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产品型号JANTXV2N7335的Datasheet PDF文件预览

PD - 90397G  
IRFG9110  
JANTX2N7335  
JANTXV2N7335  
REF:MIL-PRF-19500/599  
100V, QUAD P-CHANNEL  
HEXFET® MOSFETTECHNOLOGY  
POWER MOSFET  
THRU-HOLE (MO-036AB)  
Product Summary  
Part Number RDS(on) ID  
IRFG9110  
1.4-0.75A  
HEXFET® MOSFET technology is the key to International  
Rectifier’s advanced line of power MOSFET transistors. The  
efficient geometry design achieves very low on-state resis-  
tance combined with high transconductance. HEXFET tran-  
sistors also feature all of the well-established advantages  
of MOSFETs, such as voltage control, very fast switching,  
ease of paralleling and electrical parameter temperature  
stability. They are well-suited for applications such as switch-  
ing power supplies, motor controls, inverters, choppers,  
audio amplifiers, high energy pulse circuits, and virtually  
any application where high reliability is required. The  
HEXFET transistor’s totally isolated package eliminates the  
need for additional isolating material between the device  
and the heatsink. This improves thermal efficiency and  
reduces drain capacitance.  
MO-036AB  
Features:  
n
n
n
n
n
n
Simple Drive Requirements  
Ease of Paralleling  
Hermetically Sealed  
Electrically Isolated  
Dynamic dv/dt Rating  
Light-weight  
Absolute Maximum Ratings  
Parameter  
Units  
I
@ V  
@ V  
= -10V, T = 25°C Continuous Drain Current  
-0.75  
-0.5  
D
GS  
C
A
I
D
= -10V, T = 100°C Continuous Drain Current  
C
GS  
I
Pulsed Drain Current  
Max. Power Dissipation  
-3.0  
DM  
@ T = 25°C  
P
1.4  
W
W/°C  
V
D
C
Linear Derating Factor  
0.011  
±20  
V
Gate-to-Source Voltage  
GS  
E
Single Pulse Avalanche Energy ➀  
Avalanche Current ➀  
75  
mJ  
A
AS  
I
AR  
E
Repetitive Avalanche Energy ➀  
Peak Diode Recovery dv/dt ➀  
Operating Junction  
mJ  
V/ns  
AR  
dv/dt  
-5.5  
T
-55 to 150  
J
T
Storage Temperature Range  
oC  
g
STG  
300 ( 0.063 in.(1.6mm) from case for 10s)  
1.3 (typical)  
Lead Temperature  
Weight  
For footnotes refer to the last page  
www.irf.com  
1
04/16/02  
IRFG9110  
Electrical Characteristics @Tj = 25°C (Unless Otherwise Specified)  
Parameter  
Min Typ Max Units  
Test Conditions  
BV  
Drain-to-Source Breakdown Voltage  
-100  
V
V
= 0V, I = -1.0mA  
D
DSS  
GS  
V/°C Reference to 25°C, I = -1.0mA  
BV  
/T Temperature Coefficient of Breakdown  
-0.098  
DSS  
J
D
Voltage  
R
V
Static Drain-to-Source On-State  
Resistance  
1.4  
1.73  
-4.0  
V
V
= -10V, I = -0.5A➀  
GS D  
DS(on)  
= -10V, I = -0.75A ➀  
GS  
D
Gate Threshold Voltage  
Forward Transconductance  
Zero Gate Voltage Drain Current  
-2.0  
0.67  
V
V
= V , I = -250µA  
GS(th)  
fs  
DS  
GS  
D
g
S ( )  
V
DS  
> -15V, I  
= -0.5A➀  
DS  
I
-25  
V = -80V, V = 0V  
DS GS  
DSS  
µA  
-250  
V
= -80V  
DS  
= 0V, T = 125°C  
V
GS  
J
I
I
Gate-to-Source Leakage Forward  
Gate-to-Source Leakage Reverse  
Total Gate Charge  
Gate-to-Source Charge  
Gate-to-Drain (‘Miller’) Charge  
Turn-On Delay Time  
Rise Time  
10  
-100  
100  
15  
7.0  
8.0  
30  
V
= -20V  
GSS  
GSS  
GS  
nA  
nC  
V
=20V  
GS  
= -10V, ID -0.75A  
Q
Q
Q
V
g
GS  
=
V
= -50V  
gs  
gd  
DS  
t
t
t
V
V
= -50V, I = -0.75A  
= -10V, R =7.5Ω  
d(on)  
r
DD  
GS  
D
60  
G
ns  
Turn-Off Delay Time  
FallTime  
Total Inductance  
40  
d(off)  
t
L
40  
f
L
nH Measured from drain lead (6mm/  
0.25in. from package) to source lead  
(6mm/0.25in. from package)  
S +  
D
C
C
C
Input Capacitance  
200  
85  
V
GS  
= 0V, V  
= -25V  
iss  
DS  
f = 1.0MHz  
Output Capacitance  
pF  
oss  
rss  
Reverse Transfer Capacitance  
30  
Source-DrainDiodeRatingsandCharacteristics  
Parameter  
Min Typ Max Units  
Test Conditions  
I
I
V
t
Continuous Source Current (Body Diode)  
Pulse Source Current (Body Diode) ➀  
Diode Forward Voltage  
-0.75  
-3.0  
-5.5  
200  
9.0  
S
A
SM  
V
T = 25°C, I = -0.75A, V  
= 0V ➀  
j
SD  
rr  
S
GS  
Reverse Recovery Time  
nS  
µc  
T = 25°C, I = -0.75A, di/dt -100A/µs  
j
F
V
Q
Reverse Recovery Charge  
-50V ➀  
DD  
RR  
t
Forward Turn-On Time  
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by L + L .  
S D  
on  
Thermal Resistance  
Parameter  
Min Typ Max Units  
Test Conditions  
R
R
Junction-to-Case  
17  
90  
thJC  
thJA  
°C/W  
Junction to Ambient  
Typical socket mount  
Note: Corresponding Spice and Saber models are available on the G&S Website.  
For footnotes refer to the last page  
2
www.irf.com  
IRFG9110  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs.Temperature  
www.irf.com  
3
IRFG9110  
13a & b  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-SourceVoltage  
Drain-to-SourceVoltage  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
ForwardVoltage  
4
www.irf.com  
IRFG9110  
RD  
VDS  
VGS  
D.U.T.  
RG  
-
+
VDD  
-10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
t
t
r
t
t
f
d(on)  
d(off)  
V
GS  
10%  
90%  
V
DS  
Fig 9. Maximum Drain Current Vs.  
CaseTemperature  
Fig 10b. Switching Time Waveforms  
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient  
www.irf.com  
5
IRFG9110  
L
V
DS  
D.U.T  
R
G
V
DD  
I
A
AS  
DRIVER  
-10V  
-
0.01  
t
p
15V  
Fig 12a. Unclamped Inductive Test Circuit  
I
AS  
Fig 12c. Maximum Avalanche Energy  
Vs. DrainCurrent  
t
p
V
(BR)DSS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
Q
G
.2µF  
-10V  
.3µF  
-10V  
-
V
+
DS  
Q
Q
GD  
GS  
D.U.T.  
V
GS  
V
G
-3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
6
www.irf.com  
IRFG9110  
Foot Notes:  
➀➀ I  
SD  
-0.75A, di/dt ≤ −75A/µs,  
-100V, T 150°C  
Repetitive Rating; Pulse width limited by  
maximum junction temperature.  
V
DD  
J
V  
=-25V, starting T = 25°C, L = 266mH  
J
DD  
Peak I = -0.75A, V  
Pulse width 300 µs; Duty Cycle 2%  
= -10V  
L
GS  
Case Outline and Dimensions — MO-036AB  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.  
Data and specifications subject to change without notice. 04/02  
www.irf.com  
7
配单直通车
JANTXV2N7335产品参数
型号:JANTXV2N7335
是否Rohs认证: 不符合
生命周期:Obsolete
IHS 制造商:MICROSEMI CORP
零件包装代码:DIP
包装说明:IN-LINE, R-CDIP-T14
针数:14
Reach Compliance Code:compliant
ECCN代码:EAR99
HTS代码:8541.29.00.75
风险等级:5.19
Is Samacsys:N
其他特性:HIGH RELIABILITY
雪崩能效等级(Eas):75 mJ
配置:SEPARATE, 4 ELEMENTS WITH BUILT-IN DIODE
最小漏源击穿电压:100 V
最大漏极电流 (ID):0.75 A
最大漏源导通电阻:1.73 Ω
FET 技术:METAL-OXIDE SEMICONDUCTOR
JEDEC-95代码:MO-036AB
JESD-30 代码:R-CDIP-T14
元件数量:4
端子数量:14
工作模式:ENHANCEMENT MODE
封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装形状:RECTANGULAR
封装形式:IN-LINE
峰值回流温度(摄氏度):NOT SPECIFIED
极性/信道类型:P-CHANNEL
最大脉冲漏极电流 (IDM):3 A
认证状态:Qualified
参考标准:MIL-19500/599
表面贴装:NO
端子形式:THROUGH-HOLE
端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED
晶体管应用:SWITCHING
晶体管元件材料:SILICON
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