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+5V
1N3064
or equivalent
Device under test
100 pF*
6.2K
Ω
2.7K
Ω
1N3064
or equivalent
GND
GND
GND
*including scope
and jig capacitance
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Parameter
Input voltage with respect to V
SS
on pin A9
Input voltage with respect to V
SS
on all DQ pins
Current
Includes all pins except V
CC
. Test conditions: V
CC
= 5.0V, one pin at a time.
Min
-1.0
-1.0
-100
Max
+13.5
V
CC
+1.0
+100
Unit
V
V
mA
7623#SLQ#FDSDFLWDQFH
Symbol
C
IN
C
OUT
C
IN2
Parameter
Input capacitance
Output capacitance
Control pin capacitance
Test setup
V
IN
= 0
V
OUT
= 0
V
IN
= 0
Typical
6
8.5
7.5
+¦# #4#0+]/#7
D
# #58ƒ&,
Max
7.5
12
9
Unit
pF
pF
µF
3/&&#DQG#3',3#SLQ#FDSDFLWDQFH
Symbol
CIN
+¦# #4#0+]/#7
D
# #58ƒ&,
Test setup
V
IN
= 0
V
OUT
= 0
V
IN
= 0
Typical
4
8
8
Max
6
12
12
Unit
pF
pF
µF
Parameter
Input capacitance
Output capacitance
Control pin capacitance
)/$6+
C
OUT
C
IN2
(UDVH#DQG#SURJUDPPLQJ#SHUIRUPDQFH
Parameter
+¦# #4#0+]/#7
D
# #URRP#WHPSHUDWXUH/#9
&&
# #89“43(,
Limits
Min
-
Typical
6.0
-
48
10,000
200
200
Max
8.2
8.2
80
-
250
250
Unit
sec
sec
sec
cycles
µs
µs
Sector erase and Verify-1 time (excludes 00h programming prior to erase)
Sector programming time
Chip programming time
Erase program cycles
Byte program time
Byte verify-0 time
-
-
-
-
-
;
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ALSC [ ALLIANCE SEMICONDUCTOR CORPORATION ]
