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A23L16162V-70 参数 Datasheet PDF下载

A23L16162V-70图片预览
型号: A23L16162V-70
PDF下载: 下载PDF文件 查看货源
内容描述: 2M ×16 / 4M ×8位CMOS掩膜ROM [2M X 16 / 4M X 8 BIT CMOS MASK ROM]
分类和应用: 存储有原始数据的样本ROM
文件页数/大小: 11 页 / 127 K
品牌: AMICC [ AMIC TECHNOLOGY ]
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A23L1616/A23L16161/A23L16162 Series
Capacitance
Symbol
C
I
C
O
Parameter
Input Capacitance
Output Capacitance
Min.
Max.
10
10
Unit
pF
pF
Test Conditions
T
A
= 25°C
f = 1.0MHz
Note
3
AC Characteristics
Symbol
(T
A
= 0°C to +70°C, VCC = 2.7V~3.6V for -12, VCC = 3.0V~3.6V for -10, GND = 0V)
Parameter
A23L1616/A23L16
161/A23L16162-70
Min.
Max.
A23L1616/A23L161
61/A23L16162-100
Min.
100
70
70
35
10
10
20
10
10
20
100
100
50
Max.
ns
ns
ns
ns
ns
ns
ns
4, 6
5, 6
Unit
Note
t
CYC
t
AA
t
ACE
t
AOE
t
OH
t
LZ
t
HZ
Cycle Time
Address Access Time
Chip Enable Access Time
Output Enable Access Time
Output Hold after Address Change
Output Low Z Delay
Output High Z Delay*
70
* t
HZ
is specified from either OE or CE going disabled, whichever occurs first.
Notes:
1. OE / CE = V
IH
(Output is unloaded)
2. V
IN
= V
IH
/V
IL,
OE / CE = V
IL
(Output is unloaded)
3. This parameter is periodically sampled and is not 100% tested. All pins, except pins under test, are tied to AC ground.
4. Output LOW impedance delay (t
LZ
) is measured from CE or OE going active.
5. Output HIGH impedance delay (t
HZ
) is measured from CE or OE going inactive.
6. This parameter is sampled and not 100% tested.
PRELIMINARY
(September, 2002, Version 0.1)
6
AMIC Technology, Inc.