Thyristors
25 Amp Standard & Alternistor (High Commutation) Triacs
Soldering Parameters
Reflow Condition
Pb – Free assembly
tP
TP
-Temperature Min (Ts(min)
)
150°C
Ramp-up
TL
TS(max)
Pre Heat -Temperature Max (Ts(max)
)
200°C
tL
-Time (min to max) (ts)
60 – 180 secs
Ramp-down
Preheat
Average ramp up rate (LiquidusTemp)
(TL) to peak
5°C/second max
TS(min)
tS
TS(max) toTL - Ramp-up Rate
5°C/second max
217°C
-Temperature (TL) (Liquidus)
Reflow
25
time to peak temperature
-Temperature (tL)
60 – 150 seconds
260+0/-5 °C
Time
PeakTemperature (TP)
Time within 5°C of actual peak
Temperature (tp)
20 – 40 seconds
Ramp-down Rate
5°C/second max
8 minutes Max.
280°C
Time 25°C to peakTemperature (TP)
Do not exceed
Physical Specifications
Environmental Specifications
Test
Specifications and Conditions
Terminal Finish
Body Material
Lead Material
100% MatteTin-plated
HighTemperature
Voltage Blocking
MIL-STD-750: Method 1040, Condition A
Rated VRRM, 125°C, 1008 hours
UL Recognized compound meeting
flammability rating V-0
MIL-STD-750: Method 1051
-40°C to 125°C, 15-minute dwell,
100 cycles
Temperature Cycling
Copper Alloy
BiasedTemp &
Humidity
EIA/JEDEC: JESD22-A101
320VDC, 85°C, 85%RH, 1008 hours
MIL-STD-750: Method 1031
150°C, 1008 hours
HighTemp. Storage
Low-Temp Storage
Design Considerations
-40°C, 1008 hours
Careful selection of the correct component for the
application’s operating parameters and environment will
go a long way toward extending the operating life of the
Thyristor. Good design practice should limit the maximum
continuous current through the main terminals to 75%
of the device rating. Other ways to ensure long life for a
power discrete semiconductor are proper heat sinking
and selection of voltage ratings for worst case conditions.
Overheating, overvoltage (including dv/dt), and surge
currents are the main killers of semiconductors. Correct
mounting, soldering, and forming of the leads also help
protect against component damage.
Resistance to
Solder Heat
MIL-STD-750: Method 2031
260°C, 10 seconds
Solderability
Lead Bend
ANSI/J-STD-002, Category 3, Test A
MIL-STD-750: Method 2036, Condition E
© 2018 Littelfuse, Inc.
Specifications are subject to change without notice.
Revised: 12/06/18