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产品型号HY57V641620ELT-5的Datasheet PDF文件预览

64Mb Synchronous DRAM based on 1M x 4Bank x16 I/O  
Document Title  
4Bank x 1M x 16bits Synchronous DRAM  
Revision History  
Revision No.  
History  
Draft Date  
Remark  
First Version Release  
1.0  
Nov. 2004  
1. Changed tOH: 2.0 --> 2.5  
[tCK = 7 & 7.5 (CL3) Product]  
1. Changed Input High/Low Voltage (Page 08)  
2. Changed DC characteristics (Page 09)  
- IDD2NS: 18mA -> 15mA  
- IDD5:210 / 195 / 180mA -> 170 / 160 / 150mA  
[Speed 200 / 166 / 143 / 133MHz]  
3. Changed Clock High / Low pulse width Time (Page 11)  
4. Changed tAC Time (Page11)  
1.1  
1.2  
Dec. 2004  
Dec. 2004  
5. Changed tRRD Time (Page12)  
1. Corrected Revision No.: 2.0 -> 1.1  
2. Deleted Remark at Revision History  
3. Corrected AC OPERATING CONDITION  
- CL 50pF -> 30pF  
4. Changed DC OPERATING CONDITION  
- VIH MAX VDDQ+2.0 -> VDDQ+0.3 and Typ 3.3 -> 3.0  
- VIL MIN VSSQ-2.0 -> -0.3  
1.3  
1.4  
1.5  
1. Modified note for Super Low Power in ORDERING INFORMATION  
1. Corrected PIN ASSIGNMENT A12 to NC  
Jan. 2005  
Jan. 2005  
Feb. 2005  
1. Corrected comments for overshoot and undershoot  
This document is a general product description and is subject to change without notice. Hynix does not assume any responsibility for  
use of circuits described. No patent licenses are implied.  
Rev. 1.5 / Feb. 2005  
1
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
DESCRIPTION  
The Hynix HY57V641620E(L/S)T(P) series is a 67,108,864bit CMOS Synchronous DRAM, ideally suited for the memory  
applications which require wide data I/O and high bandwidth. HY57V641620E(L/S)T(P) is organized as 4banks of  
1,048,576x16.  
HY57V641620E(L/S)T(P) is offering fully synchronous operation referenced to a positive edge of the clock. All inputs  
and outputs are synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve  
very high bandwidth. All input and output voltage levels are compatible with LVTTL.  
Programmable options include the length of pipeline (Read latency of 2 or 3), the number of consecutive read or write  
cycles initiated by a single control command (Burst length of 1,2,4,8 or full page), and the burst count sequence(se-  
quential or interleave). A burst of read or write cycles in progress can be terminated by a burst terminate command or  
can be interrupted and replaced by a new burst read or write command on any cycle. (This pipelined design is not re-  
stricted by a '2N' rule)  
FEATURES  
Voltage: VDD, VDDQ 3.3V supply voltage  
All device pins are compatible with LVTTL interface  
54 Pin TSOPII (Lead or Lead Free Package)  
Auto refresh and self refresh  
4096 Refresh cycles / 64ms  
Programmable Burst Length and Burst Type  
- 1, 2, 4, 8 or full page for Sequential Burst  
- 1, 2, 4 or 8 for Interleave Burst  
Programmable CAS Latency; 2, 3 Clocks  
Burst Read Single Write operation  
All inputs and outputs referenced to positive edge of  
system clock  
Data mask function by UDQM, LDQM  
Internal four banks operation  
ORDERING INFORMATION  
Part No.  
Clock Frequency  
Organization  
Interface  
Package  
HY57V641620E(L/S)T(P)-5  
HY57V641620E(L/S)T(P)-6  
HY57V641620E(L/S)T(P)-7  
HY57V641620E(L/S)T(P)-H  
200MHz  
166MHz  
143MHz  
133MHz  
4Banks x 1Mbits x16  
LVTTL  
54 Pin TSOPII  
Note: 1. HY57V641620ET Series: Normal power, Leaded.  
2. HY57V641620ELT Series: Low power, Leaded.  
3. HY57V641620EST Series: Super Low power, Leaded.  
4. HY57V641620ETP Series: Normal power, Lead Free.  
5. HY57V641620ELTP Series: Low power, Lead Free.  
6. HY57V641620ESTP Series: Super Low Power, Lead Free  
Rev. 1.5 / Feb. 2005  
2
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
PIN ASSIGNMENTS  
1
54  
53  
52  
51  
50  
49  
48  
47  
46  
45  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
VDD  
DQ0  
VDDQ  
DQ1  
DQ2  
VSSQ  
DQ3  
DQ4  
VDDQ  
DQ5  
DQ6  
VSSQ  
DQ7  
VDD  
LDQM  
/WE  
/CAS  
/RAS  
/CS  
VSS  
2
DQ15  
VSSQ  
DQ14  
DQ13  
VDDQ  
DQ12  
DQ11  
VSSQ  
DQ10  
DQ9  
VDDQ  
DQ8  
VSS  
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
54 Pin TSOPII  
400mil x 875mil  
0.8mm pin pitch  
NC  
UDQM  
CLK  
CKE  
NC  
BA0  
A11  
BA1  
A9  
A10/AP  
A0  
A8  
A7  
A1  
A6  
A2  
A5  
A3  
A4  
VDD  
VSS  
Rev. 1.5 / Feb. 2005  
3
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
PIN DESCRIPTION  
SYMBOL  
TYPE  
DESCRIPTION  
The system clock input. All other inputs are registered to the  
SDRAM on the rising edge of CLK  
CLK  
Clock  
Controls internal clock signal and when deactivated, the SDRAM will  
be one of the states among power down, suspend or self refresh  
CKE  
CS  
Clock Enable  
Chip Select  
Enables or disables all inputs except CLK, CKE, UDQM and LDQM  
Selects bank to be activated during RAS activity  
Selects bank to be read/written during CAS activity  
BA0, BA1  
Bank Address  
Row Address: RA0 ~ RA11, Column Address: CA0 ~ CA7  
Auto-precharge flag: A10  
A0 ~ A11  
Address  
Row Address Strobe,  
Column Address Strobe,  
Write Enable  
RAS, CAS and WE define the operation  
Refer function truth table for details  
RAS, CAS, WE  
UDQM, LDQM  
Controls output buffers in read mode and masks input data in write  
mode  
Data Input/Output Mask  
DQ0 ~ DQ15  
VDD / VSS  
Data Input / Output  
Multiplexed data input / output pin  
Power Supply / Ground  
Power supply for internal circuits and input buffers  
Data Output Power /  
Ground  
VDDQ / VSSQ  
NC  
Power supply for output buffers  
No connection  
No Connection  
Rev. 1.5 / Feb. 2005  
4
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
FUNCTIONAL BLOCK DIAGRAM  
1Mbit x 4banks x 16 I/O Synchronous DRAM  
Internal Row  
Counter  
Self refresh  
logic & timer  
1Mx16 BANK 3  
1Mx16 BANK 2  
1Mx16 BANK 1  
1Mx16 BANK 0  
CLK  
Row  
Pre  
Decoder  
Row Active  
CKE  
CS  
DQ0  
RAS  
CAS  
Refresh  
Memory  
Cell  
Array  
Column Active  
Column  
Pre  
WE  
Decoder  
DQ15  
U/LDQM  
Y-Decoder  
Column Add  
Counter  
Bank Select  
Address  
Register  
A0  
A1  
Burst  
Counter  
Pipe Line  
Control  
A11  
BA1  
BA0  
CAS Latency  
Mode Register  
Data Out Control  
Rev. 1.5 / Feb. 2005  
5
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
BASIC FUNCTIONAL DESCRIPTION  
Mode Register  
BA1  
0
BA0  
0
A11  
0
A10  
0
A9  
A8  
0
A7  
0
A6  
A5  
A4  
A3  
BT  
A2  
A1  
A0  
OP Code  
CAS Latency  
Burst Length  
OP Code  
A9  
0
Write Mode  
Burst Read and Burst Write  
Burst Read and Single Write  
Burst Type  
1
A3  
0
Burst Type  
Sequential  
Interleave  
1
CAS Latency  
Burst Length  
A6  
0
A5  
0
A4  
CAS Latency  
Reserved  
1
Burst Length  
A2  
A1  
A0  
0
1
0
1
0
1
0
1
A3 = 0  
A3=1  
0
0
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
2
1
2
4
8
0
1
2
0
1
3
4
1
0
R e s e r v e d  
Reserved  
Reserved  
R e s e r v e d  
8
1
0
Reserved  
Reserved  
Reserved  
Full Page  
Reserved  
Reserved  
Reserved  
Reserved  
1
1
1
1
Rev. 1.5 / Feb. 2005  
6
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
ABSOLUTE MAXIMUM RATING  
Parameter  
Symbol  
Rating  
Unit  
oC  
Ambient Temperature  
TA  
0 ~ 70  
oC  
V
Storage Temperature  
TSTG  
VIN, VOUT  
VDD, VDDQ  
IOS  
-55 ~ 125  
-1.0 ~ 4.6  
-1.0 ~ 4.6  
50  
Voltage on Any Pin relative to VSS  
Voltage on VDD relative to VSS  
Short Circuit Output Current  
Power Dissipation  
V
mA  
W
PD  
1
oC / Sec  
TSOLDER  
Soldering Temperature / Time  
260 / 10  
o
DC OPERATING CONDITION (TA= 0 to 70 C)  
Parameter  
Power Supply Voltage  
Input High Voltage  
Input Low Voltage  
Symbol  
VDD, VDDQ  
VIH  
Min  
3.0  
Typ  
3.3  
3.0  
-
Max  
Unit  
Note  
1
3.6  
V
V
V
2.0  
VDDQ + 0.3  
0.8  
1, 2  
1, 3  
VIL  
-0.3  
Note: 1. All voltages are referenced to VSS = 0V  
2. VIH(max) is acceptable 5.6V AC pulse width with <=3ns of duration.  
3. VIL(min) is acceptable -2.0V AC pulse width with <=3ns of duration.  
o
AC OPERATING TEST CONDITION (TA= 0 to 70 C, VDD=3.3±0.3V, VSS=0V)  
Parameter  
AC Input High/Low Level Voltage  
Symbol  
VIH / VIL  
Vtrip  
Value  
2.4 / 0.4  
1.4  
Unit  
V
Note  
Input Timing Measurement Reference Level Voltage  
Input Rise/Fall Time  
V
tR / tF  
Voutref  
CL  
1
ns  
V
Output Timing Measurement Reference Level Voltage  
Output Load Capacitance for Access Time Measurement  
1.4  
30  
pF  
1
Note: 1.  
Vtt=1.4V  
Vtt=1.4V  
RT=500 Ω  
RT=50 Ω  
Output  
Z0 = 50Ω  
Output  
30pF  
30pF  
DC Output Load Circuit  
AC Output Load Circuit  
Rev. 1.5 / Feb. 2005  
7
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
o
CAPACITANCE (TA= 0 to 70 C, f=1MHz, VDD=3.3V)  
Parameter  
Pin  
Symbol  
Min  
Max  
Unit  
CLK  
CI1  
2.0  
4.0  
pF  
Input capacitance  
A0 ~ A11, BA0, BA1, CKE, CS, RAS, CAS, WE,  
LDQM, UDQM  
CI2  
2.5  
3.0  
5.0  
5.5  
pF  
pF  
Data input / output capacitance  
DQ0 ~ DQ15  
CI/O  
o
DC CHARACTERRISTICS I (TA= 0 to 70 C)  
Parameter  
Symbol  
Min  
Max  
Unit  
Note  
Input Leakage Current  
Output Leakage Current  
Output High Voltage  
Output Low Voltage  
ILI  
ILO  
-1  
-1  
2.4  
-
1
1
uA  
uA  
V
1
2
VOH  
VOL  
-
IOH = -4mA  
IOL = +4mA  
0.4  
V
Note: 1. VIN = 0 to 3.3V, All other balls are not tested under VIN =0V  
2. DOUT is disabled, VOUT=0 to 3.6  
Rev. 1.5 / Feb. 2005  
8
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
o
DC CHARACTERISTICS II (TA= 0 to 70 C)  
Speed  
Parameter  
Symbol  
Test Condition  
Unit Note  
5
6
7
H
Burst length=1, One bank active  
tRC tRC(min), IOL=0mA  
Operating Current  
IDD1  
120 110 100 100 mA  
1
Precharge Standby Cur- IDD2P  
rent  
CKE VIL(max), tCK = 15ns  
2
2
mA  
mA  
IDD2PS CKE VIL(max), tCK = ∞  
in Power Down Mode  
CKE VIH(min), CS VIH(min), tCK = 15ns  
Input signals are changed one time during  
2clks.  
All other pins VDD-0.2V or 0.2V  
Precharge Standby Cur-  
rent  
in Non Power Down  
Mode  
IDD2N  
18  
mA  
mA  
mA  
CKE VIH(min), tCK = ∞  
Input signals are stable.  
IDD2NS  
IDD3P  
15  
CKE VIL(max), tCK = 15ns  
3
3
Active Standby Current  
in Power Down Mode  
IDD3PS CKE VIL(max), tCK = ∞  
CKE VIH(min), CS VIH(min), tCK = 15ns  
Input signals are changed one time during  
2clks.  
All other pins VDD-0.2V or 0.2V  
IDD3N  
40  
35  
Active Standby Current  
in Non Power Down  
Mode  
CKE VIH(min), tCK = ∞  
Input signals are stable.  
IDD3NS  
Burst Mode Operating  
Current  
tCK tCK(min), IOL=0mA  
All banks active  
IDD4  
IDD5  
120 110 100 100 mA  
170 160 150 150 mA  
1
2
Auto Refresh Current  
tRC tRC(min), All banks active  
Normal  
1
mA  
uA  
3
Low power  
400  
Self Refresh Current  
IDD6  
CKE 0.2V  
Super Low  
power  
300  
uA  
3, 4  
Note: 1. IDD1 and IDD4 depend on output loading and cycle rates. Specified values are measured with the output open  
2. Min. of tRRC (Refresh RAS cycle time) is shown at AC CHARACTERISTICS II  
3. HY57V641620ET(P) Series: Normal Power  
HY57V641620ELT(P) Series: Low Power  
HY57V641620EST(P) Series: Super Low Power  
Rev. 1.5 / Feb. 2005  
9
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
AC CHARACTERISTICS I (AC operating conditions unless otherwise noted)  
5
6
7
H
Parameter  
Symbol  
Unit Note  
Min Max Min Max Min Max Min Max  
CL = 3  
CL = 2  
tCK3  
tCK2  
tCHW  
tCLW  
tAC3  
tAC2  
tOH  
5.0  
10  
6.0  
10  
2.0  
2.0  
-
7.0  
10  
2.0  
2.0  
-
7.5  
10  
2.5  
2.5  
-
ns  
ns  
System Clock  
Cycle Time  
1000  
1000  
1000  
1000  
Clock High Pulse Width  
Clock Low Pulse Width  
1.75  
1.75  
-
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
1
1
-
-
-
-
CL = 3  
CL = 2  
4.5  
5.4  
5.4  
5.4  
Access Time From Clock  
2
-
6.0  
-
6.0  
-
6.0  
-
6.0  
Data-out Hold Time  
Data-Input Setup Time  
Data-Input Hold Time  
Address Setup Time  
Address Hold Time  
CKE Setup Time  
2.0  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.0  
-
-
2.0  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.0  
-
-
2.5  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
-
-
2.5  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
0.8  
1.5  
-
-
tDS  
-
-
-
-
1
1
1
1
1
1
1
1
tDH  
-
-
-
-
tAS  
-
-
-
-
tAH  
-
-
-
-
-
-
-
-
tCKS  
tCKH  
tCS  
CKE Hold Time  
-
-
-
-
Command Setup Time  
Command Hold Time  
-
-
-
-
tCH  
-
-
-
-
CLK to Data Output in Low-Z Time tOLZ  
-
-
-
-
CL = 3  
CL = 2  
tOHZ3  
tOHZ2  
4.5  
6.0  
5.4  
6.0  
5.4  
6.0  
5.4  
6.0  
CLK to Data Output  
in High-Z Time  
-
-
-
-
Note: 1. Assume tR / tF (input rise and fall time) is 1ns. If tR & tF > 1ns, then [(tR+tF)/2-1]ns should be added to the parameter.  
2. Access time to be measured with input signals of 1V/ns edge rate, from 0.8V to 0.2V. If tR > 1ns,  
then (tR/2-0.5)ns should be added to the parameter.  
Rev. 1.5 / Feb. 2005  
10  
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
AC CHARACTERISTICS II (AC operating conditions unless otherwise noted)  
5
6
7
H
Parameter  
Symbol  
Unit Note  
Min Max Min Max Min Max Min Max  
RAS Cycle Time  
Operation  
tRC  
55  
55  
15  
-
-
-
60  
60  
18  
42  
18  
12  
1
-
63  
63  
20  
42  
20  
14  
1
-
-
-
63  
63  
20  
-
-
-
ns  
ns  
ns  
RAS Cycle Time  
RAS to CAS Delay  
RAS Active Time  
Auto Refresh tRRC  
-
tRCD  
tRAS  
-
38.7 100K  
100K  
100K 42 120K ns  
RAS Precharge Time  
tRP  
15  
10  
1
-
-
-
-
-
-
-
-
-
20  
15  
1
-
-
-
ns  
ns  
RAS to RAS Bank Active Delay  
CAS to CAS Delay  
tRRD  
tCCD  
CLK  
Write Command to Data-In De-  
lay  
tWTL  
0
2
-
-
0
2
-
-
0
2
-
-
0
2
-
-
CLK  
CLK  
Data-in to Precharge Command tDPL  
Data-In to Active Command  
DQM to Data-Out Hi-Z  
DQM to Data-In Mask  
MRS to New Command  
tDAL  
tDPL + tRP  
tDQZ  
tDQM  
tMRD  
tPROZ3  
tPROZ2  
tDPE  
2
0
2
3
2
1
1
-
-
-
2
0
2
3
2
1
1
-
-
-
-
-
-
-
-
2
0
2
3
2
1
1
-
-
2
0
2
3
2
1
1
-
-
-
CLK  
CLK  
CLK  
CLK  
CLK  
CLK  
CLK  
ms  
-
-
-
Prechargeto Data CL = 3  
Output High-Z  
CL = 2  
-
-
-
-
-
-
Power Down Exit Time  
Self Refresh Exit Time  
Refresh Time  
-
-
-
tSRE  
-
-
-
1
tREF  
64  
64  
-
64  
64  
Note: 1. A new command can be given tRRC after self refresh exit.  
Rev. 1.5 / Feb. 2005  
11  
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
COMMAND TRUTH TABLE  
Command  
CKEn-1 CKEn  
CS  
L
RAS CAS WE DQM ADDR A10/AP  
BA  
Note  
Mode Register Set  
H
H
H
X
X
X
L
X
H
L
L
X
H
H
L
X
H
H
X
X
X
OP code  
H
L
No Operation  
X
Bank Active  
Read  
L
RA  
V
V
L
H
L
H
H
H
X
X
L
L
H
H
L
L
H
L
X
X
X
CA  
CA  
X
Read with Autopre-  
charge  
Write  
V
Write with Autopre-  
charge  
H
H
L
Precharge All Banks  
X
V
X
X
L
L
L
H
H
L
L
Precharge  
Bank  
selected  
Burst Stop  
DQM  
H
H
H
H
X
V
X
X
X
X
Auto Refresh  
H
X
L
L
L
L
L
L
L
H
L
X
Burst-Read-Single-  
WRITE  
A9 ball High  
(Other balls OP code)  
MRS  
Mode  
H
H
X
X
Entry  
L
H
L
L
X
H
X
H
X
H
X
V
L
X
H
X
H
X
H
X
V
H
X
H
X
H
X
H
X
V
Self Refresh1  
X
Exit  
L
H
L
H
L
X
X
X
H
L
Entry  
Exit  
Precharge  
power down  
X
X
H
L
H
H
L
Entry  
Exit  
H
L
L
X
X
Clock  
Suspend  
H
X
Rev. 1.5 / Feb. 2005  
12  
Synchronous DRAM Memory 64Mbit (4Mx16bit)  
HY57V641620E(L/S)T(P) Series  
PACKAGE INFORMATION  
400mil 54pin Thin Small Outline Package  
UNIT : mm(inch)  
11.938(0.4700)  
11.735(0.4620)  
22.327(0.8790)  
22.149(0.8720)  
10.262(0.4040)  
10.058(0.3960)  
0.150(0.0059)  
0.050(0.0020)  
1.194(0.0470)  
0.991(0.0390)  
5deg  
0deg  
0.210(0.0083)  
0.120(0.0047)  
0.597(0.0235)  
0.406(0.0160)  
0.400(0.016)  
0.80(0.0315)BSC  
0.300(0.012)  
Rev. 1.5 / Feb. 2005  
13  
配单直通车
HY57V641620ELT-5产品参数
型号:HY57V641620ELT-5
是否Rohs认证: 不符合
生命周期:Obsolete
零件包装代码:TSOP2
包装说明:TSOP2, TSOP54,.46,32
针数:54
Reach Compliance Code:compliant
ECCN代码:EAR99
HTS代码:8542.32.00.02
风险等级:5.88
访问模式:FOUR BANK PAGE BURST
最长访问时间:4.5 ns
其他特性:AUTO/SELF REFRESH
最大时钟频率 (fCLK):200 MHz
I/O 类型:COMMON
交错的突发长度:1,2,4,8
JESD-30 代码:R-PDSO-G54
JESD-609代码:e0
长度:22.238 mm
内存密度:67108864 bit
内存集成电路类型:SYNCHRONOUS DRAM
内存宽度:16
功能数量:1
端口数量:1
端子数量:54
字数:4194304 words
字数代码:4000000
工作模式:SYNCHRONOUS
最高工作温度:70 °C
最低工作温度:
组织:4MX16
输出特性:3-STATE
封装主体材料:PLASTIC/EPOXY
封装代码:TSOP2
封装等效代码:TSOP54,.46,32
封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度):NOT SPECIFIED
电源:3.3 V
认证状态:Not Qualified
刷新周期:4096
座面最大高度:1.194 mm
自我刷新:YES
连续突发长度:1,2,4,8,FP
最大待机电流:0.002 A
子类别:DRAMs
最大压摆率:0.21 mA
最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V
表面贴装:YES
技术:CMOS
温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING
端子节距:0.8 mm
端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:10.16 mm
Base Number Matches:1
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