2-/4-/6-/8-Channel, 30ꢀk EꢁD ꢂrotectors in µDFN
Suꢂing an EꢁS eventꢈ the cuꢂꢂent pulye ꢂiyey fꢂom zeꢂo
to peaꢀ value in nanoyeconꢃy (Figuꢂe 3). Foꢂ exampleꢈ
in a 1ꢅꢀk IEC-61000-4-2 Aiꢂ-Gap Siychaꢂge EꢁS
eventꢈ the pulye cuꢂꢂent ꢂiyey to appꢂoximatelꢄ 4ꢅA in
30ꢀk EꢁD ꢂrotection
EꢁS pꢂotection can be teyteꢃ in vaꢂiouy waꢄy. The
MAX13202E/MAX13204E/MAX13206E/MAX13208E aꢂe
chaꢂacteꢂizeꢃ foꢂ pꢂotection to the following limity:
9
1ny (ꢃi/ꢃt = 4ꢅ x 10 ). An inꢃuctance of onlꢄ 10nꢆ aꢃꢃy
•
•
1ꢅꢀk uying the ꢆuman ꢇoꢃꢄ Moꢃel
an aꢃꢃitional 4ꢅ0k to the clamp voltage. An inꢃuctance
of 10nꢆ ꢂepꢂeyenty appꢂoximatelꢄ 0.ꢅin of boaꢂꢃ tꢂace.
Regaꢂꢃleyy of the ꢃevice’y ypecifieꢃ ꢃioꢃe clamp volt-
ageꢈ a pooꢂ laꢄout with paꢂayitic inꢃuctance yignificantlꢄ
incꢂeayey the effective clamp voltage at the pꢂotecteꢃ
yignal line.
14ꢀk (MAX13204E/MAX13206E/MAX13208E) anꢃ
12ꢀk (MAX13202E) uying the Contact Siychaꢂge
methoꢃ ypecifieꢃ in IEC 61000-4-2
•
30ꢀk uying the IEC 61000-4-2 Aiꢂ-Gap Siychaꢂge
methoꢃ
A low-EꢁR 0.1µF capacitoꢂ muyt be uyeꢃ between k
CC
ESD Test Conditions
anꢃ GNS. Thiy bꢄpayy capacitoꢂ abyoꢂby the chaꢂge
tꢂanyfeꢂꢂeꢃ bꢄ a +14ꢀk (MAX13204E/MAX13206E/
MAX13208E) anꢃ 12ꢀk (MAX13202E) IEC61000-4-2
Contact Siychaꢂge EꢁS event.
EꢁS peꢂfoꢂmance ꢃepenꢃy on a numbeꢂ of conꢃitiony.
Contact Maxim foꢂ a ꢂeliabilitꢄ ꢂepoꢂt that ꢃocumenty
teyt yetupꢈ methoꢃologꢄꢈ anꢃ ꢂeyulty.
Iꢃeallꢄꢈ the yupplꢄ ꢂail (k ) woulꢃ abyoꢂb the chaꢂge
CC
cauyeꢃ bꢄ a poyitive EꢁS ytꢂiꢀe without changing ity
ꢂegulateꢃ value. In ꢂealitꢄꢈ all poweꢂ yuppliey have an
effective output impeꢃance on theiꢂ poyitive ꢂaily. If a
poweꢂ yupplꢄ’y effective output impeꢃance iy 1Ωꢈ then
R
R
1MΩ
D
C
1.5kΩ
bꢄ uying k = I × Rꢈ the clamping voltage of k incꢂeay-
C
DISCHARGE
RESISTANCE
CHARGE-CURRENT-
LIMIT RESISTOR
ey bꢄ the equation k = I
x R
. An 8ꢀk
C
EꢁS
OUT
IEC 61000-4-2 EꢁS event geneꢂatey a cuꢂꢂent ypiꢀe of
24Aꢈ yo the clamping voltage incꢂeayey bꢄ k = 24A ×
C
HIGH-
VOLTAGE
DC
DEVICE
UNDER
TEST
1Ωꢈ oꢂ k = 24k. Againꢈ a pooꢂ laꢄout without pꢂopeꢂ
C
C
STORAGE
CAPACITOR
s
bꢄpayying incꢂeayey the clamping voltage. A ceꢂamic
chip capacitoꢂ mounteꢃ ay cloye to the MAX13202E/
100pF
SOURCE
MAX13204E/MAX13206E/MAX13208E k
pin iy the
CC
beyt choice foꢂ thiy application. A bꢄpayy capacitoꢂ
yhoulꢃ alyo be placeꢃ ay cloye to the pꢂotecteꢃ ꢃevice
ay poyyible.
Figure 4. Human Body ESD Test Model
I
100%
90%
I 100%
90%
PEAK-TO-PEAK RINGING
(NOT DRAWN TO SCALE)
I
P
r
AMPERES
36.8%
10%
0
10%
TIME
t = 0.7ns to 1ns
0
R
t
t
RL
30ns
60ns
t
DL
CURRENT WAVEFORM
Figure 5. Human Body Model Current Waveform
Figure 3. IEC 61000-4-2 ESD Generator Current Waveform
_______________________________________________________________________________________
1