AC Test Circuit
Test Configuration Component Values
CL
R1
R2
Test Configuration
(pF)
(Ω)
(Ω)
VCC
3.3V Standard Test
5V Standard Test
50
50
990
580
770
390
R1
R2
NOTES:
CL includes jig capacitance.
Device
Under
Test
OUT
CL
Parameter
Typical
Units
Input Pulse Level
Input Rise and Fall
0 – 3.0
5
V
nS
V
Input and Output Timing Reference Level
1.5
AC Waveforms for Write and Erase Operations, WE Controlled
VCC
Power-up
Standby
Write
Write Program or
Erase Setup Command
Valid Address & Data (Program)
or Erase Confirm Command
Automated Program
or Erase Delay
Read Status
Register Data
Write Read Array
Command
VIH
VIL
AIN
AIN
Addresses
CE
tAVAV
tAVWH
tWHAX
VIH
VIL
tELWL
tWHEH
VIH
OE
VIL
VIH
tWHWL
tWHQV1,2,3,4
WE
VIL
tWLWH
tWHDX
tDVWH
VIH
VIL
High Z
Valid
SRD
DIN
DIN
DIN
Data
tPHWL
tQVPH
tPHHWH
VHH
VIH
6.5V
RP
VIL
VIH
VIL
WP
tVPWH
tQVVL
VPPH2
VPPH1
VPPLK
VPP
VIL
Aeroflex Circuit Technology
6
SCD1661B REV A 1/16/97 Plainview NY (516) 694-6700
AEROFLEX [ AEROFLEX CIRCUIT TECHNOLOGY ]
