H iR e l F PG A s
A ct e l E xt e n de d F l o w
1
Step
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
14.
15.
Screen
Wafer Lot Acceptance
2
Destructive In-Line Bond Pull
3
Internal Visual
Serialization
Temperature Cycling
Constant Acceleration
Particle Impact Noise Detection
Radiographic
Pre-Burn-In Test
Burn-in Test
Interim (Post-Burn-In) Electrical Parameters
Reverse Bias Burn-In
Interim (Post-Burn-In) Electrical Parameters
Percent Defective Allowable (PDA)
Calculation
Final Electrical Test
a. Static Tests
(1) 25°C
(Subgroup 1, Table1)
(2) –55°C and +125°C
(Subgroups 2, 3, Table 1)
b. Functional Tests
(1) 25°C
(Subgroup 7, Table 15)
(2) –55°C and +125°C
(Subgroups 8A and B, Table 1)
c. Switching Tests at 25°C
(Subgroup 9, Table 1)
16.
Seal
a. Fine
b. Gross
17.
External Visual
2009
100%
1010, Condition C
2001, Condition D or E, Y
1
Orientation Only
2020, Condition A
2012 (one view only)
In accordance with applicable Actel device specification
1015, Condition D, 240 hours @ 125°C minimum
In accordance with applicable Actel device specification
1015, Condition C, 72 hours @ 150°C minimum
In accordance with applicable Actel device specification
5%, 3% Functional Parameters @ 25°C
In accordance with Actel applicable device specification
which includes a, b, and c:
5005
5005
100%
5005
5005
100%
5005
1014
100%
Method
5007 with Step Coverage Waiver
2011, Condition D
2010, Condition A
Require-
ment
All Lots
Sample
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
All Lots
100%
100%
Notes:
1. Actel offers the extended flow for customers who require additional screening beyond the requirements of the MIL-STD-833, Class B. Actel is
compliant to the requirements of MIL-STD-883, Paragraph 1.2.1, and MIL-I-38535, Appendix A. Actel is offering this extended flow
incorporating the majority of the screening procedures as outlined in Method 5004 of MIL-STD-883, Class S. The exceptions to Method 5004
are shown in notes 2 and 3 below.
2. Wafer lot acceptance is performed to Method 5007; however, the step coverage requirement as specified in Method 2018 must be waived.
3. MIL-STD-883, Method 5004 requires 100 percent Radiation latch-up testing (Method 1020). Actel will not be performing any radiation testing,
and this requirement must be waived in its entirety.
9
ACTEL [ Actel Corporation ]
