerance (e.g., a time-constant circuit),  
please carefully consider the characteristics  
of these capacitors, such as their aging, voltage,  
and temperature characteristics. In addition,  
check capacitors using your actual appliances  
at the intended environment and operating conditions.  
-10  
C0G(5C)  
X7R(R7)  
-20  
-30  
-40  
10  
100  
1000  
10000  
Time(h)  
7.Vibration and Shock  
1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.  
Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.  
2. Mechanical shock due to being dropped may cause damage or  
a crack in the dielectric material of the capacitor.  
Crack  
Do not use a dropped capacitor because the quality and reliability  
may be deteriorated.  
Floor  
3. When printed circuit boards are piled up or handled, the corner  
of another printed circuit board  
Mounting printed circuit board  
Crack  
should not be allowed to hit the capacitor in order to avoid  
a crack or other damage to the capacitor.  
JEMCGC-04887  
12  
Caution  
!
Mounting  
1. Selection of Conductive Adhesive, Mounting Process, and Bonding Strength  
1.The acuired bonding strength may change greatly depending on the conductive adhesive to be used.  
Be sure to confirming the desired performance can be acquired in the assumed monting process  
with the conductive adhesive to be used.  
2.Maintenance of the Mounting (pick and place) Machine  
1. Make sure that the following excessive forces are not applied to the capacitors.  
1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept  
to a minimum to prevent them from any damage or cracking. Please take into account the following precautions  
and recommendations for use in your process.  
(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.  
(2) Adjust the nozzle pressure within a static load of 1N to 3N during mounting.  
Suction Nozzle  
[Incorrect]  
Deflection  
Board  
Board Guide  
[Correct]  
Support Pin  
2.Dirt particles and dust accumulated between the suction nozzle and the cylinder inner wall prevent  
the nozzle from moving smoothly. This imposes greater force upon the chip during mounting,  
causing cracked chips. Also, the locating claw, when worn out, imposes uneven forces on the chip  
when positioning, causing cracked chips. The suction nozzle and the locating claw must be maintained,  
checked and replaced periodically.  
3.Moisture proof  
1.To prevent the silver electrode migration, keep parts under low moisture condition with resin coating and the equivalent.  
4.Coating  
1. A crack may be caused in the capacitor due to the stress of the thermal contraction of the resin during curing process.  
The stress is affected by the amount of resin and curing contraction. Select a resin with low curing contraction.  
The difference in the thermal expansion coefficient between a coating resin or a molding resin and the capacitor  
may cause the destruction and deterioration of the capacitor such as a crack or peeling, and lead to the deterioration  
of insulation resistance or dielectric breakdown.  
Select a resin for which the thermal expansion coefficient is as close to that of the capacitor as possible.  
A silicone resin can be used as an under-coating to buffer against the stress.  
2. Select a resin that is less hygroscopic.  
Using hygroscopic resins under high humidity conditions may cause the deterioration of the insulation resistance  
of a capacitor. An epoxy resin can be used as a less hygroscopic resin.  
3The halogen system substance and organic acid are included in coating material, and a chip corrodes  
ꢀꢀby the kind of Coating material. Do not use strong acid type.  
JEMCGC-04887  
13  
Caution  
!
Others  
1. Under Operation of Equipment  
1-1. Do not touch a capacitor directly with bare hands during operation in order to avoid the danger of an electric shock.  
1-2. Do not allow the terminals of a capacitor to come in contact with any conductive objects (short-circuit).  
Do not expose a capacitor to a conductive liquid, inducing any acid or alkali solutions.  
1-3. Confirm the environment in which the equipment will operate is under the specified conditions.  
Do not use the equipment under the following environments.  
(1) Being spattered with water or oil.  
(2) Being exposed to direct sunlight.  
(3) Being exposed to ozone, ultraviolet rays, or radiation.  
(4) Being exposed to toxic gas (e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammonia gas etc.)  
(5) Any vibrations or mechanical shocks exceeding the specified limits.  
(6) Moisture condensing environments.  
1-4. Use damp proof countermeasures if using under any conditions that can cause condensation.  
2. Others  
2-1. In an Emergency  
(1) If the equipment should generate smoke, fire, or smell, immediately turn off or unplug the equipment.  
If the equipment is not turned off or unplugged, the hazards may be worsened by supplying continuous power.  
(2) In this type of situation, do not allow face and hands to come in contact with the capacitor or burns may be caused  
by the capacitor's high temperature.  
2-2. Disposal of waste  
When capacitors are disposed of, they must be burned or buried by an industrial waste vendor with the appropriate  
licenses.  
2-3. Circuit Design  
(1) Addition of Fail Safe Function  
Capacitors that are cracked by dropping or bending of the board may cause deterioration of the  
insulation resistance, and result in a short. If the circuit being used may cause an electrical shock,  
smoke or fire when a capacitor is shorted, be sure to install fail-safe functions, such as a fuse,  
to prevent secondary accidents.  
(2) This series are not safety standard certified products.  
2-4. Remarks  
Failure to follow the cautions may result, worst case, in a short circuit and smoking when the product is used.  
The above notices are for standard applications and conditions. Contact us when the products are used in special  
mounting conditions.  
Select optimum conditions for operation as they determine the reliability of the product after assembly.  
The data herein are given in typical values, not guaranteed ratings.  
JEMCGC-04887  
14  
Notice  
Rating  
1.Operating Temperature  
1. The operating temperature limit depends on the capacitor.  
1-1. Do not apply temperatures exceeding the maximum operating temperature.  
It is necessary to select a capacitor with a suitable rated temperature that will cover the operating temperature range.  
It is also necessary to consider the temperature distribution in equipment and the seasonal temperature variable  
factor.  
1-2. Consider the self-heating factor of the capacitor  
The surface temperature of the capacitor shall not exceed the maximum operating temperature including self-heating.  
2.Atmosphere Surroundings (gaseous and liquid)  
1. Restriction on the operating environment of capacitors.  
1-1. Capacitors, when used in the above, unsuitable, operating environments may deteriorate due to the corrosion  
of the terminations and the penetration of moisture into the capacitor.  
1-2. The same phenomenon as the above may occur when the electrodes or terminals of the capacitor are subject  
to moisture condensation.  
1-3. The deterioration of characteristics and insulation resistance due to the oxidization or corrosion of terminal  
ꢀꢀelectrodes may result in breakdown when the capacitor is exposed to corrosive or volatile gases or solvents  
for long periods of time.  
3.Piezo-electric Phenomenon  
1. When using high dielectric constant type capacitors in AC or pulse circuits, the capacitor itself vibrates  
at specific frequencies and noise may be generated.  
Moreover, when the mechanical vibration or shock is added to capacitor, noise may occur.  
JEMCGC-04887  
15  
Notice  
Others  
1.Transportation  
1. The performance of a capacitor may be affected by the conditions during transportation.  
1-1. The capacitors shall be protected against excessive temperature, humidity and mechanical force during transportation.  
(1) Climatic condition  
ꢀ・ low air temperature : -40℃  
change of temperature air/air : -25/+25℃  
low air pressure : 30 kPa  
change of air pressure : 6 kPa/min.  
(2) Mechanical condition  
Transportation shall be done in such a way that the boxes are not deformed and forces are not directly passed  
on to the inner packaging.  
1-2. Do not apply excessive vibration, shock, or pressure to the capacitor.  
(1) When excessive mechanical shock or pressure is applied to a capacitor, chipping or cracking may occur  
in the ceramic body of the capacitor.  
(2) When the sharp edge of an air driver, tweezers, a chassis, etc. impacts strongly on the surface  
of the capacitor, the capacitor may crack and short-circuit.  
1-3. Do not use a capacitor to which excessive shock was applied by dropping etc.  
A capacitor dropped accidentally during processing may be damaged.  
2.Characteristics Evaluation in the Actual System  
1. Evaluate the capacitor in the actual system,to confirm that there is no problem with the performance and specification  
values in a finished product before using.  
2. Since a voltage dependency and temperature dependency exists in the capacitance of high dielectric type ceramic  
capacitors, the capacitance may change depending on the operating conditions in the actual system.  
Therefore,be sure to evaluate the various characteristics, such as the leakage current and noise absorptivity,  
which will affect the capacitance value of the capacitor.  
3. In addition,voltages exceeding the predetermined surge may be applied to the capacitor by the inductance in  
the actual system. Evaluate the surge resistance in the actual system as required.  
JEMCGC-04887  
16  
NOTE  
!
1.Please make sure that your product has been evaluated in view of your specifications with our  
product being mounted to your product.  
2.Your are requested not to use our product deviating from this product specification.  
3.We consider it not appropriate to include any terms and conditions with regard to the business  
transaction in the product specifications, drawings or other technical documents. Therefore,  
if your technical documents as above include such terms and conditions such as warranty clause,  
product liability clause, or intellectual property infringement liability clause, they will be deemed to  
be invalid.  
JEMCGC-04887  
17  
配单直通车
GCG1885G1H182GA01D产品参数
型号:GCG1885G1H182GA01D
是否无铅: 不含铅
是否Rohs认证: 符合
生命周期:Active
包装说明:, 0603
Reach Compliance Code:compliant
ECCN代码:EAR99
Factory Lead Time:14 weeks
风险等级:5.73
电容:0.0018 µF
电容器类型:CERAMIC CAPACITOR
介电材料:CERAMIC
JESD-609代码:e3
安装特点:SURFACE MOUNT
多层:Yes
负容差:2%
端子数量:2
最高工作温度:150 °C
最低工作温度:-55 °C
封装形状:RECTANGULAR PACKAGE
包装方法:TR, PAPER, 7 INCH
正容差:2%
额定(直流)电压(URdc):50 V
参考标准:AEC-Q200
尺寸代码:0603
表面贴装:YES
温度特性代码:X8G
温度系数:30ppm/Cel ppm/ °C
端子面层:Tin (Sn) - with Nickel (Ni) barrier
端子形状:WRAPAROUND
Base Number Matches:1
  •  
  • 供货商
  • 型号 *
  • 数量*
  • 厂商
  • 封装
  • 批号
  • 交易说明
  • 询价
批量询价选中的记录已选中0条,每次最多15条。
 复制成功!