MN1380 Series
Microcomputer Peripheral LSIs
Reliability Testing Results for MN1380 Series
(1) M type package (MN1380/MN13801/MN13802) and TO-92 type package (MN1381/MN13811/MN13812)
Test Subjects
Operating lifetime test
High-temperature storage test
Low-temperature storage test
High-temperature,
Test Conditions
VDD=5.5V, Ta=125˚C, t=1000hrs
Ta=150˚C, t=1000hrs
Results
0/15
0/15
Ta=–65˚C, t=1000hrs
0/15
Ta=85˚C, RH=85%, t=1000hrs
0/15
high-humidity storage test
High-temperature,
V
DD=5.5V, Ta=85˚C, RH=85%, t=1000hrs
0/15
0/15
0/15
high-humidity bias test
Thermal shock test
Ta=150˚C and –65˚C.
Five minutes at each temperature for ten cycles
Ta=150˚C and –65˚C.
Temperature cycle test
Thirty minutes at each temperature for ten cycles
Two atmospheres for 50 hours at ambient temperature (Ta) of 121˚C
Ambient temperature (Ta) of 230˚C for five seconds
Ambient temperature (Ta) of 270˚C for ten seconds
Pressure cooker test
Soldering test
0/15
0/15
0/15
Solder heat resistance test
(2) Mini type package (MN1382/MN13821/MN13822)
Test Subjects
Test Conditions
Results
0/15
Operating lifetime test
High-temperature storage test
Low-temperature storage test
High-temperature,
VDD=5.5V, Ta=125˚C, t=1000hrs
Ta=150˚C, t=1000hrs
0/15
Ta=–65˚C, t=1000hrs
0/15
Ta=85˚C, RH=85%, t=1000hrs
0/15
high-humidity storage test
High-temperature,
VDD=5.5V, Ta=85˚C, RH=85%, t=1000hrs
0/15
0/15
0/15
high-humidity bias test
Thermal shock test
Ta=150˚C and –65˚C.
Five minutes at each temperature for ten cycles
Ta=150˚C and –65˚C.
Temperature cycle test
Thirty minutes at each temperature for ten cycles
Two atmospheres for 24 hours at ambient temperature (Ta) of 121˚C
Ambient temperature (Ta) of 230˚C for five seconds
Ambient temperature (Ta) of 260˚C for five seconds
1
Pressure cooker test *
Soldering test
0/15
0/15
0/15
1
Solder heat resistance test *
1
Note* : Note that the testing conditions for the mini package differ from those for the other two packages.
20