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A1020B-1CQ84B 参数 Datasheet PDF下载

A1020B-1CQ84B图片预览
型号: A1020B-1CQ84B
PDF下载: 下载PDF文件 查看货源
内容描述: 100%的自动布局布线高度可预测的性能 [Highly Predictable Performance with 100% Automatic Placement and Routing]
分类和应用: 现场可编程门阵列可编程逻辑布线
文件页数/大小: 98 页 / 2009 K
品牌: ACTEL [ Actel Corporation ]
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Pr od uc t F am i l y P r o f i l e
Family
Device
Capacity
System Gates
Logic Gates
SRAM Bits
Logic Modules
S-Modules
C-Modules
Decode
Flip-Flops (maximum)
User I/Os (maximum)
Packages (by pin count)
CPGA
CQFP
Performance
System Speed (maximum)
ACT 2
A1240A
6,000
4,000
NA
684
348
336
NA
568
104
132
40 MHz
A1280A
12,000
8,000
NA
1,232
624
608
NA
998
140
176
172
40 MHz
ACT 1
A1010B
1,800
1,200
NA
295
295
NA
147
57
84
A1020B
3,000
2,000
NA
547
547
NA
273
69
84
84
20 MHz
20 MHz
H i gh - R el i a bi l i t y , L o w - Ri s k So l ut i on
Actel builds the most reliable field programmable gate arrays
(FPGAs) in the industry, with overall antifuse reliability
ratings of less than 10 Failures-In-Time (FITs),
corresponding to a useful life of more than 40 years. Actel
FPGAs have been production proven, with more than five
million devices shipped and more than one trillion antifuses
manufactured. Actel devices are fully tested prior to
shipment, with an outgoing defect level of less than 100 ppm.
(Further reliability data is available in the
Actel Device
Reliability Report,
at
http://www.actel.com/hirel).
B en ef i t s
Mi nim i zed C os t Ri sk
junction temperatures. Actel’s non-PLD architecture delivers
lower dynamic operating current. Our reliability tests show a
very low failure rate of 6.6 FITs at 90°C junction temperature
with no degradation in AC performance. Special stress testing
at wafer test eliminates infant mortalities prior to packaging.
M ini m iz ed S e c u ri ty R is k
Reverse engineering of programmed Actel devices from
optical or electrical data is extremely difficult. Programmed
antifuses cannot be identified from a photograph or by using
an SEM. The antifuse map cannot be deciphered either
electrically or by microprobing. Each device has a silicon
signature that identifies its origins, down to the wafer lot and
fabrication facility.
M ini m ized T es ti ng Ri sk
With Actel’s line of development tools, designers can produce
as many chips as they choose for just the cost of the device
itself. There will be no NRE charges to cut into the
development budget each time a new design is tried.
M i n im i z e d T i m e R is k
After the design is entered, placement and routing is
automatic, and programming the device takes only about 5 to
15 minutes for an average design. Designers save time in the
design entry process by using tools with which they are
familiar.
Mi nim i zed R el iabi li ty R is k
Unprogrammed Actel parts are extensively tested at the
factory. Routing tracks, logic modules, and programming,
debug and test circuits are 100 percent tested before
shipment. AC performance is ensured by special speed path
tests, and programming circuitry is verified on test antifuses.
During the programming process, an algorithm is run to
ensure that all antifuses are correctly programmed. In
addition, Actel’s Silicon Explorer diagnostic tool uses
ActionProbe circuitry, allowing 100 percent observability of
all internal nodes to check and debug the design.
A c t e l FP G A De sc r i p t i o n
The PLICE antifuse is a one-time programmable, nonvolatile
connection. Since Actel devices are permanently
programmed, no downloading from EPROM or SRAM storage
is required. Inadvertent erasure is impossible, and there is no
need to reload the program after power disruptions.
Fabrication using a low-power CMOS process means cooler
The Actel families of FPGAs offer a variety of packages,
speed/performance characteristics, and processing levels for
use in all high reliability and military applications. Devices
are implemented in a silicon gate, two-level metal CMOS
process, utilizing Actel’s PLICE antifuse technology. This
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